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Electronic Measurement

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Efficient Cable and Antenna Testing - Article Reprint
This article was featured in the December 2012 issue of Above Ground Level and discusses techniques and instrumentation for verifying and troubleshooting cables, connectors, and antennas.

Article 2013-08-13

PDF PDF 1.99 MB
Remote-Controlled Handheld Analyzers: Opening Up a World of New Possibilities - Article Reprint
This article was featured in the June 2013 issue of Microwave Product Digest and highlights the use models and benefits of using a remote-controlled handheld analyzer.

Article 2013-08-01

PDF PDF 1.97 MB
Using Network Analyzer Time-Domain Analysis to Verify and Troubleshoot Complex Components - Article
Microwave Product Digest May 2013 feature article that discusses using FieldFox's time domain analysis to troubleshoot complex components.

Article 2013-06-19

PDF PDF 1.60 MB
EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA

Article 2012-11-30

The New Techniques Simplify Military Frequency-Converter Characterization - Article Reprint
This article is about a new technique that simplifies and reduces the cost of the measurement test set up.

Article 2012-11-01

PDF PDF 2.44 MB
Testing Interference in a Wireless Environment - Article Reprint
Identification and reduction of interference has become essential to the proper operation in all wireless systems.

Article 2012-10-22

PDF PDF 202 KB
Carrying Microwave Precision Into the Field - Article Reprint
Microwave Journal, September 2012 FieldFox product feature.

Article 2012-10-22

PDF PDF 1.83 MB
Impedance Measurement With E5061B LF-RF Network Analyzer Slides
This presentation material describes fundamentals, calibrations, and application examples of the impedance measurement using the E5061B-3L5 LF-RF network analyzer.

Article 2012-04-22

PDF PDF 5.38 MB
Solutions for Nonlinear Characterization of High-Power Amplifiers - Article
The article was written by Keith Anderson and published in the Wireless Design magazine

Article 2011-05-02

EE Times: Time-domain simulations of high-speed links with X parameters

Article 2011-03-29

X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

Microwave Engineering Europe X-parameters Article

Article 2010-06-02

Identifying and Solving GSM 850 Interferences with Public Safety Communications
Identifying, solving GSM 805 interferences with public safety communications. Learn how Keysight and Bryant Solutions solved interference issues between a wireless operator and public safety agencies.

Case Study 2010-05-10

PDF PDF 809 KB
Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

Article 2010-03-25

PDF PDF 771 KB
Tester overcomes RF problems with wireless network deployment and maintenance
Article reprinted with permission from AGL.

Article 2009-12-24

PDF PDF 2.33 MB
X-Parameters: Commerical Implementations of the Latest Technology Enable Mainstream Applictions - Ar
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters.

Article 2009-10-09

PDF PDF 1.12 MB
Microwaves and RF Cover Article: Nonlinear VNAs Extend to 50 GHz

Article 2009-07-23

Electronic Products - 2008 Product of the Year Award
Analyzer changes fundamental way communications networks are designed

Article 2009-01-01

New measurement option expands Agilent’s leadership in noise figure analysis
There are many choices today for performing noise figure measurements of LNAs and transistors. The new PNA-X source-corrected method offers a technique that provides the most accurate noise figure measurements available today.

Article 2007-11-01

PDF PDF 1.05 MB
Going Beyond S-parameters with an Advanced Architecture for Vector Network Analysis

Article 2007-07-26

PDF PDF 624 KB
The Evolution of RF/Microwave Network Analyzers

Article 2007-03-28

PDF PDF 969 KB
Efficere Technologies Develops World Class Test Fixtures
Read about Efficere’s design success using Keysight’s PLTS software, E8364B PNA and N1930A test set

Case Study 2006-11-29

PDF PDF 297 KB