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High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2013-05-31

Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

Application Note 2012-10-30

Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

Application Note 2012-02-08

Non-Contact Measurement Method for 13.56 MHz RFID Tags Using the ENA/ENA-L Network Analyzer
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2009-02-20

PDF PDF 199 KB
High-Precision TDR with the Keysight 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.

Application Note 2003-09-12

PDF PDF 288 KB
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4)
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

Application Note 2000-11-01

Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1)
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.

Application Note 2000-11-01