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Electronic Measurement

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Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

PDF PDF 1.97 MB
Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2014-02-25

EMC Compliance Testing: Improve Throughput with Time Domain Scanning - Application Note
This application note provides an overview of time domain scan, the test scenarios in which it provides the greatest time savings, and trade-offs between speed and overload protection.

Application Note 2014-01-30

Essential Capabilities of EMI Receivers - Application Note
What makes an EMI receiver fully compliant? This application note provides an overview of some of the most useful internal diagnostic tools for quickly & efficiently measuring unwanted emissions.

Application Note 2013-10-14

PDF PDF 1.91 MB
EMI Troubleshooting: The Need for Close Field Probes - Application Note

Application Note 2013-05-29

PDF PDF 546 KB
Accurate Absolute and Relative Power Measurements Using the N5531S - Application Note

Application Note 2012-12-04

EMI Pre-Compliance Testing - Application Note
X-Series signal analyzers with the EMI measurement application offer a cost-effective pre-compliance testing solution.

Application Note 2012-01-16

PDF PDF 1.32 MB
Making EMI Compliance Measurements
This application note provides an overview of EMI compliance test requirements and measurement approaches.

Application Note 2011-03-09

Making Conducted and Radiated Emissions Measurements - Application Note
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2010-07-13

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1)
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

Migrating Code from the 8903B to the U8903A - Application Note
This application note describes how to migrate the old commands used for HP 8903B to SCPI commands used by U8903A.

Application Note 2009-06-29

Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Keysight's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.

Application Note 2008-10-02

A Design of Experiments for Gigabit Serial Backplane Channels

Application Note 2008-09-03

PDF PDF 2.44 MB
Data Mining 12-Port S-Parameters

Application Note 2008-08-11

PDF PDF 830 KB
New Test Methodologies Improve EMI Testing Efficiency
This 7 page application note discusses a sampling of PSA features of interest to the EMI community that will increase both the quality of data and speed by which results can be derived.

Application Note 2008-05-28

PDF PDF 801 KB
Fast, Easy, and Accurate Microwave Phase Noise Measurements using the E5052B with the E5053A

Application Note 2008-05-22

E5052B Signal Source Analyzer Advanced Phase Noise and Transient Measurement Techniques
This application notes describes two major advanced techniques of the SSA in phase noise measurement and transient measurement.

Application Note 2007-10-02

PDF PDF 1.28 MB
Making Compliance Measurements with the N9039A-Based EMI Measurement Receiver

Application Note 2007-08-15

PDF PDF 1.58 MB
Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Backplane Differential Channel Microprobe Characterization in time and Frequency Domains

Application Note 2007-05-09

PDF PDF 769 KB
Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

Application Note 2006-12-01

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