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Conduct DVB-T/H Conformance Tests with Keysight's Real-time DVB-T/H Digital Video Solution
This application note provides an introduction to the performance test requirements for DVB-T/H receivers, as defined in EICTA MBRAI 2.0, and it describes test setup and configurations.

Application Note 2010-04-30

PDF PDF 904 KB
AN B1500A-2 Migrating from the Keysight 4155C and 4156C to the Keysight B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.

Application Note 2010-04-02

AN B1500-16 A Complete Solution for CMOS Device Electrical Characterization
This application note gives an overview of the B1500A's key features and it goes on to show how the B1500A is a complete solution for CMOS device electrical characterization.

Application Note 2010-03-24

AN B1500-15 Ultra Low Current DC MOSFET Characterization at the Wafer Level
This application note describes how to precisely evaluate sub-threshold characteristics of a MOSFET device using B1500A’s ultra low current measurement capability

Application Note 2010-03-23

Typical GPS Receiver Verification Tests Using a GPS Signal Simulator - Application Note
This paper describes typical GPS receiver verification tests using a GPS signal simulator. The tests are used to verify functionality of embedded GPS receivers in mobile consumer products such as cell phones and other handheld receivers.

Application Note 2010-03-04

AN B1505-3 Precision Power Device Evaluation at 40 Amps
This application note introduces 40A IV measurement application for power devices by using two HCSMUs installed in the B1505A.

Application Note 2010-02-24

High-Performance Arbitrary Waveform Generation for RADAR and LIDAR Application
Presentation given at the Aerospace and Defense Symposium in 2009. It covers radar principles and challenges, radar test systems, and Keysight solutions.

Application Note 2010-02-17

PDF PDF 1.32 MB
MIMO Channel Modeling and Emulation Test Challenges Application Note

Application Note 2010-01-22

Solutions for MIMO Receiver Test
This application note shows how engineers can quickly and accurately isolate issues early in the lifecycle to minimize design uncertainty and maximize receiver performance.

Application Note 2010-01-14

AN B1505-2 Next Generation Curve Tracer Revolutionizes Failure Analysis
This application note describes how the B1505A enable for checking device operation and failure analysis using curve tracer mode.

Application Note 2010-01-08

CMMB Conformance Testing using the PXB with N7623B Signal Studio for Digital Video
This application note introduces CMMB technologies and conformance test requirements and explains the test setup and configurations for the N5106A PXB and N7623B Signal Studio for Digital Video

Application Note 2010-01-04

PDF PDF 936 KB
GPS Receiver Testing - Application Note
This paper describes GPS receiver tests used for GPS verification. It also introduces an application capable of generating the required GPS signals for a repeatable and flexible test environment.

Application Note 2010-01-04

W-CDMA BER Test on picoChip Femtocell Reference Design Using Keysight MXG
This application note explains single-direction BER testing of femtocell devices based on picoChip femtocell reference designs using the Keysight N5182A MXG vector signal generator.

Application Note 2009-12-15

PDF PDF 1.12 MB
Power Toolbox for Embedded System Design, Dynamic Current Profiling
This is the 2nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; focusing on dynamic current profiling.

Application Note 2009-12-15

PDF PDF 768 KB
Creating, Editing, Transferring Arbitrary Waveforms with Keysight U2761A Function Generator
This application note explores how a complex arbitrary waveform is created by using software, importing, reusing existing waveform files and easily programs your instrument with the free Command Logger and Code Converter functions.

Application Note 2009-12-11

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

AN B1505-1 Accurate and Efficient Characterization of Power Devices at 3000 V/20 A
This application note describes how to perform accurate and efficient characterization of power devices up to 3000 V/20 A by using the B1505A.

Application Note 2009-11-18

Base Station Subassemblies: Addressing DC Power Test Challenges
This application note addresses the numerous DC power-related challenges that base station providers are faced with during development and production test of their subassemblies.

Application Note 2009-11-16

PDF PDF 382 KB
Three Reasons to Migrate From Your 8662A/8663A to the E8663D RF Signal Generator - Application Note
This application note demonstrates the advantages of the E8663D over the 8662A/8663A, giving you three compelling reasons to migrate: superior performance, enhanced usability, and modern supportability.

Application Note 2009-10-22

PN B1500-1 Pulse/arbitrary waveform generator with integrated measurement capabilities
The Keysight B1530A WGFMU is a pulse/arbitrary waveform generator with fast current or voltage sampling capabilities. This product note introduces various measurement applications enabled by unique features of the WGFMU.

Application Note 2009-10-16

I-V Curve Characterization in High-Power Solar Cells and Modules
This unique application note discusses capturing the I-V curve of a high power solar cell or module under illuminated conditions and offers the ability to characterize the dark or reverse bias region of the cell or module under test.

Application Note 2009-09-30

PDF PDF 378 KB
Generating and Applying High-Power Output Signals
This application note describes both the inner workings of the PSG with Option 521 and the applications of its high-power output signals.

Application Note 2009-09-30

Product Note B1505A-1 Creating Custom Socket Modules
This product note describes the procedure to develop custom socket modules for B1505A Power Device Analyzer/Curve Tracer to measure packaged power devices such as SMD which are not supported by an inline package.

Application Note 2009-09-09

3GPP Long Term Evolution: System Overview, Product Development and Test Challenges -Application Note
This application note focuses on LTE and includes content on system overview, product development and test challenges of this new wireless communications technology.

Application Note 2009-09-08

Power Toolbox for Embedded System Design-Simulating Power Supply Interrupts
This is the 3nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; specifically preventing power supply interrupts

Application Note 2009-08-21

PDF PDF 482 KB

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