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모델번호로 검색: 예제: 34401A, E4440A

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Modular for Wireless
View these videos to learn more about for evolving Wireless test challenges; Keysight is ready to help by sharing its expertise in measurements, PXI modular instrumentation and test automation.

기본 데모 2013-11-22

Agilent Technologies Introduces 6-GHz Signal Generators with Industry-Best Performance
Today's aerospace/defense environment requires enhanced radar performance to detect weak signals at long distances. To provide the pure and precise signals needed to test these designs, the MXG uses an innovative triple-loop synthesizer to deliver phase noise performance of -146 dBc/Hz at 1 GHz and 20 kHz offset. For developers of radar components such as mixers and analog-to-digital converters, the MXG also features industry-leading spurious performance of -96 dBc at 1 GHz.

보도자료 2012-05-01

Anticipate Multi-Standard Radio (MSR) Performance with Keysight SystemVue
As mobility carriers embrace 4G LTE technology, new equipment must co-exist with older 2G/3G standards. Multi-Standard Radio (MSR) testing characterizes these interactions, and is supported by a variety of Keysight test products. Keysight SystemVue, a system-level modeling environment for communications physical layer, enables R&D engineers to anticipate these interactions, achieve more robust system designs, then connect to Test to validate simulated performance using real hardware.

기본 데모 2012-02-18

Order your complimentary 2012/13 RF & Microwave Test Accessories Catalog
This comprehensive resource enables engineers to quickly and conveniently research the highest-quality RF and microwave test accessories in the industry.

카탈로그 2011-09-20

3GPP Long Term Evolution: System Overview, Product Development and Test Challenges -Application Note
This application note focuses on LTE and includes content on system overview, product development and test challenges of this new wireless communications technology.

어플리케이션 노트 2009-09-08

IFT Battery Current Drain Solution - Application Note
Provides an overview of the Interactive Functional Test (IFT) battery current drain analysis solution using the 8960 (E5515C) and the 66319/21B or D.

어플리케이션 노트 2008-09-30

Testing HSUPA devices
By: Jeanne Fightmaster, Agilent Technologies Published with permissions of EETimes Asia

기사 2007-11-16

PDF PDF 404 KB
Battery Drain Analysis Improves Mobile-Device Operating Time - Application Note
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

어플리케이션 노트 2007-02-01

Evaluating Battery Run-down Performance of the 66319D and the 14565B (AN 1427)
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

어플리케이션 노트 2007-01-31

전류 드레인 분석으로 WLAN 네트워크 카드 설계 및 테스트 향상 (AN 1468)
This application note explains how to simplify the complex task of accurately measuring and evaluating the current drain of a WLAN network card for its various operating modes.

어플리케이션 노트 2006-12-14

Converting 8924C software for the E8285A
This Product Note assumes you are converting software originally written for the Keysight 8924C, for use with the Keysight E8285A. Ideas are also included for modifying your software to function interchangeably with both the 8924C and the E8285A. This Note is meant to supplement the information...

어플리케이션 노트 2000-07-01