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How Digitally Generated Faded Signals Reduce Cost of Test (R&D only) - Application Note
Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns.
Application Note 2005-08-15
Designing and Testing cdma2000 Base Stations (AN 1357)
This Application Note describes base station design and measurement issues at the physical...
Application Note 2003-02-25
Designing and Testing cdma2000 Mobile Stations - Application Note 1358
One of the proposals for the IMT-2000 requirements for a 3G global wireless communications system is cdma2000. This application note describes mobile station design and measurement issues at the physical layer (layer 1) that may be different between cdma2000 and cdmaOne.
Application Note 2003-01-13
HPSK Spreading for 3G (AN 1335)
The objective of this Application Note is to provide an overview of Hybrid Phase Shift Keying (HPSK) and explain how to start making modulation quality measurements on the reverse link (uplink) of 3G spread-spectrum systems.
Application Note 2000-11-01
Understanding CDMA Measurements for Base Stations and Their Components (AN 1311)
This Application Note presents the fundamental measurement principles for the RF parametric tests performed on Code Division Multiple Access (CDMA) base stations and their components.
Application Note 2000-06-01
Performing cdma2000 Measurements Today (AN 1325)
cdma2000 is the 3GPP2 standard for 3G technology derived from cdmaOne. Although the standard has not yet been defined, R&D component and system engineers need to test their cdma 2000 designs today. This Application Note is a guide to cdma2000 testing based on established cdmaOne measurements...
Application Note 2000-05-22
ESG Option 201 Real-time IS-2000 Measurements
This Product Note discusses features, setup, and applications for the Keysight ESG Option 201 Real-time cdma2000 personality. It is intended to provide R&D designers working on DSPs, ASICs, and other firmware components of IS-95 and IS-2000 mobile phones with techniques for testing and...
Application Note 2000-04-03