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Direct instrument connection using LAN
If connecting directly to an instrument using LAN (rather than through a server) there are some steps that can be taken to make the initial connection faster and get you up-and-running more quickly.

Application Note 2004-11-01

Trends in Programmable Medium Power (~1 kW) System DC Power Supplies (AN 1507)

Application Note 2004-10-28

Increase Automotive ECU Test Throughput (AN 1505)

Application Note 2004-10-22

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)

Application Note 2004-10-22

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)

Application Note 2004-10-22

System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2) - Application Note
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ...

Application Note 2004-10-18

PDF PDF 220 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

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Side-by-Side Comparison: Keysight N5700 System DC Source and Sorensen DLM Power Supply (AN 1502-1)

Application Note 2004-10-05

PDF PDF 580 KB
Advanced Jitter Generation and Analysis Product Note - Application Note
This product note shows how the Keysight pulse generators can be used with the DCA-J Oscilloscope.

Application Note 2004-10-04

PDF PDF 549 KB
Using LAN in Test Systems: Network Configuration - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN).

Application Note 2004-09-14

Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

Mux/Demux test with the Keysight 81250, ParBERT - Application Note
In this Application Note Mux/Demux is described as an important part of communication. The Keysight ParBERT 81250 is the only Parallel Bit-Error-Rate test solution for 660 MHz, 1.3 and 2.6 GBit/s.

Application Note 2004-08-04

How to use the Keysight N6700 Modular Power System to replace a Keysight 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to a Keysight N6700.

Application Note 2004-08-02

Magneto-Optical Disk Drive Research (PN 3) - Application Note
This 4-page Product Note describes how the Keysight 81100 family of pulse/pattern generators can be used together with a Keysight Infinium oscilloscope to help magneto-optical disk drive.

Application Note 2004-07-29

PDF PDF 275 KB
Flat Panel Display Link Test - Application Note
This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Keysight 81250 Parallel Bit Error Ratio Tester (ParBERT).

Application Note 2004-07-29

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

PDF PDF 270 KB
Creating Arbitrary Waveforms Using Direct Digital Synthesis (DDS)
Modern arbitrary waveform generators frequently use direct digital synthesis (DDS) for creating waveforms. This application note provides some guidance when using a DDS generator to output arbitrary waveforms.

Application Note 2004-05-07

Create a Variety of Frequency Sweeps, Including Stepped Sweep Using Frequency Modulation
Some applications require a variation of frequency sweep such as a stepped sweep. This application note covers how to create a variety of frequency sweeps using frequency modulation.

Application Note 2004-05-07

Words replaced by symbols in some applications after installing IntuiLink Waveform Editor (ver. 1.4)
Symptoms: After installing IntuiLink Waveform Editor (version 1.4), words in menu bars or dialog boxes may be replaced by unfamiliar symbols...

Application Note 2004-04-01

Create Music using Frequency Modulation
Each musical note has a different frequency associated with it. To play a specific piece of music, you play the different frequencies for a certain duration and in a certain sequence. By modulating a sine wave with an arbitrary...

Application Note 2004-03-22

Performing Digital-IF/RF-Digital Bit Error Rate Measurement
This AN describes how to use Keysight Instruments and ADS EDA software to verify RF performance measures such as BER and EVM for end-to-end digital-IF/RF-digital systems--from bits in to bits out.

Application Note 2004-03-12

PDF PDF 270 KB
Test signals for multi-input digital devices - Application Note
Designed for characterizing digital circuits in the lab and in the automatic test environment, the Keysight 8110A pulse generator has extensive functionality and high parametric performance. Its small size and weight pair well with Keysight's oscilloscopes so that a powerful stimulus-response tool...

Application Note 2004-02-20

PDF PDF 21 KB
Multi-channel signals with the Keysight E1440A
The attached Application Note is an example describing the test of vehicle receivers used in Decca-type location systems that require a number of synthesizers to simulate the signals from a number of fixed transmitters. The frequencies, which are multiples of the master transmitter frequency...

Application Note 2004-02-20

PDF PDF 17 KB
Multi-channel Setup with Programmable Inter-channel Phase
In the past, the problem has been to generate a number of synchronous signals with programmable phase difference. The attached Product Note explains how this can be solved by master/slaving a number of Keysight 3324A synthesized function generators.

Application Note 2004-02-20

PDF PDF 10 KB

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