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Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Application Note 2006-05-03

How Digitally Generated Faded Signals Reduce Cost of Test (R&D only) - Application Note
Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns.

Application Note 2005-08-15

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Application Note 2005-04-01

Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Application Note 2005-03-29

Testing HSDPA functionality and performance in User Equipment
The objective of this paper is to explain the meaning and the purpose of the new HSDPA performance requirements tests that are part of the HSDPA Release 5 specifications.

Application Note 2005-03-01

Mastering the New Base Stations: Design and Test of ADPA and Digital Transceivers for 3G Radios.
This paper examines adaptive digital pre-distortion (ADPD) technology and the test challenges associated with implementing ADPD amplifiers and digital radio transceivers.

Application Note 2005-02-01

WiMAX Concepts and RF Measurements - Application Note
This application note reviews the RF characteristics of the 256 carrier OFDM air interface defined in 802.16-2004 and the RF parametric tests that can be performed with Keysight test solutions.

Application Note 2005-01-05

Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

Using LAN in Test Systems: Network Configuration - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN).

Application Note 2004-09-14

Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

Performing Digital-IF/RF-Digital Bit Error Rate Measurement
This AN describes how to use Keysight Instruments and ADS EDA software to verify RF performance measures such as BER and EVM for end-to-end digital-IF/RF-digital systems--from bits in to bits out.

Application Note 2004-03-12

Radar Emitter Simulation Using the E8267C PSG Vector Signal Generator
This 32-page application note explains how to generate and evaluate complex radar signals using the Keysight E8267C vector signal generator.

Application Note 2003-12-01

Radar Emitter Simulation Using Vector Signal Generators (MATLAB waveform examples)
Example of MATLAB files for generating complex waveforms (at ease) for radar system design verification using off-the-shelf microwave vector signal generators.

Analysis Tool 2003-11-12

E4438C Signal Studio for Bluetooth® - Application Note
This application note is a self-guided tutorial that describes the test signals that can be created with Signal Studio for Bluetooth®.

Application Note 2003-10-16

E4438C Signal Studio for 1xEV-DO Application Note
This application note is a self-guided tutorial describing the test signals that can be created with Signal Studio for 1xEV-DO.

Application Note 2003-06-13

Designing and Testing cdma2000 Base Stations (AN 1357)
This Application Note describes base station design and measurement issues at the physical...

Application Note 2003-02-25

Making 802.11G Transmitter Measurements (AN 1380-4) - Application Note
This 12-page application note provides an overview of 802.11g WLAN technology and reviews the tests used to design and manufacture 802.11g transmitters and modulators.

Application Note 2003-02-21

Designing and Testing 3GPP W-CDMA User Equipment - Application Note
This Application Note focuses on the physical layer (layer 1) of the Frequency Division Duplex (FDD) mode of W-CDMA.

Application Note 2003-02-21

Two-tone and Multitone Personalities for the E8267C PSG Vector Signal Generator (AN 1410)
Generating two-tone and multitone signals at MW frequencies has never been easier. The E8267C PSG is the first MW signal generator with an integrated I/Q modulator and internal baseband generator.

Application Note 2003-02-06

Obtain Flat-Port Power with Keysight's PSG User Flatness Correction or External Leveling Functions
The PSG series is ideally suited for design and test systems with high frequencies, wide bandwidths and complex modulation formats. This Product Note explains how to obtain flat...

Application Note 2003-02-04

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