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Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

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N5411B SATA 6Gb/s Compliance Test Software - Data Sheet
The N5411B SATA 6Gb/s compliance test software for Infiniium oscilloscopes provides you with a fast and easy way to validate and debug your SATA design

Data Sheet 2014-08-04

N5416A and N5417A USB Compliance Test Software for Infiniium Oscilloscopes - Data Sheet
N5416A provides a fast and reliable way to verify USB electrical specification compliance for USB 2.0 devices, hosts, and hubs.

Data Sheet 2014-08-03

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Application Note 2014-08-02

U7243A USB 3.0 Superspeed Electrical Performance Validation - Data Sheet
The USB 3.0 electrical test software allows you to automatically execute USB 3.0 electrical tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test

Data Sheet 2014-08-01

J-BERT N4903B High-Performance Serial BERT - Data Sheet
Updated J-BERT N4903B data sheet revision 1.3. Especially PCIe3 related enhancements covered by our PR in Jan 2013. Also covers all enhancements since SW releases 6.80 to 7.40

Data Sheet 2014-06-12

Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-04-21

Oscilloscope Probe Switching - BitifEye
Oscilloscope Probe Switching Solution from BitifEye and Keysight.

Soluzioni 2014-04-09

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-08-03

Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2013-05-31

N5393A PCI Express® 3.0 (Gen3) Software for Infiniium Oscilloscopes - Data Sheet
Keysight Technologies N5393C PCI Express electrical performance validation and compliance software provides you with a fast and easy way to verify and debug your PCI Express designs for add-in cards and motherboard systems. The PCI Express electrical test software allows you to automatically execute PCI Express electrical checklist tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test.

Data Sheet 2013-05-07

MIPI D-PHY Multilane Protocol Triggering and Decode - Data Sheet
Extend your scope capability with Keysight's MIPI triggering and decode application. This application makes it easy to debug and test designs that include MIPI buses using your Infiniium 9000 and 90000 Series oscilloscope.

Data Sheet 2013-05-01

N5399C HDMI Electrical Performance Validation and Compliance Software - Data Sheet
Keysight's N5399C HDMI electrical performance validation and compliance software gives you a fast and easy way to verify and debug your High Definition Multi-media Interface (HDMI) designs.

Data Sheet 2013-02-12

DDR Memory Design and Test Overview
Brief overview of Keysight solutions for DDR design and test.

Brochure 2012-12-19

DDR Memory Design and Test – A Better Way
Keysight offers the complete solutions for all areas of DDR design, meeting your needs for electrical physical layer, protocol layer, and functional test.

Brochure 2012-12-19

N5412B Serial Attached SCSI (SAS) Compliance Test Software - Data Sheet
The N5412B SAS compliance test application provides a fast and easy way to test, debug and characterize your serial attached SCSI designs.

Data Sheet 2012-12-18

Test Solutions for Greater Insight into Wireless Connectivity
This WiCON brochure focuses on test solutions for WiMAXT, RFID, NFC, WLAN, Bluetooth®, UWB, ZigBee technologies.

Brochure 2012-08-20

Overcoming LTE-Advanced Test Challenges - Inter-Band Carrier Aggregation
This video will explain one of the major test challenges of demodulating the multiple component carriers simultaneously since the frequency band separation in inter-band aggregation is wider than the IF BW of any commercially available signal analyzer. Watch how Keysight addresses this test challenge with the 89600 VSA software along with dual X-Series signal analyzers or N7109A multi-channel signal analyzer.

How-To Video 2012-07-15

Deep Memory and Raw Data Views Give Unprecedented Insight into Demanding CSI-2/DSI Designs

Press Materials 2012-06-12

Crossing the Digital-Analog Divide - White Paper
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.

Application Note 2012-05-02

Agilent Technologies Introduces 6-GHz Signal Generators with Industry-Best Performance
Today's aerospace/defense environment requires enhanced radar performance to detect weak signals at long distances. To provide the pure and precise signals needed to test these designs, the MXG uses an innovative triple-loop synthesizer to deliver phase noise performance of -146 dBc/Hz at 1 GHz and 20 kHz offset. For developers of radar components such as mixers and analog-to-digital converters, the MXG also features industry-leading spurious performance of -96 dBc at 1 GHz.

Press Materials 2012-05-01

N4880A Reference Clock Multiplier Data Sheet
This data sheet details how this reference clock multiplier can characterize receivers, lock the stressed pattern generator to the reference clock, and use multiple clock rates.

Data Sheet 2012-04-16

Oscilloscope Considerations for Multilane MIPI M-PHY Transmitter Validation
To help improve your electrical validation, there are a few considerations in choosing the oscilloscope to validate your multilane M-PHY designs.

Application Note 2012-04-09

LTE Digital and Analog Vector Modulation Debug
Watch this video to learn how to debug and validate the vector signal path in an LTE radio. A common analysis environment allows for both digital and analog/RF teams to evaluate the quality of key LTE signals. Both digital and analog signals are processed by the 89600 Vector Signal Analyzer (VSA) software where the constellation diagram, spectral content, and error vector magnitude can be observed and compared to SystemVue simulation results.

Demo 2012-03-27

MIMO OTA Two-Stage Method Using PXT and PXB
This video is a demonstration of testing the MIMO OTA performance of an LTE device using the two-stage method with Keysight Technologies' N5106A PXB and E6621A PXT. This method is efficient and cost-effective and can be used for multiple stages of test including design verification testing of antennas or devices on a lab bench. 3GPP and CTIA are currently evaluating this method to be added to LTE conformance testing.

Demo 2012-03-05

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