Hable con un experto

Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

126-150 of 251

Sort:
A Design of Experiments for Gigabit Serial Backplane Channels

Application Note 2008-09-03

PDF PDF 2.44 MB
Oscilloscope probing for high-speed signals
The probe is the dominant factor in determining the noise floor and response of your measurement system. Probe loading effects on the circuit under test are also a critical consideration.

Application Note 2008-09-03

Total Analysis Environment for Modeling
Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

Application Note 2008-08-21

High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.

Application Note 2008-08-21

Data Mining 12-Port S-Parameters

Application Note 2008-08-11

PDF PDF 830 KB
InfiniiMax Probes Impact on Lead-Free (ROHS) Compliance
Some Keysight InfiniiMax oscilloscope probe heads are intended for soldering to the device under test.

Application Note 2008-06-20

PDF PDF 221 KB
The Truth About The Fidelity of High Bandwidth Voltage Probes, AN 1404
An analysis of high-bandwidth voltage probes that reveals a fundamental tradeoff between fidelity and ease of use that exists with all high-bandwidth probes.

Application Note 2008-06-20

ADSL Copper Loop Measurements (PN 4395-1)
This product note provides a practical guidance for the copper loop measurement for ADSL by using the 4395A.

Application Note 2008-04-15

PDF PDF 123 KB
Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

Application Note 2008-04-10

PDF PDF 116 KB
Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches
This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements.

Application Note 2008-03-10

Pulsed-RF Measurement Application Notes & Technical Papers
Browse Keysight's library for userful pulse measurement related information

Application Note 2007-12-27

PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)

Application Note 2007-11-28

Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note

Application Note 2007-10-09

Measuring Group Delay of Frequency Converters with Embedded LO

Application Note 2007-09-26

Differences in Application Between Power Dividers and Power Splitters
This application note presents the characteristics of power splitters and power dividers and gives an overview of the different applications they are used in.

Application Note 2007-08-24

Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Replace 8508A Vector Voltmeter with ENA-L RF Network Analyzers
This application note shows examples of how the ENA-L RF network analyzers with their VVM emulation VBA programs can replace the 8508A vector voltmeter.

Application Note 2007-06-05

Backplane Differential Channel Microprobe Characterization in time and Frequency Domains

Application Note 2007-05-09

PDF PDF 769 KB
Accurate Mixer Measurements with ENA Frequency-Offset Mode (AN 1463-6)
Recommended measurement procedures for evaluating mixers.

Application Note 2007-05-07

Advanced Measurement Techniques for RF Amplifiers Using Unique Functions of the Keysight E5071C ENA
This application note will briefly review the basic measurement fundamentals of characterizing amplifiers with network analyzers.

Application Note 2007-04-27

How Operating Life and Repeatability of Keysight’s EM Switches Minimize System Uncertainty
This application note discusses the effects of operating life and repeatability on coaxial electromechanical switches.

Application Note 2007-04-09

Power Handling Capability of Electromechanical Switches
This application note discusses the power handling of the hot switching and cold switching of EM switches.

Application Note 2007-03-05

Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Impedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM)
This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture.

Application Note 2006-11-29

Previous 1 2 3 4 5 6 7 8 9 10 ... Next