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LTE-Advanced Design & Test Challenges - Carrier Aggregation
Original broadcast August 23, 2012

Webcast - recorded

Optimize UE Design for Greater Battery Run-Time
Original broadcast April 26, 2012

Webcast - recorded

Scalar Network Analysis Measurement using Agilent Power Meters and Sensors
Scalar Network Analyzer (SNA) Tool consists of application software which able to work together with Agilent power meters and sensors. This solution removes the need for programming and automates the calibration procedures of ...

Webcast - recorded

Increase spectral efficiency in coherent optical communication
With Social Networks and Visual Online Contents the data trafic is forecasted to reach 6.3 Exabytes per month by 2015. To handle this, Provider need to adapt their networks. The upcoming webinar proposes how to face this challenge.

Webcast - recorded

DC Power supply fundamentals to get the most out of your applications
With modern performance and safety features in power supplies, the flexibility exists to create test setups that are simpler and more effective. This web seminar covers 10 fundamentals about your power supply to take advantage of these features.

Webcast - recorded

IEEE 802.11ad PHY Layer Testing
This web seminar will start with a brief tutorial introduction to the IEEE 802.11ad PHY layer. We will then review a variety of modulation analysis measurements and consider what can each of them tell us about the device under test.

Webcast - recorded

Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

Webcast - recorded

Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

Webcast - recorded

Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

Introduction to 802.11ac WLAN Technology and Testing
This web seminar provides an introduction to the new IEEE 802.11ac standard that is under development to address the need for “very high throughput.”

Webcast - recorded

Eliminate the need for cumbersome multi-instruments setups for stress testing devices
EMEA web seminar - Eliminate the need for cumbersome multi-instruments setups for stress testing devices

Webcast - recorded

Optimise UE design for greater battery run-time
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.

Webcast - recorded

Analyze Agile or Elusive Signals Using Real-time Measurement and Triggering Webcast
Original broadcast April 24, 2013

Webcast - recorded

Advanced Passive Intermodulation (PIM) Measurement System Webcast
Original broadcast August 29, 2013

Webcast - recorded

8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast
Original broadcast April 25, 2013

Webcast - recorded

3GPP LTE Standards Update: Release 11, 12 and Beyond
Original broadcast October 25, 2012

Webcast - recorded

Measurement Challenges and Techniques for SATCOM
Original broadcast August 16, 2012

Webcast - recorded

Simulating Power Transients and Noise
Original broadcast Jun 21, 2012

Webcast - recorded

Essentials of OFDM and MIMO
Original broadcast September 20, 2012

Webcast - recorded

Fundamentals of Fast Pulsed IV Measurement Webcast
Original broadcast January 9, 2014

Webcast - recorded

RF Testing in Automobile
Keysight's low-cost solutions for TPMS, RKE/PKE measurements help engineers get their RF tests done reliably and cost effectively, by saving about one third instrument budget.

Webcast

RF Testing in Automobile
Want to catch up with the rapidly developing TPMS industry, yet keep your cost of test low? Follow up with Keysight TPMS measurement solution today.

Webcast

Wide Bandgap (GaN & SiC) Power Semiconductor Device Measurements
Learn how to make real time IV measurements on Power Devices at upto 1.5kA and upto 10kV. The Webcast also includes GaN current collapse measurements which are essential for device development and manufacturing process optimisation.

Webcast

Measuring Complex Materials and their Components Seminar 2013
Keysight will provide a FREE all day seminar including impedance measurements fundamentals, characterizing complex materials, measuring material properties in nano-scale resolutionand discuss emerging novel materials research-challenges and solutions.

Seminar

1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices.
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast - recorded

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