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When is it Time to Transition to a Higher Bandwidth Oscilloscope? - Application Note
How do we determine how much bandwidth is required for today’s projects, and when do we know when it is time to “move up”?

Application Note 2014-12-17

PDF PDF 1.62 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-12-16

Oscilloscope Display Quality Impacts Ability to View Subtle Signal Details - Application Note
The quality of your oscilloscope’s display can make a big difference in your ability to troubleshoot your designs effectively.

Application Note 2014-12-16

Power Flow and Directional Couplers - Application Note
Teaching Lab #6: Power Flow and Directional Couplers University Engineering Lab Series – Lab 6

Application Note 2014-12-09

Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2014-12-05

Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2014-12-05

PDF PDF 607 KB
Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA
This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer.

Application Note 2014-12-05

PDF PDF 690 KB
How to Select Your Next Oscilloscope: 12 Tips on What to Consider Before you Buy - Application Note
You rely on your oscilloscope every day, so selecting the right one to meet your specific measurement needs and budget is an important task.

Application Note 2014-11-26

Two-port Measurements and S-Parameters - Application Note
Teaching Lab # 5: Two-port Measurements and S-Parameters, University Engineering Lab Series - Lab 5

Application Note 2014-11-21

Triggering on Infrequent Anomalies and Complex Signals using InfiniiScan Zone - Application Note
Learn how Keysight's exclusive InfiniiScan Zone touch trigger helps you trigger on infrequent anomalies and complex signals with ease.

Application Note 2014-11-21

Speed Time to Market with Consistent Measurements from R&D Through Manufacturing - Application Note
This white paper describes the benefits of having a choice of bench top or modular instruments that are supported by common software applications.

Application Note 2014-11-17

Materials Measurement: Soil Materials - Application Brief
Soil materials such as rocks or clay also have electrical properties in addition to the mechanical properties as with other substances.

Application Note 2014-11-05

PDF PDF 925 KB
Using Oscilloscope Time-Gated FFTs for Time Correlated Mixed Domain Analysis - Application Note
When debugging in both the time and frequency domain, time correlation between these signals is important and challenging. See how time-gated FFT’s provide insight into time and frequency signals.

Application Note 2014-11-03

Method of Implementation (MOI) for HEAC Cable Assembly Test
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2014-10-20

PDF PDF 1.93 MB
Impedance Matching in the Laboratory - Application Note
Teaching Lab #4:Impedance Matching in the Laboratory University Engineering Lab Series - Lab 4

Application Note 2014-10-17

Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2014-10-11

PDF PDF 731 KB
Precise Evaluation of Input,Output, and Reverse Transfer Capacitances of Power Devices - White Paper
Accurate characterization of power device capacitance parameter becomes important for power circuit design. This paper introduces a solution to characterize Ciss, Coss, Crss and Rg automatically.

Application Note 2014-10-10

PDF PDF 2.49 MB
Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-10-10

PDF PDF 1.07 MB
Transmission Lines and Reflected Signals - Application Note
Teaching Lab #3:Transmission Lines and Reflected Signals University Engineering Lab Series - Lab 3

Application Note 2014-10-09

Using Wider, Deeper Views to Characterize Complex Systems and Environments - Application Note
This application note provides an overview of signal-identification techniques for monitoring electronic warfare (EW) scenarios and outlines several analysis options that support typical requirements in dynamic range and bandwidth.

Application Note 2014-10-02

Measuring High Impedance Sources Using the U8903B Audio Analyzer - Application Note
Considerations for measuring high impedance sources. A method of using an impedance matching attenuator to overcome high impedance measurement problems is described. Methods for aligning matching attenuator and compensating for its loss are shown alongside the ease with which frequency response measurements can be made.

Application Note 2014-09-30

PDF PDF 937 KB
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-09-24

PDF PDF 2.34 MB
Achieving Fast and Accurate Multi-Channel Power Measurements Over a Wide Dynamic Range for Wireless
This application note explains how to obtain a wide power measurement range on the lower power level. This is important for chipsets designed to handle a wider power range to support higher data throughput and wider coverage area

Application Note 2014-09-09

Making Fast Pass/Fail Testing with Keysight N9320B Spectrum Analyzer - Application Note
This application note describes the advanced window limit feature in the N9320B spectrum analyzer and demonstrates how to use it to easily make the Pass/Fail determination on measurement results.

Application Note 2014-09-08

Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test Using ENA Option TDR

Application Note 2014-08-28

PDF PDF 1.99 MB

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