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Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

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Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Application Note 2014-05-14

Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Application Note 2014-03-26

Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

PDF PDF 5.09 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Application Note 2013-11-07

PDF PDF 382 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2013-10-29

PDF PDF 16 KB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

High Node Count Fixturing Solutions for Keysight Short-Wire Test Fixtures
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Keysight 3070 family of board test systems.

Application Note 2008-04-30

PDF PDF 67 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
Maximising Test Coverage with Keysight Medalist VTEP v2.0
This paper describes how to get the most from Keysight Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.

Application Note 2007-04-17

Life and Stability of the Keysight 5DX Sealed X-ray Tube
Keysight has developed a sealed ultra-high vacuum X-ray tube that provides stable output throughout a significantly long life.

Application Note 2007-01-22

PDF PDF 78 KB
Considerations for Surface Map Setup
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.

Application Note 2006-08-08

SEMI S2 Standard Modifications for Keysight 3070 and Related Equipment
This document describes three items pertaining to the Keysight 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.

Application Note 2006-06-15

PDF PDF 52 KB
AOI - A Strategy for Closing the Loop
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications

Application Note 2006-04-16

PDF PDF 291 KB
“Shotgunning”, a Bad Fit for Lead-Free Test
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Application Note 2006-02-07

PDF PDF 44 KB
Replacing the Keysight 34401A with the New 34410A/34411A High Performance Digital Multimeters
This application note provides a high level overview of the differences between the Keysight 34401A 6 1/2 Digit Digital Multimeter and the new Keysight 34410A and 34411A 6 1/2 Digit High Performance DMMs.

Application Note 2005-11-15

N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560)

Application Note 2005-07-27

How to Get the Most from Keysight's Intelligent Yield Enhancement Test (IYET)
This paper describes how to get the most from IYET for Keysight board test systems.

Application Note 2005-07-15

Design Considerations for PC Board Carriers for Use in the Keysight 5DX
There are several reasons why it may be necessary or desirable to use a carrier to transport printed circuit assemblies through the 5DX. This paper discusses these and some considerations for the design of suitable carriers.

Application Note 2005-07-13

PDF PDF 918 KB
AXI and Lead-Free Process Characterization
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.

Application Note 2005-06-21

In-circuit Testing of Low Voltage Devices
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

Application Note 2005-05-25

PDF PDF 172 KB
Gauge Repeatability on 5DX X-ray System
Summary of 5DX repeatability capability, factors that influence the repeatability capabilities of the 5DX, impacts to gauge repeatability and reproducibility (GR&R) results.

Application Note 2005-03-09

PDF PDF 102 KB
Test and Inspection as Part of the Lead-free Manufacturing Process
The paper addresses issues that will impact defect levels and defect spectrum during the transition to lead-free manufacturing. It also addresses different test and inspection systems’ readiness to test lead-free printed circuit board assemblies.

Application Note 2005-02-22

PDF PDF 421 KB
Innovative Power Supplies Save Rack Space
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

Testing FPGullwing Misalignment Across the Pad
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.

Application Note 2004-12-08

PDF PDF 1.58 MB
Understanding the PCAP Polarity Reject Signal
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.

Application Note 2004-12-02

PDF PDF 1.09 MB

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