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Electronic Measurement

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N4917A Getting Started Guide
Revision 1.4 (released with SW 1.3)

Quick Start Guide 2012-05-01

PDF PDF 2.06 MB
Agilent to Acquire Centellax’s Test and Measurement Business
Agilent Technologies Inc. (NYSE: A) and Centellax today announced they have signed a definitive agreement for Agilent to acquire the assets of Centellax's test and measurement business.

Press Materials 2012-04-27

N4877A Clock Data Recovery Getting Started Guide
Revision 1.0 (Released with N4877A Software 1.0.0.0).

Quick Start Guide 2012-04-26

PDF PDF 1.23 MB
N4877A Clock Data Recovery User's Guide
Revision 1.0 (Released with N4877A Software 1.0.0.0).

User Manual 2012-04-26

PDF PDF 1.47 MB
N4880A Reference Clock Multiplier Data Sheet
This data sheet details how this reference clock multiplier can characterize receivers, lock the stressed pattern generator to the reference clock, and use multiple clock rates.

Data Sheet 2012-04-16

PDF PDF 3.31 MB
N4880A Reference Clock Multiplier User's Guide
The N4880A is a reference clock multiplier. It extends the J-BERTs and ParBERTs capability to allow jitter pass through from the reference clock tothe BERTs data out. The supported operating modes are PCI Express 1 to 3, MIPI M-PHY and UHS-II standards.

User Manual 2012-03-01

PDF PDF 1.17 MB
N4880A Reference Clock Multiplier Getting Started Guide
This Getting Started Brochure helps you to quickly install and operate the instrument.

Quick Start Guide 2012-03-01

PDF PDF 2.43 MB
N4906B Serial BERT Getting Started Guide
A guide to get started with the N4906B Serial BERT

Quick Start Guide 2012-03-01

PDF PDF 1.81 MB
Electrical and Optical Clock Data Recovery Solutions
Agilent Technologies Inc. (NYSE: A) today introduced a new family of instrumentation-grade clock recovery solutions for optical and electrical testing of high-speed digital communications components and systems. The solutions offer the industry's highest bandwidth and low jitter performance at significantly lower cost than similar products.

Press Materials 2012-02-28

N4916B De-Emphasis Signal Converter User's Guide
Revision 3 (Released with N4916B Software 1.1.13.0).

User Manual 2012-02-01

PDF PDF 921 KB
Pulse Pattern and Function Arbitrary Generators and Arbitrary Waveform Generators - Brochure
This Keysight family of pulse/pattern generators can help you verify and characterize digital or analog systems, products, and components.

Brochure 2012-01-27

PDF PDF 1.48 MB
N2101B 10.3125 Gb/s Bit Error Ratio Tester - Data Sheet
The N2101B PXIT 10.7 Gb/s Bit Error Ratio Tester consists of a high accuracy clock source, data pattern generator, and error detector. It will automatically perform bit error ratio analysis to characterize the quality of devices at 10 standard internal rates from 155 Mb/s to 8.5 Gb/s.

Data Sheet 2012-01-27

How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification - Application Brief
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

Application Note 2011-11-30

N2101B 10.3125 Gb/s Bit Error Ratio Tester
This flyer provides a brief description of the features and benefits the N2101B Gb/s Bit Error Ratio Tester provides.

Brochure 2011-11-27

PDF PDF 243 KB
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper - Application Note
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper

Application Note 2011-09-01

PDF PDF 2.20 MB
N4915A-014 PCI Express 3.0® Calibration Channels - Data Sheet
The N4815A-014 PCI Express 3.0 calibration channels allow to generate receiver stress conditions according to PCIe 3.0 base specification rev 1.0 when used together with J-BERT N4903B and N4916B.

Data Sheet 2011-07-05

Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 - Application Note
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Application Note 2011-06-22

N4876A 28 Gb/s Multiplexer 2:1 - Data Sheet
The N4876A 28Gb/s multiplexer allows to extend the generator data rate of the J-BERT N4903B and ParBERT81250A up to 28.4 Gb/s. Design and test engineers in the semiconductor, communications, storage and computer industry can now accurately characterize the next generation of serial interfaces operating at bitrates of up to 28.4 Gb/s. With its excellent output performance it helps to optimize design margins by minimizing the influence of the test equipment on measurement results.

Data Sheet 2011-03-17

PDF PDF 1.39 MB
N4876A 28 Gb/s Multiplexer Getting Started Guide for setups with ParBERT

Quick Start Guide 2010-12-20

PDF PDF 661 KB
Error Detection Up to 28.4 Gb/s During Receiver Test with the Keysight J-BERT - Application Note
J-BERT N4903B pattern generation is extended up to 28.4 Gb/s with second channel Option 002 and N4876A 2:1 Mux. The single 12.5 Gb/s ED can easily be used during RX test utilizing under-sampling.

Application Note 2010-09-16

N4876A 28 Gb/s Multiplexer User Guide
Revision 1.0 (Released with N4876A Software 1.0.0.7).

User Manual 2010-06-24

PDF PDF 1.25 MB
81495A Reference Receiver Technical Specifications
This document describes the technical specifications and capabilities of Agilents 81495A Reference Receiver

Data Sheet 2010-05-17

PDF PDF 256 KB
N5998A HDMI Protocol/Audio/Video Analyzer and Generator - Data Sheet
This data sheet provides a description of the Keysight N5998A. As stated in the HDMI 1.4 compliance test specification (CTS), this instrument can act as a recommended protocol analyzer, audio timing analyzer and vidio timing analyzer.

Data Sheet 2009-12-09

Serial ATA Design and Test, A better way - Brochure
Keysight's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2009-12-08

PDF PDF 1.43 MB
USB Design and Test - A Better Way - Application Note
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2009-11-03

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