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Evaluating Battery Run-Down with the N6781A Measure Unit and 14585A Software – Application Note
This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device.

Application Note 2016-10-10

A Cost-effective Way to Test Sub 1-GHz Wireless Modules - Application Note
This app note describes a Keysight low cost RF test solution that addresses the sub 1-GHz wireless test needs.

Application Note 2015-10-22

Solutions for RF Power Amplifier Test - Application Note
This “Solutions for RF Power Amplifier Test” app note gives insight into making faster, repeatable RF power amplifier tests with envelope tracking and digital pre-distortion.

Application Note 2015-09-30

Optimize Power Source Integrity Under Large Load Transients - Application Note
This application note discusses several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.

Application Note 2015-07-31

81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note
The Keysight 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Application Note 2015-06-18

A Flexible Test Solution for Internet of things (IoT) devices with ASK/FSK Modulation - App Note
Use Keysight’s basic RF instruments to measure and analyze ASK/FSK modulated signals commonly used in a variety of products and systems, ranging from personal consumer electronics and automatic meter reading, to giant industrial devices.

Application Note 2015-04-09

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

Cost Effective Design Verification Test of 802.11ac Wireless Transmitters and Receivers - App Note
This application brief highlights ways to use the M9391A PXIe VSA and 89600 VSA software with the M9381A PXIe VSG to address wide bandwidth, multi-channel testing needs for WLAN 802.11ac.

Application Note 2013-11-20

Optimize Transceiver Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application brief provides key issues and recommended solutions for increasing the speed of transceiver test.

Application Note 2013-08-27

Optimizing Transceiver Test with the Keysight M9381A Vector Signal Generator
Accelerate transceiver test throughput with the fast Keysight M9381A PXIe Vector Signal Generator. Achieve cost reductions in test while maintaining high test quality.

Application Note 2012-08-29

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Generating Narrow Pulses with a Function Generator
Testing basic digital signals, such as triggers, clock signals, and logic control, doesn't always require the performance of a dedicated pulse generator.

Application Note 2008-04-16

Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560)

Application Note 2005-07-27

Innovative Power Supplies Save Rack Space
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)

Application Note 2004-10-22

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)

Application Note 2004-10-22

Increase Automotive ECU Test Throughput (AN 1505)

Application Note 2004-10-22

How to use the Keysight N6700 Modular Power System to replace a Keysight 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to a Keysight N6700.

Application Note 2004-08-02

Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434) - Application Note
This 15-page application note presents methods and techniques to decrease setup time and test time.

Application Note 2002-11-22

Compliance Testing to the IEC/EN 61000-4-8 (AN 1319)
Electronic equipment can encounter magnetic fields at power line frequencies in a variety of places. As such, it is wise to ensure that the equipment will operate reliably when exposed to these power line frequency magnetic fields. The IEC/EN 61000-4-8 standard describes how equipment should be...

Application Note 2001-06-07

Testing Uninterruptible Power Supplies Using Keysight 6800 Series ac Power Source/Analyzers
This Product Note describes how Keysight ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection.

Application Note 2001-01-16

Compliance Testing to the IEC 1000-3-2 (EN 61000-3-2) and IEC 1000-3-3 (EN 61000-3-3) Standards (AN 1273)
Regulatory standards for AC mains phenomena are critical to maintaining the quality of ac power distribution systems. The goal of this Application Note is to provide an introduction to these standards as well as technical issues of these standards.

Application Note 2000-10-01

Increasing dc Power Supply Test System Throughput
This Product Note describes some of the ways this new family of electronic loads can be used to achieve maximum throughput for your dc power supply test system.

Application Note 2000-05-01

10 Hints for Using Your Power Supply to Decrease Test Time - Application Note
Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet...

Application Note 1999-10-12