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Electronic Measurement

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Advanced Jitter Generation and Analysis Product Note - Application Note
This product note shows how the Keysight pulse generators can be used with the DCA-J Oscilloscope.

Application Note 2004-10-04

PDF PDF 549 KB
Mux/Demux test with the Keysight 81250, ParBERT - Application Note
In this Application Note Mux/Demux is described as an important part of communication. The Keysight ParBERT 81250 is the only Parallel Bit-Error-Rate test solution for 660 MHz, 1.3 and 2.6 GBit/s.

Application Note 2004-08-04

Magneto-Optical Disk Drive Research (PN 3) - Application Note
This 4-page Product Note describes how the Keysight 81100 family of pulse/pattern generators can be used together with a Keysight Infinium oscilloscope to help magneto-optical disk drive.

Application Note 2004-07-29

PDF PDF 275 KB
Flat Panel Display Link Test - Application Note
This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Keysight 81250 Parallel Bit Error Ratio Tester (ParBERT).

Application Note 2004-07-29

Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) - Application Note
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

Application Note 2003-06-30

10GbE Technology and Device Characterization with the 81250 ParBERT
A wide range of measurements are described in the 802.3ae Standard, including optical transmitter and receiver testing, electrical XAUI test are essentially eye mask measurements.

Application Note 2003-04-22

PDF PDF 1.91 MB
Jitter Analysis Techniques for High Data Rates (AN 1432) - Application Note
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

Application Note 2003-02-03

81250 ParBERT System Setup Examples - Application Note
This is a collection of examples on how to use the Keysight 81250 Parallel Bit Error Ratio Tester for various applications.

Application Note 2002-12-12

PDF PDF 1.02 MB
Pulse Parameter Definitions - Application Note
Definitions of Terms used with Pulse/Pattern/Data Generators

Application Note 2002-04-08

How to use the Keysight 81200 together with Keysight VEE - Application Note
This attached Product Note shows how to use the Keysight 81200 Data Generator/Analyzer together with Keysight VEE for Signal Integrity Analysis.

Application Note 2002-01-28

PDF PDF 383 KB
When Digital Goes Analog: How to deal with signals which have two or more states - Application Note
This Product Overview explains the benefits of using the Keysight 81200 with help from the E4838A generator front-end, to enable to generation of multi-level signals.

Application Note 2002-01-11

PDF PDF 485 KB
BestLink/81200: Simulation Data Link for 81200 Data Generator/Analyzer Platform - App Note
The BestLink/81200 provides for an intelligent and highly automated migration of simulation data to the Keysight 81200.

Application Note 2001-04-06

Transition-time Converters - Application Note
The Keysight 15432B, 15433B, 15434B, 15435A, and 15438A are converters that have been designed to convert

Application Note 2001-03-27

Measuring Jitter with the Keysight E4874A Characterization Software Components - App Note
The Product Note shows how to measuring jitter with the Keysight E4874A Characterization Software Components on the Keysight 81200 Data Generator/Analyzer Platform.

Application Note 2000-06-01

PDF PDF 102 KB
Implementation of UTOPIA level 2 with Keysight E4829B - Application Note
Implementation of UTOPIA level 2 with Keysight E4829B

Application Note 1997-02-01

PDF PDF 603 KB
Implementation of UTOPIA Level 2 for Parallel Cell/Traffic Generator and Analyzer - App Note
See the attached Product Note for information on the Keysight E4821A #502 Connectivity Kit to interface with the Keysight E4829B Parallel Cell/Traffic Generator and Analyzer. Note: Different Pin-count of 80-pin connector versus 40-pin connector! When you design DUT boards to be connected either...

Application Note 1997-02-01

PDF PDF 603 KB
Keysight E4829B Cell Transfer Time Measurement Using the Parallel Cell / Traffic Generator/Analyzer (PN 83236A/B)
See the Product Note about how to use the Keysight E4829B custom / UTOPIA Level 1 implementation for cell transfer time variation measurements.

Application Note 1996-10-01

PDF PDF 113 KB
Cell Transfer Time Measurement using the Parallel Cell / Traffic Generator and Analyzer (PN 83236A/B)
This Product Note provides details of how to measure cell transfer time variation using the HP E4829B parallel cell/traffic generator and analyzer system. The Note explains how to use the HP E4829B custom / UTOPIA level 1 implementation for Real Time Bit Error Rate (BER) Measurements.

Application Note 1996-10-01

PDF PDF 113 KB
Cell Transfer Time Measurement with Keysight E4829B - Application Note
Cell Transfer Time Measurement with Keysight E4829B

Application Note 1996-10-01

PDF PDF 113 KB
Real-Time Bit Error Rate Analysis at Parallel Interfaces (UTOPIA) with the HP E4829B (PN E482xA/B...
This is a Product Note on how to use the HP E4829B custom / UTOPIA Level 1 implementation for real-time bit error rate (BER) measurements.

Application Note 1996-10-01

PDF PDF 101 KB
Real Time Bit Error Rate Analysis - Application Note
Real Time Bit Error Rate Analysis

Application Note 1996-10-01

PDF PDF 101 KB

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