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Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

应用说明 2014-05-28

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

应用说明 2013-09-10

Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

应用说明 2012-10-30

是德成功测量阻抗的 8 点提示 应用指南 346-4
是德成功测量阻抗的 8 点提示 应用指南 346-4。测量阻抗有几种不同的技术和方法,应该根据测量的频率范围、要测量的阻抗参数以及想要显示的测量结果来选择一个具体的测试技术。

应用说明 2011-12-31

是德高效变压器/低频线圈测试 应用指南 1305-3
是德高效变压器/低频线圈测试 应用指南 1305-3

应用说明 2011-02-01

Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed
This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions.

应用说明 2009-02-03

PDF PDF 1.33 MB
Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

应用说明 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

应用说明 2008-11-21

New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

应用说明 2008-11-20

Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.

应用说明 2008-11-13

Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

应用说明 2008-04-10

PDF PDF 116 KB
Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

应用说明 2008-04-03

PDF PDF 119 KB
Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer
This application brief describes the benefits of using Keysight impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors.

应用说明 2007-03-31

Impedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM)
This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture.

应用说明 2006-11-29

Improve Electronic Product Quality and Performance with Keysight Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Keysight's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

应用说明 2006-06-26

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Keysight 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

应用说明 2003-06-26

Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Keysight 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.

应用说明 2001-12-19

Effective Multitap Transformer Testing Using a Scanner (AN 1224-5)
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Keysight 4263B LCR Meter.

应用说明 2001-11-05

High Accuracy and Fast RF Inductor Testing (AN 369-10)
This Application Note describes solutions offered by the Keysight 4285A Precision LCR Meter for realizing these requirements. Information for accurate and fast RF inductor testing, and for practical simple test systems are discussed.

应用说明 2001-10-25

Reliable Electronic Component Evaluation and Circuit Design with the 4294A(PN4294-1)

应用说明 2001-08-31

Accurate Impedance Measurement with Cascade Microtech Probe System(AN1369-3)
This 12 page application note explains how to make on-wafer or on-substrate 1-port impedance measurements using a probe station.The E4991A (1 M-3 GHz) and 4294A (40-110 MHz) solutions are discussed.

应用说明 2001-07-31

Advanced impedance measurement capability of the RF I-V method (AN 1369-2)
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

应用说明 2001-07-26

New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.

应用说明 2001-05-24

Effective Electrolytic Capacitors Testing (AN 1305-4)
With increased requirements for size reduction and higher reliability design, it is becoming necessary to evaluate electrolytic capacitors employed in electronic equipment. Production volume has been increasing for circuit applications. Manufacturing and QA now have to improve their testing of...

应用说明 2000-11-01

Electronic Characterization of Impedance Analyzer (AN 1300-5)
This application note describes in broad terms how to use the 4291B RF Impedance/Material Analyzer in determining the impedance characteristics of IC packages up to 1.8 GHz. This information is useful for high speed digital designers, component...

应用说明 2000-11-01

PDF PDF 512 KB

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