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Trends in Programmable Medium Power (~1 kW) System DC Power Supplies (AN 1507)

Application Note 2004-10-28

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)

Application Note 2004-10-22

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)

Application Note 2004-10-22

Increase Automotive ECU Test Throughput (AN 1505)

Application Note 2004-10-22

81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2) - Application Note
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ...

Application Note 2004-10-18

81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

Side-by-Side Comparison: Keysight N5700 System DC Source and Sorensen DLM Power Supply (AN 1502-1)

Application Note 2004-10-05

Advanced Jitter Generation and Analysis Product Note - Application Note
This product note shows how the Keysight pulse generators can be used with the DCA-J Oscilloscope.

Application Note 2004-10-04

Mux/Demux test with the Keysight 81250, ParBERT - Application Note
In this Application Note Mux/Demux is described as an important part of communication. The Keysight ParBERT 81250 is the only Parallel Bit-Error-Rate test solution for 660 MHz, 1.3 and 2.6 GBit/s.

Application Note 2004-08-04

How to use the Keysight N6700 Modular Power System to replace a Keysight 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to a Keysight N6700.

Application Note 2004-08-02

Magneto-Optical Disk Drive Research (PN 3) - Application Note
This 4-page Product Note describes how the Keysight 81100 family of pulse/pattern generators can be used together with a Keysight Infinium oscilloscope to help magneto-optical disk drive.

Application Note 2004-07-29

Flat Panel Display Link Test - Application Note
This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Keysight 81250 Parallel Bit Error Ratio Tester (ParBERT).

Application Note 2004-07-29

Create a Variety of Frequency Sweeps, Including Stepped Sweep Using Frequency Modulation
Some applications require a variation of frequency sweep such as a stepped sweep. This application note covers how to create a variety of frequency sweeps using frequency modulation.

Application Note 2004-05-07

Creating Arbitrary Waveforms Using Direct Digital Synthesis (DDS)
Modern arbitrary waveform generators frequently use direct digital synthesis (DDS) for creating waveforms. This application note provides some guidance when using a DDS generator to output arbitrary waveforms.

Application Note 2004-05-07

Words replaced by symbols in some applications after installing IntuiLink Waveform Editor (ver. 1.4)
Symptoms: After installing IntuiLink Waveform Editor (version 1.4), words in menu bars or dialog boxes may be replaced by unfamiliar symbols...

Application Note 2004-04-01

Create Music using Frequency Modulation
Each musical note has a different frequency associated with it. To play a specific piece of music, you play the different frequencies for a certain duration and in a certain sequence. By modulating a sine wave with an arbitrary...

Application Note 2004-03-22

Better, Safer Power Generation Measurements in Less Time
Attached is a White Paper by John Demcko of Arizona Public Service and John Jensen of Hewlett-Packard, first published in Realtime Update, Fall 1995 - Winter 1996, Hewlett-Packard, that discusses safer power generation measurements in less time. If you're trying to boost efficiency in an electric...

Application Note 2004-02-20

Programmable Stimuli for Stress-testing and Component Evaluation (AN 1251) - Application Note
Will a flash memory still be good after a hundred thousand operations? Does a switching diode switch quickly enough to avoid burning energy on the reverse part of the cycle? How much does a resistor change its value when a pulse is applied? What is the performance of a laser, and how much energy...

Application Note 2004-02-20

Multi-channel Setup with Programmable Inter-channel Phase
In the past, the problem has been to generate a number of synchronous signals with programmable phase difference. The attached Product Note explains how this can be solved by master/slaving a number of Keysight 3324A synthesized function generators.

Application Note 2004-02-20

Test signals for multi-input digital devices - Application Note
Designed for characterizing digital circuits in the lab and in the automatic test environment, the Keysight 8110A pulse generator has extensive functionality and high parametric performance. Its small size and weight pair well with Keysight's oscilloscopes so that a powerful stimulus-response tool...

Application Note 2004-02-20

Multi-channel signals with the Keysight E1440A
The attached Application Note is an example describing the test of vehicle receivers used in Decca-type location systems that require a number of synthesizers to simulate the signals from a number of fixed transmitters. The frequencies, which are multiples of the master transmitter frequency...

Application Note 2004-02-20

Radar Emitter Simulation Using the E8267C PSG Vector Signal Generator
This 32-page application note explains how to generate and evaluate complex radar signals using the Keysight E8267C vector signal generator.

Application Note 2003-12-01

How to capture, save, and reproduce arbitrary waveforms
This 6-page application note provides techniques for capturing, saving and reproducing current waveforms and profiles.

Application Note 2003-11-21

Radar Emitter Simulation Using Vector Signal Generators (MATLAB waveform examples)
Example of MATLAB files for generating complex waveforms (at ease) for radar system design verification using off-the-shelf microwave vector signal generators.

Analysis Tool 2003-11-12

High Speed L-I-V Test of Laser Diode Using Keysight E5272A/E5273A AN E5270-4
This application note introduces a technique of programming for high speed L-I-V test of Laser Diode in production.

Application Note 2003-10-17

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