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Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2014-12-05

Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2014-12-05

PDF PDF 607 KB
Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA
This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer.

Application Note 2014-12-05

PDF PDF 690 KB
Two-port Measurements and S-Parameters - Application Note
Two-port Measurements and S-Parameters, University Engineering Lab Series - Lab 5

Application Note 2014-11-21

PDF PDF 576 KB
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2014-11-19

Materials Measurement: Soil Materials - Application Brief
Soil materials such as rocks or clay also have electrical properties in addition to the mechanical properties as with other substances.

Application Note 2014-11-05

PDF PDF 925 KB
Method of Implementation (MOI) for HEAC Cable Assembly Test
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2014-10-20

PDF PDF 1.93 MB
Impedance Matching in the Laboratory - Application Note
Impedance Matching in the Laboratory University Engineering Lab Series - Lab 4

Application Note 2014-10-17

PDF PDF 501 KB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2014-10-11

PDF PDF 731 KB
Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-10-10

PDF PDF 1.07 MB
Transmission Lines and Reflected Signals - Application Note
Transmission Lines and Reflected Signals University Engineering Lab Series - Lab 3

Application Note 2014-10-09

PDF PDF 596 KB
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-09-24

PDF PDF 2.34 MB
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test Using ENA Option TDR

Application Note 2014-08-28

PDF PDF 1.99 MB
Materials Measurement: PCB Materials - Application Brief
This application brief provides the solutions for measuring PCB materials.

Application Note 2014-08-27

Spectrum Analysis and the Frequency Domain - Application Note
Spectrum Analysis and the Frequency Domain University Engineering Lab Series - Lab 2

Application Note 2014-08-04

PDF PDF 280 KB
Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note
Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracy.

Application Note 2014-08-03

Ultra-Low Impedance Measurements using 2-Port Measurements
This application note explains using 2-port VNA techniques can completely eliminate the artifacts associated with contact impedance of the probes or fixturing to the DUT.

Application Note 2014-07-31

PDF PDF 4.68 MB
8 Hints for Making Better Measurements Using Analog RF Signal Generators - Application Note
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

Application Note 2014-07-31

Materials Measurement: Phantoms - Application Brief
This application brief provides the solutions for measuring Phantom materials that are used in wireless and medical industries.

Application Note 2014-07-17

PDF PDF 824 KB
Introduction to the FieldFox RF Analyzer - Application Note
Introduction to the FieldFox RF Analyzer University Engineering Lab Series - Lab 1

Application Note 2014-06-13

PDF PDF 205 KB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB
Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.

Application Note 2014-03-26

Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
Techniques for Precise Power Measurements in the Field - Application Note
This application note will discuss techniques for measuring average and peak power and the associated equipment options available for field testing.

Application Note 2014-03-18

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