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Keysight System Uptime Support Product Guide
This data sheet describes the level of support provided under each support product number for Keysight's range of support products for in-circuit test, imaging inspection and functional test systems.

Data Sheet 2014-07-31

PDF PDF 858 KB
UCM3070 Boundary Scan Module for the Keysight Utility Card
This document describes the features of the UCM3070 boundary scan controller which is integrated into the Medalist i3070 in-circuit test system. It is based on Goepel Scanbooster architecture.

Technical Overview 2014-07-31

PDF PDF 523 KB
Maximize Your Keysight AXI Coverage with Flexible Pricing - Brochure
This flyer describes the different support options Keysight AXI users can select from to ensure peace of mind for covering the support needs of their 5DX and x6000 investments.

Brochure 2014-07-31

PDF PDF 141 KB
Intellectual property and copyright protection on Agilent ICT products
This letter advises areas of intellectual property and copyright protection to look out for when customers elect to purchase Agilent in-circuit test products from third party vendors.

Feature Story 2014-07-31

PDF PDF 155 KB
Electronic Manufacturing Test Cooperative Support Service for Self-Maintainers Keysight Support Sales

User Manual 2014-07-31

PDF PDF 185 KB
Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Keysight Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .

Application Note 2014-07-31

PDF PDF 8.81 MB
Comparing Boundary Scan Methods White Paper
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

Article 2014-07-31

PDF PDF 2.75 MB
Keysight Medalist i3070 In-Circuit Test System Onsite Calibration Service
This flyer explains why calibration is one of the critical factors that will help maintain the accuracy and repeatability of your Medalist i3070 ICT system.

Brochure 2014-07-31

PDF PDF 54 KB
Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Application Note 2014-05-14

Medalist i3070 Series 5i inline ICT system help
Keysight's Medalist i3070 Series 5i Inline In- Circuit Test (ICT) system is designed to bring all the industry- leading ICT technologies into a fully automated manufacturing line.

Help File 2014-05-02

PDF PDF 19.86 MB
Medalist i3070 Series 5i inline ICT system uncrating instructions
Medalist i3070 Series 5i inline ICT system uncrating procedure

Quick Start Guide 2014-05-02

PDF PDF 742 KB
Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Application Note 2014-03-26

Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

PDF PDF 435 KB
Keysight Medalist i3070 08.40p Software Release
Keysight Medalist i3070 08.40p software can be installed on testheads and test development stations with Windows 7 (32- bit and 64- bit) and Windows XP operating systems.

Release Notes 2014-02-17

Return-to-Keysight Agreement for i3070 In-Circuit Test Systems - Brochure
Return to Keysight is a repair service agreement for your Keysight i3070 and 3070 in-circuit test systems to ensure your system uptime is maximized.

Brochure 2014-01-15

PDF PDF 2.93 MB
Medalist i3070 Series 5i Inline ICT System Operator Guide
Medalist i3070 Series 5i Inline ICT System Operator Guide

Operation Manual 2013-12-20

PDF PDF 449 KB
Medalist i3070 Series 5i Inline System Installation Guide
Medalist i3070 Series 5i Inline ICT System System Installation

Installation Manual 2013-12-20

PDF PDF 4.69 MB
PCBA Test Award-winning Milestones

Feature Story 2013-10-09

The World’s Highest Pin Count In-Circuit Test Solutions – Solution Sources Programming
The World’s Highest Pin Count In-Circuit Test Solutions from Solution Sources and Keysight

Solution Brief 2013-09-18

Configuring Boundary Scan Chains on Keysight x1149 Boundary Scan Analyzer - Application Note
This application note provides the procedure for configuring the boundary scan chain of a board using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-30

PDF PDF 890 KB
Merging boards on Keysight x1149 Boundary Scan Analyzer – Application Note
This application note shows how to connect two or more boards to form a single boundary scan chain using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-26

PDF PDF 1.85 MB
Looking to sell or buy used or pre-owned 3070 in circuit testers? Talk to Keysight!
Looking to sell or buy used or pre-owned 3070 in circuit testers? Talk to Keysight!

Promotional Materials 2012-11-07

ICT System Support Delivery Options
Support delivery guidelines for Keysight In-circuit Test Systems.

Technical Overview 2012-10-16

PDF PDF 41 KB
Choose the right system calibration services for your Keysight i3070/3070 In-circuit Test System
Keysight offer a range of new calibration service with and without system calibration license to use for your Keysight i3070/3070 In-circuit Test System

Case Study 2012-09-28

Medalist i3070 Series 5 In-Circuit Test System
The Keysight Medalist i3070 Series 5 In-Circuit Test (ICT) provides more flexible in incorporating external circuits as well as allowing better control of external circuits.

Data Sheet 2012-09-25

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