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I2C and SPI Protocol Triggering and Decode for Infiniium 8000 and 90000 Series Oscilloscopes
Extend your scope capability with I2C and SPI Triggering and Decode application. This application makes it easy to debug and test designs that include I2C or SPI protocols using your Infiniium 90000 or 8000 Series scope.

Data Sheet 2012-03-11

N4906B Serial BERT Getting Started Guide
A guide to get started with the N4906B Serial BERT

Quick Start Guide 2012-03-01

PDF PDF 1.81 MB
Agilent Technologies Introduces Fully Integrated Optical Modulation Analyzer for Testing 40/100G
Agilent Technologies Introduces Industry's First Fully Integrated Optical Modulation Analyzer for Testing 40/100G,

Press Materials 2012-02-28

N4916B De-Emphasis Signal Converter User's Guide
Revision 3 (Released with N4916B Software 1.1.13.0).

User Manual 2012-02-01

PDF PDF 921 KB
Pulse Pattern and Function Arbitrary Generators and Arbitrary Waveform Generators - Brochure
This Keysight family of pulse/pattern generators can help you verify and characterize digital or analog systems, products, and components.

Brochure 2012-01-27

PDF PDF 1.48 MB
86142B Optical Spectrum Analyzer Technical Overview

Data Sheet 2012-01-13

PDF PDF 677 KB
N4373C 67 GHz Lightwave Component Analyzer Data Sheet
Find out the benefits of the N4373C, with a modulation bandwidth of 67Ghz, ideal for developing and characterizing electro-optical components for the upcoming 40G/10GbE.

Data Sheet 2012-01-04

PDF PDF 2.29 MB
Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters, Flex DCA Interface
Keysight continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals.

Application Note 2011-12-22

Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters - Application Note
Pressures to reduce costs as data rates rise means manufacturing engineering managers and their engineers must be more creative in how to reduce costs before their competitors do.

Application Note 2011-12-22

How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification - Application Brief
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

Application Note 2011-11-30

81960A Compact Tunable Laser Source Module Getting Started Guide

Quick Start Guide 2011-11-01

PDF PDF 436 KB
Lowest Cost of Optical Transceiver Test
Explore major cost of test reduction ideas using the Eye Mask Hit Ratio Technique and the Auto Mask Margin function. Achieve dramatic efficiency improvement in optical transmitter eye-mask testing.

Product Tour 2011-11-01

81960A Compact Tunable Laser Source Module User's Guide

User Manual 2011-11-01

PDF PDF 2.16 MB
De-embedding demo using InfiniiSim-DCA
This 7 minute video documents a de-embedding measurement using InfiniiSim-DCA for the 86100C DCA-J

How-To Video 2011-11-01

WMF WMF 38.44 MB
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
Keysight N77xx Series
The Keysight N77-Series optical switches are available for both singlemode and multimode fiber test applications. The excellent repeatability, compact format and flexible control interfacing support highperformance automated setups. The multimode switch has excellent mode fidelity.

User Manual 2011-10-01

PDF PDF 1.84 MB
Understanding The Oscilloscope Jitter Specification
Jitter is defined as the unwanted phase modulation of a digital signal, and is considered one of the most important specifications for measuring a device's quality.

Application Note 2011-09-30

Techniques for Higher Accuracy Optical Measurements - Application Note
Learn techniques for high accuracy optical measurements using System Impulse Response Correction

Application Note 2011-09-21

Agilent Introduces Tunable Laser Module and Measurement Engine for Fast Spectral Loss Test

Press Materials 2011-09-19

Advanced Techniques for PCIe 3.0 Receiver Testing-Paper - Application Note
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper

Application Note 2011-09-01

PDF PDF 2.20 MB
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Keysight 86100 Wide-Bandwidth Oscilloscope.

Technical Overview 2011-07-28

86100D - Parallel Testing of Optical Transceivers
This video will show that testing optical transceivers in parallel is an important approach to reducing the cost of test and can dramatically reduce the amount of equipment required to build a high volume productions line.

How-To Video 2011-07-26

N4915A-014 PCI Express 3.0® Calibration Channels - Data Sheet
The N4815A-014 PCI Express 3.0 calibration channels allow to generate receiver stress conditions according to PCIe 3.0 base specification rev 1.0 when used together with J-BERT N4903B and N4916B.

Data Sheet 2011-07-05

Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 - Application Note
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Application Note 2011-06-22

Optimizing Oscilloscope Measurement Accuracy on High-Performance Systems with Keysight Active Probes
This application note covers the following information that you should consider when selecting an oscilloscope probe to capture high-speed signals: Consider the effect that probe input impedance will have on your circuit. Capacitive loading becomes increasingly important at high frequencies and it is important to use the shortest possible ground lead to minimize inductance. The probe will introduce distortion into your measurements unless it has a flat transmitted response throughout the bandwidth of the probe. A flat transmitted response will closely track the signal at the probe tip and pass it to the oscilloscope with minimal degradation.

Application Note 2011-05-20

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