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Oscilloscopes in Aerospace/Defense Debugging MIL-STD 1553 serial buses - Brochure
Keysight's InfiniiVision 3000 X-Series oscilloscopes provide MIL-STD 1553 triggering and decoding, as well as eye-diagram mask test capability to help you debug your MIL-STD 1553 buses faster.

Application Note 2015-03-23

Solid State Switches - Application Note
This application note describes basic switch technology and the different types of Keysight switches. It summarizes the typical performance data of solid-state versus electro-mechanical switches – the two mainstream switch technologies in use today. A basic solid state switch overview which illustrates the theory of operation will give you the in-depth information you need to select the right switch technology for your application.

Application Note 2015-03-17

Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn about CAN-dbc symbolic triggering and how to improve debug of your automotive designs using an oscilloscope.

Application Note 2015-03-13

N1420A Setup Integrity Checker Function Maximizes Sensitive Measurement Confidence
This application brief introduces the features and benefit of the N1420A System Integrity checker function.

Application Note 2015-03-12

PDF PDF 568 KB
Top Five Reasons Why U2040 X-Series Power Sensors Are Ideal For Wireless Chipset Manufacturing Tests
This application brief details the top five reasons why the U2040 X-Series wide dynamic range power sensors are the ideal solution for wireless chipset manufacturing tests

Application Note 2015-03-10

PDF PDF 215 KB
Low Frequency RFID Tag Characterization - Application Note
This application note introduces how to measure the resonance frequency of an RFID tag with the Keysight N9322C basic spectrum analyzer (BSA) easily.

Application Note 2015-03-10

Keysight Method of Implementation (MOI) for DisplayPort 1.3 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for DisplayPort 1.3 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-27

PDF PDF 1.62 MB
Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Application Note 2015-02-23

N1414A High Resistance Measurement Universal Adapter Simplifies High Resistance Measurement Cabling
This application brief introduces the benefit of the N1414A High resistance measurement universal adapter to be used with the B2985A/87A Electrometers/High resistance meters.

Application Note 2015-02-23

PDF PDF 683 KB
Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2015-02-13

Deploying the Ideal Test Solution for Handset Filters and Duplexers - Application Brief
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for handset filters and duplexers manufacturing test.

Application Note 2015-02-13

Improving Speed and Accuracy in the Testing of BTS Filters and Duplexers - Application Brief
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for BTS filters and duplexers manufacturing test.

Application Note 2015-02-11

Keysight Method of Implementation (MOI) for USB3.1 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB3.1 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.90 MB
Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.85 MB
Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.96 MB
Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.66 MB
CAN FD Eye-Diagram Mask Testing - Application Note
Eye-diagram mask testing is used in a broad range of today’s serial bus applications. Learn more about eye-diagram testing for higher speed buses such as the new CAN FD serial bus.

Application Note 2015-02-05

The Touch Screen Revolution in Test and Measurement - Application Note
Touch screens have revolutionized the consumer electronics market, and are working their way into the test and measurement environment.

Application Note 2015-02-05

EMC Compliance Testing: Improve Throughput with Time Domain Scanning - Application Note
This application note provides an overview of time domain scan, the test scenarios in which it provides the greatest time savings, and trade-offs between speed and overload protection.

Application Note 2015-02-01

Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2015-01-30

Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

Application Note 2015-01-28

PDF PDF 4.10 MB
Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Application Note 2015-01-23

PDF PDF 861 KB
How to Perform QSCV (Quasi-Static Capacitance Voltage) Measurement - Application Note
This application note explains how to perform QSCV (quasi-static capacitance voltage) measurement using Keysight B1500A semiconductor device analyzer.

Application Note 2015-01-23

PDF PDF 829 KB
Switch Mode Power Supply Measurements - Application Note
Oscilloscope power measurement options provide a quick and easy way to analyze the reliability and efficiency of switching power supplies.

Application Note 2015-01-23

Addressing the Challenges of High-Speed Digital I/O for Aerospace Defense – Application Note
This application note will also discuss test challenges and commercial test solutions for fiber digital I/O technologies to help mitigate risk in upgrading to fiber-based technologies.

Application Note 2015-01-21

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