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모델번호로 검색: 예제: 34401A, E4440A

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Accuracy Verification of E5071C-TDR Using a NIST Traceable Standard
This application note verifies the measurement accuracy of the E5071C-TDR by comparing the measurement result of the E5071C-TDR with the simulation results based on the NIST traceable data.

어플리케이션 노트 2010-04-21

PDF PDF 1.70 MB
Solutions for Characterizing Complex and Multi-Stage Circuits
This app note combines X-parameters with load-pull measurements to characterize load-dependent device behavior included in a large signal model for analysis of complex PA circuits.

어플리케이션 노트 2010-04-07

Comparison of Measurement Performance Between VNA and TDR Oscilloscope
This white paper provides a comparison of measurement performance between a vector network analyzer and TDR oscilloscope.

어플리케이션 노트 2010-03-26

Improved Throughput in Network Analyzer Applications (AN 1287-5)
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

어플리케이션 노트 2010-03-15

Solutions for Characterizing High-Power Devices—Using X-parameters to Make Nonlinear Measurements of
This “Solutions for…” app note discusses X-parameters used to properly characterize and understand the behavior of high power amplifiers, as engineers push them to their limit, into nonlinear operation.

어플리케이션 노트 2010-03-04

PDF PDF 2.68 MB
Correlation Between 86100C and E5071C-TDR
This application note describes the correlation between the 86100C TDR oscilloscope and the E5071C ENA network analyzer option TDR.

어플리케이션 노트 2010-01-28

High Power Amplifier Measurements Using Keysight's Nonlinear Vector Network Analyzers AN 1408-19
This application note discusses the unique challenges involved in testing high-power devices using Keysight's N5242A nonlinear vector network analyzer(NVNA).

어플리케이션 노트 2010-01-26

Understanding X-parameter Nonlinear Measurements
This “Solutions for Securing Successful First-Pass Component Design“ application brief discusses the basics of X-Parameters and non-linear measurements using the PNA-X and ADS software.

어플리케이션 노트 2010-01-06

PNA - Banded Millimeter-Wave Measurements (AN 1408-15)
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

어플리케이션 노트 2009-11-24

High frequency probing solutions for time and frequency domain
This application note discusses high-frequency probing using U1818A/B active differential probes with a network, spectrum, and signal source analyzer.

어플리케이션 노트 2009-09-23

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1)
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

어플리케이션 노트 2009-09-07

Using MATLAB to Create Keysight Signal and Spectrum Analyzer Applications - Application Note
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.

어플리케이션 노트 2009-09-03

PDF PDF 1.11 MB
Solutions for Characterizing and Designing Linear Active Devices
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.

어플리케이션 노트 2009-08-21

Extending the Range of Keysight InfiniiMax Probes
This application note describes how to extend the operating range of Keysight InfiniiMax probes in voltage, temperature, and distance (reach between probe amplifiers and heads

어플리케이션 노트 2009-06-26

Extension of X-parameters to Include Long-Term Dynamic Memory Effects
IEEE MTT-S International Microwave Symposium Digest, Boston

어플리케이션 노트 2009-06-05

Solutions for Active Device Test
This application note, Using Modern VNAs to Automate Traditional Multi-instrument RF Test Systems, shows how test system designers can design simpler test systems with the lowest overall cost of ownership.

어플리케이션 노트 2009-05-05

Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed
This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions.

어플리케이션 노트 2009-02-03

PDF PDF 1.33 MB
20GHz E5071C ENA 네트워크 분석기로 UWB 안테나 측정
This application note describes benefits of measuring UWB antennas with the E5071C 20 GHz option and introduces measurement tips for using the gating feature with the E5071C.

어플리케이션 노트 2008-11-10

ENA 네트워크 분석기를 위한 포괄적 멀티포트 솔루션
이 어플리케이션 노트에서는 E5092A 구성 가능 멀티포트 테스트 세트를 포함한 E5071C ENA 네트워크 분석기와 같은 포괄적 멀티포트 솔루션을 사용할 때의 장점에 대해 설명합니다.

어플리케이션 노트 2008-10-29

Measurement Wizard Assistant software for ENA
This application note explains how using MWA software on the ENA simplifies measurements and reduces the setup time of complicated measurements. It provides you with a step-by-step guide to the MWA and useful measurement tips for using the ENA and E5092A configurable multiport test set.

어플리케이션 노트 2008-09-30

A Design of Experiments for Gigabit Serial Backplane Channels

어플리케이션 노트 2008-09-03

PDF PDF 2.44 MB
Oscilloscope probing for high-speed signals
The probe is the dominant factor in determining the noise floor and response of your measurement system. Probe loading effects on the circuit under test are also a critical consideration.

어플리케이션 노트 2008-09-03

Total Analysis Environment for Modeling
Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

어플리케이션 노트 2008-08-21

High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.

어플리케이션 노트 2008-08-21

Data Mining 12-Port S-Parameters

어플리케이션 노트 2008-08-11

PDF PDF 830 KB

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