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Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with J-BERT N4903A - App Note
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

Application Note 2006-07-18

PDF PDF 5.33 MB
Improve Your Time-to-Insight:Debugging Intermittent Memory Failures in DDR and DDR2 Systems
Application Note 1575

Application Note 2006-04-14

Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Application Note 2006-04-06

PDF PDF 164 KB
PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B - Application Note
This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices.

Application Note 2006-01-30

Designing High Speed Backplanes Utilizing Physical Layer Test System
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.

Application Note 2006-01-18

Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices

Application Note 2005-11-01

Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification

Application Note 2005-09-22

PDF PDF 812 KB
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode - Application Note
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.

Application Note 2005-09-21

PDF PDF 356 KB
Improved Method for Characterizing and Modeling Gigabit Flex-Circuit Based Interconnects
This paper describes sophisticated, time-domain methods of accurately predicting time- and frequency-domain high-speed signal characteristics.

Application Note 2005-09-08

PDF PDF 11.72 MB
Fast Total Jitter Test Solution - Application Note
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement

Application Note 2005-08-29

PDF PDF 1.28 MB
Total Jitter Measurement at Low Probability Levels
White paper produced for DesignCon 2005 regarding Total Jitter Measurement at Low Probability Levels, Using Optimized BERT Scan Method.

Application Note 2005-07-11

PDF PDF 222 KB
Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method
This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s.

Application Note 2005-07-11

PDF PDF 894 KB
Precision Jitter Transmitter
This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed.

Application Note 2005-06-20

PDF PDF 387 KB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Application Note 2005-06-15

PDF PDF 515 KB
Next Generation I/O Bus PCI Express BER Test Solution
PCI Express increases data transport efficiency and data quality. It uses an 8b/10b encoding methodology to embed the clock signal ...

Application Note 2005-05-25

PDF PDF 2 MB
PCI Express Receiver Design Validation Test with 81134A / 81250A - Application Note
Describes functional validation and compliance and stress tests for PCI Express receiver design

Application Note 2005-03-18

Selecting an I/O Architecture for Your FPGA Design
Selecting an I/O Architecture for Your FPGA Design

Application Note 2005-02-25

Planning Your Design for Debug: FPGA Dynamic Probe

Application Note 2005-01-26

Advanced Jitter Generation and Analysis Product Note - Application Note
This product note shows how the Keysight pulse generators can be used with the DCA-J Oscilloscope.

Application Note 2004-10-04

PDF PDF 549 KB
Flat Panel Display Link Test - Application Note
This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Keysight 81250 Parallel Bit Error Ratio Tester (ParBERT).

Application Note 2004-07-29

Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).

Application Note 2004-06-01

InfiniBand System Level Debugging (AN 1382-1)
This application note is written for R & D engineers developing InfiniBand processors and InfiniBand system designers and integrators. It covers key concepts underlying system-level debug and validation of InfiniBand systems.

Application Note 2004-03-17

Jitter Fundamentals: Jitter Tolerance Testing with Keysight ParBERT 81250 - Application Note
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.

Application Note 2003-12-02

PDF PDF 3.18 MB
Keysight N4900 Serial BERT Series Jitter Injection and Analysis Capabilities
The fundamentals of Jitter and it's capabilities with the N4900.

Application Note 2003-11-01

High-Precision TDR with the Keysight 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.

Application Note 2003-09-12

PDF PDF 288 KB

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