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Sheet Resistance/Resistivity Measurement Using a Source/Measurement Unit (SMU) - Application Note
This application note provides the technical information for the sheet resistance measurement using the precision current-voltage analyzer series.

Application Note 2016-01-14

PDF PDF 1.62 MB
LED IV Measurements Using the Keysight B2900A Series of SMUs - Application Note
This application note describes the use of LED IV measurements using the B2900 Series Precision source/measure unit.

Application Note 2016-01-04

Bipolar Transistor Characterization Using the B2900A Series of SMUs - Application Note
This application note describes the characterization of Bipolar transistors using the B2900a precision source/measure units.

Application Note 2015-12-17

Quick DC and Transient Evaluation of Switching Mode DC-DC Converter - Application Brief
This 3-page application brief introduces the example to make DC and Transient Evaluation of Switching Mode DC-DC Converter effectively using the Agilent B2900A Series of Precision Source/Measure Units.

Application Note 2015-12-17

PDF PDF 1.28 MB
Low-Dropout (LDO) Linear Regulator Evaluation - Product Fact Sheet
This 2-pager describes "Quick Bench-top Evaluation" of an LDO linear regulator and shows real measurement results made by B2900A series.

Application Note 2015-12-17

PDF PDF 970 KB
Resistance Measurements Using the B2900A Series of SMUs - Application Note
This application note describes the use of the B2900 series of precision source/measure units for resistance measurements.

Application Note 2015-12-16

FET Characterization Using the B2900A Series of SMUs - Application Note
The Keysight B2900A Series Precision SMU allows you to evaluate IV characteristics of FET accurately and quickly with its intuitive GUI and free PC-based application software.

Application Note 2015-12-15

IV Characterizations of Solar Cells Using the B2900A Series of SMUs - Application Note
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Application Note 2015-12-14

Demystifying the Impact of ADCs and DACs on Test Instrument Specifications - Application Note
This application note describes the differences between ADC and DAC converter specifications and the specifications of the instruments, and the affect of ADC and DAC characters on instrument specs.

Application Note 2015-12-10

PDF PDF 1.15 MB
PA2200 Open Source License Information
The files below describe the Open Source software used in the PA2201/03A Power Analyzer.

Application Note 2015-12-09

Impedance Analyzers and Network Analyzers - Application Note
This application note describes the benefits of using USB and LAN interfaces compared to GPIB. The target instruments are bench-top network analyzers, impedance analyzers and LCR meters.

Application Note 2015-12-08

Ready-To-Use Sample VBA Programs for the B2980A Enable You to Start Measurement Quickly
This application brief introduces a variety of free sample VBA programs for the B2980A Series Femto/Picoammeter & Electrometer.

Application Note 2015-12-08

PDF PDF 574 KB
LIV Test of Laser Diode Using the B2900A Series of SMUs-Application Note
This application introduces features of B2900A Series as the best solution for LIV test of laser diode.

Application Note 2015-12-03

Diode Evaluation Using the B2900A Series of SMUs - Application Note
This application note shows how the Keysight B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes.

Application Note 2015-12-02

Optoelectronic IC/Component Evaluation - Application Brief
This 2-page application brief describes "Quick Bench-top Evaluation" of an optoelectronic component (optocoupler) and shows real measurement results made by B2900A series.

Application Note 2015-11-24

Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-11-24

PDF PDF 3.57 MB
Wide Range of Resistance Measurement Solutions from μΩ to PΩ - Application Brief
This application brief summarizes Keysight's resistance measurement solution. The detailed information can be seen 5992-1212EN application note.

Application Note 2015-11-18

Wide Range of Resistance Measurement Solutions from µΩ to PΩ - Application Note
This application note introduces keysight's resistance measurement solution, and discuss major error factors in resistance measurements and how to eliminate those error factors.

Application Note 2015-11-17

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2015-11-14

Precision Device Characterization Solution Using the B2900A Series - Application Brief
This 2-page application brief introduces the precision device characterization solution using the B2900A precision source/measure unit.

Application Note 2015-11-11

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 1) - Application Note
This application note is Part 1 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power transfer state (non-beacons).

Application Note 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 3) - Application Note
Power and Efficiency Measurements. This application note is Part 3 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing power and efficiency measurements.

Application Note 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 2) - Application Note
This application note is Part 2 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power save state (beacons), including beacon.

Application Note 2015-11-06

Verifying the Operation of Temperature-Controlled Ovens - Application Note
This application note describes how handheld measurement tools are used to maintain several key equipment and processes in an electronics factory.

Application Note 2015-11-03

PDF PDF 1.88 MB
Maintenance of Electronic Factory Equipment and Process Line - Application Note
Handheld test tools that enable troubleshooting and repair personnel to respond quickly and effectively

Application Note 2015-11-01

PDF PDF 4.13 MB

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