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Electronic Measurement

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Overcome Your Test Challenges with the 33600A Series Trueform Waveform Generators - Application Note
Compendium of six 33600A Series Trueform waveform generator test challenge application briefs.

Application Note 2014-10-02

PDF PDF 4.02 MB
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical -AppNote
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

Application Note 2014-09-22

Wideband Digital Pre-Distortion with Keysight SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

Transferring Arbitrary Waveform Data to the 33200A Family of Function/Arbitrary Waveform Generators
This application note will review three methods of transferring arbitrary waveform data to 33200A Function/Arbitrary Waveform Generators: front panel, Keysight IntuiLink Waveform Editor, and programming.

Application Note 2014-07-31

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

Generating Looped Test Patterns or PRBS Signals with a Preamble - Application Note
This paper explains how to setup a test pattern with a preamble, which is played once e. g. to bring the tested device into a test mode, and the test data, played several times to test for errors.

Application Note 2014-03-04

PDF PDF 1.10 MB
Download the latest AWG Application Notes
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

Application Note 2014-02-10

Creating and Optimizing 802.11ac Signals with the M8190A AWG - Application Note
Designs for 802.11ac WLAN devices require test equipment that can provide the best reference test signals and measurements. N7617B enables this type of signals to be generated with the M8190A AWG.

Application Note 2013-08-13

PDF PDF 606 KB
Flexible Digital Modulation Solution - Application Note

Application Note 2013-06-17

Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.

Application Note 2013-04-29

PDF PDF 1.32 MB
Radar Distance Test to Airborne Planes - Application Note
Keysight pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
Baseband Up-Conversion to Desired Intermediate Frequency with Regard to Signal Quality and Play Time
Modulation bandwidth are increasing without compromising signal fidelity. this paper compares the different up-conversion methods to get best signal fidelity in the desired frequency range.

Application Note 2012-12-03

PDF PDF 546 KB
Frequency Agile Complex Signal Simulation with the Keysight M8190A Arbitrary Waveform Generator
The Keysight M8190A Arbitrary Waveform Generator (AWG) generates complex, realistic test signals needed for today's sophisticated signal simulation and system test. Keywords: Arbitrary Waveform Generator,Long play time, frequency agile switching,signal scenario generator

Application Note 2012-11-29

PDF PDF 636 KB
Testing Circuit Board Power Distribution Using Real World Distortions - Application Note
Noisy, fluctuating or, generally speaking, distorted DC power levels will affect the operation of Integrated Circuits (ICs). Here is a proposal how to test the immunity of compensation circuits.

Application Note 2012-11-26

PDF PDF 368 KB
33500B Series Complex Modular Generation with Low-Cost Arbitrary Waveform Generators - White Paper
This white paper illustrates how the Keysight 33500 Series waveform generators with Trueform technology can be applied to generate complex modulated signals.

Application Note 2012-08-27

Simplify the Generation of High-Quality IQ Signals - Application Note
Topics include Trueform technology, moving IQ signals from software to a 33500B Series waveform generator for play back, and built-in features for simulating conditions on an IQ signal for testing.

Application Note 2012-08-24

PDF PDF 620 KB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note
The Keysight 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Application Note 2012-08-13

Multi-Instrument Synchronization with the 81180A - Application Note
For applications that require more than two channels, a built-in synchronization feature allows for synchronizing two 81180A arbitrary waveform generators to create a fully synchronized 4-channel system.

Application Note 2011-11-04

PDF PDF 465 KB
Stressing 1 GbE Receivers on the Physcial Layer - Application Note
The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2011-11-03

Low-Cost Test Solution for ASK/FSK Wireless Devices - Application Note
Use Keysight’s basic RF instruments to measure and analyze ASK/FSK modulated signals commonly used in a variety of products and systems, ranging from personal consumer electronics and automatic meter reading, to giant industrial devices.

Application Note 2011-10-25

81150A and 81160A Arbitrary Bit-Shape Pattern Generator Application Note
The optional 81150A and 81160A Arbitrary Bit-Shape Pattern Generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2011-09-20

Creating a Complete and Flexible Solution for WiGig Testing Application Note
When developing new WiGig products, testing must address the transmitter and receiver portions of each device. In a tri-band device, signals have three key attributes: they operate at 2.4 GHz, 5.0 GHz

Application Note 2011-06-13

Using SystemVue’s Radar Library to Generate Signals for Radar Design and Verification - App Note
Keysight's Radar Library helps you with the productivity and accuracy of your radar signals.

Application Note 2011-01-25

OTA Test Methods for Evaluating the Performance of MIMO User Equipment
This application note discusses the theory, techniques and validation of three predominant OTA test methods including the two-stage OTA, multiple test probe OTA and reverberation chamber methods.

Application Note 2010-12-17

PDF PDF 2.10 MB

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