Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

1-25 of 43

Sort:
Making EMI Compliance Measurements - Application Note
This application note provides an overview of EMI compliance test requirements and measurement approaches.

Application Note 2015-07-25

DDR3 Memory Protocol Analysis and Compliance Verification – FuturePlus
Straightforward and reliable DDR3 DIMM bus analysis at 2400MT/s and DDR3 SO-DIMM analysis at 1867MT/s – FuturePlus System and Keysight

Solution Brief 2015-07-14

Turn-key conducted and radiated EMC test systems for complete test confidence – Frankonia EMC Test
Turn-key conducted and radiated EMC test systems for complete test confidence – Frankonia and Keysight

Solution Brief 2015-03-17

E5052B Signal Source Analyzer - Brochure
This 16-page brochure describes the features and benefits of the E5052B (10 MHz to 7 GHz, 26.5 GHz, or 110 GHz) Signal Source Analyzer. The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

Brochure 2015-02-25

PDF PDF 1.92 MB
Spectrum Analyzer and Signal Analyzer - Selection Guide
Keysight offers a wide range of spectrum and signal analyzers, from DC to 325 GHz and beyond, designed to accurately measure frequency, amplitude, and modulation.

Selection Guide 2015-02-25

Articulated Robotic Near-Field Electromagnetic Scanning System – APREL
Articulated Robotic Near-Field Electromagnetic Scanning System – APREL and Keysight.

Solution Brief 2014-08-04

Streamline EMC Compliance Testing with Prescan Analysis Tools - Application Note
Application note

Application Note 2014-08-01

PDF PDF 899 KB
Electromagnetic Compatibility, EMC CISPR Compliance Measurements – TDK RF Solutions
Electromagnetic Compatibility CISPR Compliance Measurement Solution from TDK RF Solutions and Keysight

Solution Brief 2014-05-07

Electromagnetic Compatibility, EMC CISPR Compliance Measurements – ETS-Lindgren
Electromagnetic Compatibility CISPR Compliance Measurement Solution from ETS-Lindgren and Keysight

Solution Brief 2014-04-29

Pulsed Carrier Phase Noise Measurements - Application Note
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

Application Note 2014-03-13

PDF PDF 1.97 MB
Essential Capabilities of EMI Receivers - Application Note
What makes an EMI receiver fully compliant? This application note provides an overview of some of the most useful internal diagnostic tools for quickly & efficiently measuring unwanted emissions.

Application Note 2013-10-14

PDF PDF 1.91 MB
N9038A MXE EMI Receiver Demo Videos on YouTube
Explore YouTube for videos on the N9038A MXE EMI Receiver.

Demo 2013-10-01

Designing Scalable 10G Backplane Interconnect Systems
This Paper presents techniques for design which significantly reduce modeling requirements for the design of high-speed backplanes in conjunction with advanced testing techniques which provide maximum channel characterization with the minimum amount of time.

Technical Overview 2012-05-05

PDF PDF 1.46 MB
N6141A/W6141A EMI Measurement Application Videos
Videos developed to help you take advantage of the broad range of features offered on N6141A and W6141A measurement application.

Demo 2011-04-01

TILE! Software Supports New Agilent MXE EMI Receiver

Press Materials 2011-03-18

TDK RF Solutions Announces Integration of Agilent MXE EMI Receiver

Press Materials 2011-03-18

Agilent Technologies Introduces EMI Receiver

Press Materials 2011-03-15

Making Conducted and Radiated Emissions Measurements - Application Note
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2010-07-13

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) - Application Note
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Keysight's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.

Application Note 2008-10-02

Data Mining 12-Port S-Parameters

Application Note 2008-08-11

PDF PDF 830 KB
New Test Methodologies Improve EMI Testing Efficiency
This 7 page application note discusses a sampling of PSA features of interest to the EMI community that will increase both the quality of data and speed by which results can be derived.

Application Note 2008-05-28

PDF PDF 801 KB
Making Compliance Measurements with the N9039A-Based EMI Measurement Receiver

Application Note 2007-08-15

PDF PDF 1.58 MB

1 2 Next