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Time Domain Analysis With a Network Analyzer Application Note (AN 1287-12)
This document focuses on time domain analysis (displays) generated from vector network analyzers (VNA). The intent is to provide engineers with frequency domain background, an in-depth view of how a time domain display is created from frequency domain data (S-parameters) and how to apply the time domain display to common problems in RF systems.

어플리케이션 노트 2012-05-02

E5072A ENA Series Network Analyzer for Basic Amplifier Measurements Application Note
The application note describes how to make accurate measurements of amplifiers such as gain compression, harmonic distortion or pulsed-RF by useful features of the E5072A ENA series network analyzer.

어플리케이션 노트 2012-03-22

Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

어플리케이션 노트 2012-03-05

Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

어플리케이션 노트 2012-02-08

6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

어플리케이션 노트 2012-02-02

PDF PDF 1.59 MB
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

어플리케이션 노트 2012-01-12

High-Power Measurement Using The E5072A Network Analyzer Application Note
This application note describes how to make high-power measurements with unique functions of the E5072A network analyzer.

어플리케이션 노트 2011-12-23

Design Tutorial: E5061B ENA Custom Multiport Switch Solution Using L4491A
This application note describes how to configure a 12-port custom switch box with the L4491A switch platform and operation basics using the E5061B network analyzer.

어플리케이션 노트 2011-11-29

PDF PDF 1016 KB
How Offset, Dynamic Range and Compression Affect Measurements - Application Note
This application note will clearly present how signal offset and oscilloscope/probe offset interact with regards to the dynamic range of the probe amps.

어플리케이션 노트 2011-11-02

PDF PDF 1.97 MB
Optimizing Dynamic Range for Distortion Measurements
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

어플리케이션 노트 2011-10-27

PDF PDF
Load Pull + NVNA = Enhanced X-Parameters for PA Designs
With high mismatch and technology-independent large-signal device models.

어플리케이션 노트 2011-09-08

Evaluating X-parameter Models for Active Device Nonlinear Behavior (AN 1408-22)
This AN examines three different modeling techniques that can be used to capture nonlinear behavior in a PA: the more conventional S2D and P2D, and the more recently commercialize X-parameter model.

어플리케이션 노트 2011-08-29

PDF PDF 625 KB
Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.

어플리케이션 노트 2011-07-08

PDF PDF 1.77 MB
Application of Keysight's PNA-X NVNA and X-Parameters in Power Amplifier Design
This 16-page article appeared in Microwave Journal's May 2011 issue; teaches you how to obtain actual linear and nonlinear component behavior to improve power amplifier design using Keysight's solutions.

어플리케이션 노트 2011-05-01

Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11)
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

어플리케이션 노트 2011-03-28

E5071C-TDR Method of Implementation (MOI) for High Speed Digital Applications

어플리케이션 노트 2011-03-24

Keysight Method of Implementation (MOI) for SATA SI Compliance Test
Keysight Method of Implementation (MOI) for SATA SI Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

어플리케이션 노트 2011-01-12

PDF PDF 1.41 MB
Keysight Method of Implementation (MOI) for SATA RXTX Impedance Compliance Test
Keysight Method of Implementation (MOI) for SATA RXTX Impedance Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

어플리케이션 노트 2011-01-12

PDF PDF 1.19 MB
Reducing Measurement Times in Antenna and RCS Applications
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.

어플리케이션 노트 2010-12-20

PDF PDF 3.15 MB
Understanding RF/Microwave Solid State Switches and their Applications
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.

어플리케이션 노트 2010-05-21

PDF PDF 1.07 MB
Solutions for Memory Effects in Microwave Components
This "Solutions for Memory Effects in Microwave Components" app note explains how to use X-Parameters to characterize and model long-term memory effects of wideband modulated signals.

어플리케이션 노트 2010-05-13

A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
Model memory effects of microwave amplifiers in the case of wideband modulated signals.

어플리케이션 노트 2010-05-05

PDF PDF 616 Bytes
Accuracy Verification of E5071C-TDR Using a NIST Traceable Standard
This application note verifies the measurement accuracy of the E5071C-TDR by comparing the measurement result of the E5071C-TDR with the simulation results based on the NIST traceable data.

어플리케이션 노트 2010-04-21

PDF PDF 1.70 MB
Solutions for Characterizing Complex and Multi-Stage Circuits
This app note combines X-parameters with load-pull measurements to characterize load-dependent device behavior included in a large signal model for analysis of complex PA circuits.

어플리케이션 노트 2010-04-07

Comparison of Measurement Performance Between VNA and TDR Oscilloscope
This white paper provides a comparison of measurement performance between a vector network analyzer and TDR oscilloscope.

어플리케이션 노트 2010-03-26

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