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Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

應用手冊 2014-08-04

PDF PDF 360 KB
Improving Throughput with your Power Supply - Hints 1 through 5 – Application Brief
This application compendium consists of 1 through 5 of the 10 hints on how to improve throughput with your power supply.

應用手冊 2014-08-03

Solving the Challenges of Solar Array Simulation - Application Note
Solving the Challenges of Solar Array Simulation defines the optimal power solution for satellite ground testing.

應用手冊 2014-07-31

Properly Powering On and Off Multiple Power Inputs in Embedded Designs - Application Not
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

應用手冊 2014-07-31

Performing a Precision ADC Evaluation Using a Low Noise DC Source - Application Note
This 6-page application note introduces the Keysight B2962A 6.5 Digit Low Noise Power Source which is suitable for the application requiring low noise power supply such as ADC Evaluation.

應用手冊 2014-01-28

PDF PDF 733 KB
Ultra-Low Noise Filter Minimizes B2961A/62A Power Source Noise Density - Application Brief
This 2-page Application Brief introduces N1294A-021 Ultra Low Noise Filter which is suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

應用手冊 2014-01-27

PDF PDF 698 KB
Low Noise Filter Improves B2961A/62A Power Source Noise Performance - Application Brief
This 2-page application brief introduces N1294A-022 Low Noise Filter which enables the B2961A/62A to source clean voltage equivalent to that of much costlier precision linear voltage/current source instruments.

應用手冊 2014-01-24

PDF PDF 543 KB
Addressing Your Power Test Challenges with VersaPower Architecture - Application Note
This paper discusses the structure of VersaPower power architecture and explores how it can help overcome the toughest power test challenges.

應用手冊 2013-12-12

克服多千瓦電源供應與汲入的測試挑戰 - 應用說明

應用手冊 2013-11-25

Overvoltage Protection in Power Supplies - Application Note
This application brief describes over-voltage protection as a useful feature to protect your DUTs in some commonly used applications

應用手冊 2013-04-18

PDF PDF 832 KB
Power Essentials Resource Kit
A collection of technical content and tools to help you get the most out of your bench or system power supply.

應用手冊 2013-04-03

Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.

應用手冊 2013-04-01

PDF PDF 476 KB
VI emulation mode of programmable output resistance function
This application note describes how to use the VI emulation mode of programmable output resistance function featured in B2961A/62A with some application examples.

應用手冊 2012-10-01

PDF PDF 800 KB
Constant mode of programmable output resistance function
This application note describes how to use the constant mode of programmable output resistance function featured in B2961A/62A with some application examples.

應用手冊 2012-10-01

PDF PDF 468 KB
Using the U8030 Series Power Supply Output Sequencing Feature Application
This document presents three test applications that demonstrate the output sequencing capability of the U8030 Series power supply.

應用手冊 2012-01-04

PDF PDF 771 KB
Evaluating Battery Run-Down with the N6781A 2-Quadrant Source/Measure Unit and the 14585A
This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device.

應用手冊 2011-03-28

Power Toolbox for Embedded System Design, Dynamic Current Profiling
This is the 2nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; focusing on dynamic current profiling.

應用手冊 2009-12-15

PDF PDF 768 KB
Creating, Editing, Transferring Arbitrary Waveforms with Keysight U2761A Function Generator
This application note explores how a complex arbitrary waveform is created by using software, importing, reusing existing waveform files and easily programs your instrument with the free Command Logger and Code Converter functions.

應用手冊 2009-12-11

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

應用手冊 2009-12-07

Base Station Subassemblies: Addressing DC Power Test Challenges
This application note addresses the numerous DC power-related challenges that base station providers are faced with during development and production test of their subassemblies.

應用手冊 2009-11-16

PDF PDF 382 KB
I-V Curve Characterization in High-Power Solar Cells and Modules
This unique application note discusses capturing the I-V curve of a high power solar cell or module under illuminated conditions and offers the ability to characterize the dark or reverse bias region of the cell or module under test.

應用手冊 2009-09-30

PDF PDF 378 KB
3GPP Long Term Evolution: System Overview, Product Development and Test Challenges -Application Note
This application note focuses on LTE and includes content on system overview, product development and test challenges of this new wireless communications technology.

應用手冊 2009-09-08

Power Toolbox for Embedded System Design-Simulating Power Supply Interrupts
This is the 3nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; specifically preventing power supply interrupts

應用手冊 2009-08-21

PDF PDF 482 KB
Managing High-Power DC Requirements for Life and Durability Test Systems
New product life and durability testing (Life testing) is critical in highly competitive markets.

應用手冊 2009-08-04

PDF PDF 181 KB
Selecting DC Sources for Telecommunications Equipment Test Systems Application Note
When selecting DC sources for test systems, one must take industry standards on DC power into consideration. The Keysight N5700 and N8700 series DC Sources offer a wide choice of power and voltage levels.

應用手冊 2009-07-22

PDF PDF 204 KB

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