Contact an Expert

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

1-9 of 9

Sort:
6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

Application Note 2012-02-02

PDF PDF 1.59 MB
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

Application Note 2012-01-12

Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.

Application Note 2011-07-08

PDF PDF 1.77 MB
Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Designing High Speed Backplanes Utilizing Physical Layer Test System
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.

Application Note 2006-01-18

Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices

Application Note 2005-11-01

Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).

Application Note 2004-06-01