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PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)

Application Note 2007-11-28

Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note

Application Note 2007-10-09

Measuring Group Delay of Frequency Converters with Embedded LO

Application Note 2007-09-26

Differences in Application Between Power Dividers and Power Splitters
This application note presents the characteristics of power splitters and power dividers and gives an overview of the different applications they are used in.

Application Note 2007-08-24

Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Replace 8508A Vector Voltmeter with ENA-L RF Network Analyzers
This application note shows examples of how the ENA-L RF network analyzers with their VVM emulation VBA programs can replace the 8508A vector voltmeter.

Application Note 2007-06-05

Backplane Differential Channel Microprobe Characterization in time and Frequency Domains

Application Note 2007-05-09

PDF PDF 769 KB
Accurate Mixer Measurements with ENA Frequency-Offset Mode (AN 1463-6)
Recommended measurement procedures for evaluating mixers.

Application Note 2007-05-07

Advanced Measurement Techniques for RF Amplifiers Using Unique Functions of the Keysight E5071C ENA
This application note will briefly review the basic measurement fundamentals of characterizing amplifiers with network analyzers.

Application Note 2007-04-27

How Operating Life and Repeatability of Keysight’s EM Switches Minimize System Uncertainty
This application note discusses the effects of operating life and repeatability on coaxial electromechanical switches.

Application Note 2007-04-09

Power Handling Capability of Electromechanical Switches
This application note discusses the power handling of the hot switching and cold switching of EM switches.

Application Note 2007-03-05

Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Impedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM)
This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture.

Application Note 2006-11-29

PNA - Amplifier Swept-Harmonic Measurements (1408-8)
This application note cover testing an amplifiers harmonics, using (MW) PNA Series of vector network analyzers. Linear parameters, such as gain and return loss are covered in Application Note 1408-7.

Application Note 2006-08-14

Improving Meas. and Calibration Accuracy using the Frequency Converter (1408-3) – Application Note
Improving Measurement and Calibration Accuracy Using the Frequency Converter Application - AN 1408-3

Application Note 2006-08-08

PNA - Amplifier Linear and Gain Compression Measurements (1408-7)
Application note covering testing of an amplifier's linear S-parameters and gain compression using Keysight's microwave PNA Series of vector network analyzers.

Application Note 2006-08-08

PNA - Amplifier-CW and Swept IMD Measurements (1408-9)
This application note covers testing an amplifier's intermodulation-distortion products, using (MW) PNA Series of vector network analyzers.

Application Note 2006-08-08

Split Post Dielectric Resonators for Dielectric Measurements of Substrates - Application Note
The split post dielectric resonator (SPDR) provides an accurate technique for measuring the complex permittivity of dielectric and ferrite substrates and thin films at a single frequency point in the frequency range of 1 to 20 GHz.

Application Note 2006-07-19

Using Multiple Test Sets with 8510C (PN 8510-14)
A single 8510C Vector Network Analyzer can be configured to alternately control up to four test sets.

Application Note 2006-07-13

PDF PDF 256 KB
Crystal Resonator Measuring Functions of E5100A Network Analyzer (PN E5100A-2)
This Product Note describes about crystal resonator measurement using network analyzer, E5100A.

Application Note 2006-07-13

8510 Automation Software
This Product Note provides information on measurement automation software for the 8510 network analyzer. The software controls the network analyzer and leads the user step-by-step through measurements.

Application Note 2006-07-13

PDF PDF 487 KB
8510 Calibration Standard Definitions (AN 8510-5B)
This Product Note covers methods for specifying calibration standards and describes the procedures for their use with the Keysight 8510 Network Analyzer.

Application Note 2006-07-13

PDF PDF 1.12 MB
8510 Calibration - Measuring Noninsertable Devices (PN 8510-13)
The majority of devices used in real-world microwave systems are noninsertable because of the connectors employed.

Application Note 2006-07-13

PDF PDF 261 KB
Upgrade Guide for the Keysight 8510
This 20 page Product Note describes how the 8510 systems can be upgraded from any combination of the following to another: Keysight 8510XF, 85106D, and 85107B.

Application Note 2006-07-13

PDF PDF 290 KB

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