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Technical Support

Electronic Measurement

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Accuracy matters: Calibration Options for Lab Standards Webcast
Live broadcast May 19, 2016; 10am PT / 1pm ET

Webcast

Temperature-Dependent Characterization for Device R&D Webcast
Recorded broadcast April 22, 2016

Webcast - recorded

RF and Microwave Back to Basics Education Series
Webcast Series

Webcast

Power Integrity Measurements Webcast – Choosing the Right Tools
Original broadcast January 6, 2016

Webcast - recorded

Power Integrity Challenges, Measurements and Labs Webcast
Original broadcast February 23, 2016

Webcast - recorded

RF & Microwave Measurement Fundamentals
This 4-day class studies the principles of microwaves on transmission lines and power measurements, signal sources, mixers and modulation techniques, and the use of signal types in test applications.

Classroom Training

Unlocking Insights with Improved Sensitivity and Noise Measurements Webcast
Original broadcast January 13, 2016

Webcast - recorded

5 Ways Your DMM is Lying - Webcast
Original broadcast January 21 2016

Webcast - recorded

Fundamentals of Wavelength Dependent Optical Component Testing Webcast
Original broadcast September 29, 2015

Webcast - recorded

Introducing the New Infiniium V-Series High-Performance Oscilloscope Webcast
Original broadcast April 14, 2015

Webcast - recorded

PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast
Original broadcast May 7, 2013

Webcast - recorded

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

Webcast - recorded

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

Webcast - recorded

Innovations in EDA: Accelerating Radar/EW System Design using Wideband Virtual Scenarios Webcast
Original broadcast April 4, 2013

Webcast - recorded

Millimeter Signal Measurements: Best Practices, Solutions, and Accuracy Webcast
Original broadcast Jan 26, 2012

Webcast - recorded

Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems
Original broadcast Sept 1, 2011

Webcast - recorded

Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast
Original broadcast June 13, 2013

Webcast - recorded

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

Signal Generator Fundamentals and New Applications Webcast
Original broadcast January 30, 2013

Webcast - recorded

Signal Analyzer Fundamentals and New Applications Webcast
Original broadcast March 13, 2013

Webcast - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded

Analyze Agile or Elusive Signals Using Real-time Measurement and Triggering Webcast
Original broadcast April 24, 2013

Webcast - recorded

The Importance and Value of PXI Multi-Vendor Interoperability
Original broadcast March 28, 2012

Webcast - recorded

Metrology Events
Attending events that focus on metrology let you network and learn at the same time.

Tradeshow

3070 Boundary Scan
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

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