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Keysight Test-Drive 2016
Various dates and locations in 2016

Seminar

International Microwave Symposium (IMS) 2016
May 22-27, 2016; San Francisco, CA

Tradeshow

Automated Test / Board Test User Groups (ATUG)
These User Group meetings (ATUG) are held at various cities across the US.

Seminar

Oscilloscope Measurements Webcast Series
Live and on-demand broadcasts that will teach you how to make precise measurements with its Infiniium line of real-time and sampling oscilloscopes.

Webcast

Nepcon / EMT China 2016
Asia : Apr. 26-28, 2016 (Booth 1H20) Shanghai World Expo Exhibition & Convention Center-NEPCON China 2016 South Entrance: No 1099 Guozhan Rd Shanghai China North Entrance: No 850 Bocheng Rd. Shanghai China

Tradeshow

Removing the Human Touch – It’s Time ICT Goes Fully Automated Webcast Series
2015 webcast series

Webcast

MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow
Original broadcast October 21, 2014

Webcast - recorded

Site Hazard, Safety & Risk Mitigation for Beginning Thermographers Webcast
Original broadcast September 30, 2015

Webcast - recorded

PCIe - Assuring Gen4 Tx/Rx Performance with Hot TDR Webcast
Original broadcast September 9, 2015

Webcast - recorded

DesignCon 2015
Download Keysight's papers from Technical Conference; Jan 27-29, 2015; Santa Clara Convention Center

Tradeshow

Multiport and Multi-site Test Optimization Techniques Webcast
Original broadcast June 3, 2015

Webcast - recorded

RF/uW Switching Solutions Webcast
Original broadcast July 8, 2015

Webcast - recorded

Successfully Make Power and AC Line Disturbance Measurements Webcast
Original broadcast June 25, 2015

Webcast - recorded

Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast
Original broadcast January 21, 2014

Webcast - recorded

PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast
Original broadcast May 7, 2013

Webcast - recorded

Boundary Scan Webcast Series
Live and on-demand webcasts

Webcast

Best practices in implementing boundary scan on limited access boards
Original broadcast December 18, 2014

Webcast - recorded

Non-destructive testing of powders, ceramic, oils, & other composite materials
Original broadcast December 11, 2014

Webcast - recorded

Testing limited access SSD boards with boundary scan and external instruments webcast
Original broadcast December 4, 2014

Webcast - recorded

Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast
Original broadcast November 13, 2014

Webcast - recorded

Testing DDR on limited access boards using boundary scan silicon nails
Original broadcast October 30, 2014

Webcast - recorded

Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains
Original broadcast October 9, 2014

Webcast - recorded

IPC Tech Summit
Raleigh, NC; October 28 - 30, 2014

Tradeshow

Extending boundary scan tests to improve test coverage of limited access boards webcast
Original broadcast September 25, 2014

Webcast - recorded

Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

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