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Electronic Measurement

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An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2014-08-03

Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

Application Note 2014-08-03

PDF PDF 2.19 MB
Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-08-03

Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2013-05-31

DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Application Note 2013-01-24

PDF PDF 1.65 MB
Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.

Application Note 2012-11-01

PDF PDF 257 KB
Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.

Application Note 2012-09-21

S-parameter Series: Practical Application of the InfiniiSim Waveform Transformation Toolset Applicat
Presents and addresses five of the most common problems that confront engineers when trying to measure performance on high speed links, using an oscilloscope.

Application Note 2012-08-21

Crossing the Digital-Analog Divide - White Paper
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.

Application Note 2012-05-02

PDF PDF 6.46 MB
Which Electromagnetic Simulator Should I Use?
This paper outlines three of the key EM simulation technologies, MoM, FEM, FDTD and attempt to compare and contrast the relative merits of each.

Application Note 2012-04-06

PDF PDF 3.21 MB
Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).

Application Note 2012-04-02

S-parameter Series: Using De-embedding Tools for Virtual Probing Application Note
Discusses using de-embedding tools to gain virtual access to difficult measurement points

Application Note 2012-03-11

S-parameter Series: Transforming Oscilloscope Acquisitions for De-Embedding, Embedding & Simulating
This application note is the first in a series of s-parameter application notes and introduces us to signal acquisition and theory.

Application Note 2012-03-05

S-parameter Series: S-parameter Requirements for Oscilloscope De-Embedding Applications
A tutorial in helping the reader achieve the big picture of interoperating oscilloscope data and how to understand its relationship to S-parameters

Application Note 2012-03-02

S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding

Application Note 2012-03-01

6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

Application Note 2012-02-02

PDF PDF 1.59 MB
Advanced VNA-Based Test Systems for Analysis of High-Speed Digital Interconnect - Application Note
Discusses interconnect testing and present solutions based on the latest generation of test software (PLTS2011) for Keysight's line of performance network analyzers (PNAs) focused on Software.

Application Note 2012-01-19

Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

Application Note 2012-01-12

PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Keysight 86100 Wide-Bandwidth Oscilloscope.

Application Note 2011-07-28

Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.

Application Note 2011-07-08

PDF PDF 1.77 MB

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