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Electronic Measurement

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A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
Originally broadcast October 28, 2010

Webcast - recorded

Addressing the Challenges of Complex Spectral Environment Simulation with Wideband Precision AWGs
Original broadcast July 30, 2014

Webcast - recorded

Design of a 8 Watt, High efficiency X-band Power PHEMT Amplifier
Originally broadcast March 16, 2010

Webcast - recorded

DesignCon 2014
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

Electronic Measurement Events in Europe, Middle East & Africa
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

Essentials of OFDM and MIMO
Original broadcast September 20, 2012

Webcast - recorded

Genesys Webcasts - "How-To-Design" series
Originally broadcast in 2009. Access the 6 WebEX recordings

Webcast - recorded

Innovations in EDA: Accelerating Radar/EW System Design using Wideband Virtual Scenarios Webcast
Original broadcast April 4, 2013

Webcast - recorded

Innovations in EDA: LTE-Advanced: Overcoming Design Challenges for 4G PHY Architectures
Originally broadcast June 2, 2011

Webcast - recorded

Innovations in EDA: Memory Effects in RF Circuits: Manifestations and Simulation
Originally broadcast Feb 3, 2011

Webcast - recorded

Keysight's live webcasts
Stay up to date by bookmarking this page to see the latest information on Keysight's webcasts.

Webcast

Next Generation 802.11ac WLAN MIMO Design & Test Challenges
Original broadcast May 10, 2012

Webcast - recorded

Presentation on Characterization of a WLAN Transceiver
A detailed Presentation on increased insight with increased characterization of a WLAN transceiver presented by Andy Howard (Agilent Technologies) .

Seminar Materials 2007-07-24

PDF PDF 4 MB
Presentation on Simulation of WLAN System
This Presentation is an overview on OFDM signal, and also focuses on models that constitute the WLAN Design Library and key measurements: EVM, CCDF, ORFS to test and verify designed components.

Seminar Materials 2001-11-01

PDF PDF 1.85 MB