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Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with J-BERT N4903A - App Note
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

Application Note 2006-07-18

PDF PDF 5.33 MB
Mastering Jitter in Serial Gigabit Designs - Brochure
Mastering Jitter in Serial Gigabit Designs

Promotional Materials 2006-06-22

PDF PDF 1.01 MB
81110A Pulse Pattern Generator-Simulating Distorted Signals for Tolerance Testing - App Note
81110A Pulse Pattern Generator-Simulating Distorted Signals for Tolerance Testing

Application Note 2006-06-01

PDF PDF 396 KB
81250 ParBERT System User Guide
This user guide provides comprehensive information on the hardware and standard user software of the Keysight 81250 Parallel Bit Error Ratio Tester.

User Manual 2006-03-30

PDF PDF 4.80 MB
Getting Started with N4903A
This guide helps you to quickly understand the operating principles and set up your first BER test.

Quick Start Guide 2006-01-01

PDF PDF 1.35 MB
J-BERT N4903A High-Performance Serial BERT Brochure
Brochure for the Keysight J-BERT N4903A High-Performance Serial BERT: 4 pages

Brochure 2005-10-14

PDF PDF 476 KB
81250 Measurement Software DUT Output Timing/Jitter Measurement - User Guide
The Keysight 81250 ParBERT Measurement Software provides the capability of not only measuring electrical inputs and outputs, it can also be used to test optical and optoelectrical devices.

User Manual 2005-05-31

PDF PDF 706 KB
81133A/81134A 12 Mbit Extended Pattern Memory - Product Fact Sheet
Information on the 12 Mbit Pattern Memory for the 81133A/34A

Brochure 2005-03-16

PDF PDF 179 KB
81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2) - Application Note
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ...

Application Note 2004-10-18

PDF PDF 220 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

PDF PDF
Advanced Jitter Generation and Analysis Product Note - Application Note
This product note shows how the Keysight pulse generators can be used with the DCA-J Oscilloscope.

Application Note 2004-10-04

PDF PDF 549 KB
Mux/Demux test with the Keysight 81250, ParBERT - Application Note
In this Application Note Mux/Demux is described as an important part of communication. The Keysight ParBERT 81250 is the only Parallel Bit-Error-Rate test solution for 660 MHz, 1.3 and 2.6 GBit/s.

Application Note 2004-08-04

Magneto-Optical Disk Drive Research (PN 3) - Application Note
This 4-page Product Note describes how the Keysight 81100 family of pulse/pattern generators can be used together with a Keysight Infinium oscilloscope to help magneto-optical disk drive.

Application Note 2004-07-29

PDF PDF 275 KB
Flat Panel Display Link Test - Application Note
This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Keysight 81250 Parallel Bit Error Ratio Tester (ParBERT).

Application Note 2004-07-29

Jump-start Signal Integrity Tests with Keysight's 81134A - Quick Fact Sheet
This poster shows how to start detailed and reliable, nevertheless quick Signal Integrity Measurements (1 page)

Promotional Materials 2004-06-22

PDF PDF 1.06 MB
The 81200 Data Generator/Analyzer Platform - Data Sheet
This technical specifications data sheet (release 3.5)provides a detailed description of the technical featuresand specifications of the Keysight 81200 Data Generator/Analyzers Platform. Information includes: moduledescription channels and grouping; pattern and sequencing;system clocks timing parameters; granularity; front-endparameters measurement modes; sampling rate and memory;powers requirements, the new front-ends addressingdifferential technologies and general characteristics

Data Sheet 2004-04-29

81200 Technical Specifications
81200 Technical Specifications

Data Sheet 2004-04-26

PDF PDF 2.36 MB
System Programming Guide and SCPI Reference
Programming guide and SCPI Reference to the 81250

Programming and Syntax Guide 2003-12-01

PDF PDF 2.83 MB
81133A/34A Photo Card - Product Fact Sheet
3.35 GHz Pulse/Pattern Generators Leading Pulse Performance

Promotional Materials 2003-07-01

PDF PDF 1.37 MB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) - Application Note
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

Application Note 2003-06-30

81250 ParBERT Measurement Software - Spectral Jitter Measurement User Guide
Contains a sample session, and detailed information on the prerequisites and the parameters shown on the results screens, as well as how to specify the input parameters and the graphical display of the movement.

User Manual 2003-05-29

PDF PDF 1.03 MB
81250 ParBERT Measurement Software - Spectral Jitter Measurement Programming Reference
This document describes the functions, properties and methods for controlling the Spectral Jitter measurment from a remote application

Programming and Syntax Guide 2003-05-29

PDF PDF 1.02 MB
10GbE Technology and Device Characterization with the 81250 ParBERT
A wide range of measurements are described in the 802.3ae Standard, including optical transmitter and receiver testing, electrical XAUI test are essentially eye mask measurements.

Application Note 2003-04-22

PDF PDF 1.91 MB
ParBERT 81250 Measurement Software - Output Level Measurement User Guide
This document provides the following information on examples of an Output Level Measurement, Basics of the Output Level Measurement and Setting the Properties of an Output Level Measurement.

User Manual 2003-02-21

PDF PDF 780 KB
Jitter Analysis Techniques for High Data Rates (AN 1432) - Application Note
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

Application Note 2003-02-03

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