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Electronic Measurement

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N4391A Optical Modulation Analyzer Security Features and Volatility Documentation – Reference Guide
This document describes instrument security features and the steps to declassify an instrument through memory sanitization or removal.

Reference Guide 2014-04-01

N4392A Optical Modulation Analyzer Security Features and Volatility Documentation – Reference Guide
This document describes instrument security features and the steps to declassify an instrument through memory sanitization or removal.

Reference Guide 2014-04-01

Polarization Tutorial CD - Ordering Form
Polarization Tutorial CD - Ordering and Information Request Form.

Demo 2014-03-31

J-BERT M8020A showing UI, jitter injection & de-emphasis – Video
This video gives an overview about the J-BERT M8020A high-performance BERT, including a demo of the jitter injection and de-emphasis capabilities, the user interface and the analyzer functionality.

Demo 2014-03-20

N4960A Serial BERT 17 and 32 Gb/s - Data Sheet
The N4960A is the world's most affordable solution for characterizing 100GbE, 28G, and high speed SerDes applications.

Data Sheet 2014-02-05

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

DSO9064L Oscilloscopes - Data Sheet
The Keysight Infiniium DSO9064L oscilloscope provides measurements optimized for manufacturing applications.

Data Sheet 2014-01-22

Agilent Technologies Introduces HDMI 2.0 Compliance Test Software for Transmitters and Receivers
Agilent Technologies Inc. (NYSE: A) today introduced two compliance test software packages for physical-layer testing of devices that use the new High-Definition Multimedia Interface (HDMI) 2.0 specification.

Press Materials 2014-01-14

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Application Note 2013-11-18

Time-domain pulse shaping for increased spectral efficiency - Article
This article elaborates on the conditions needed to prevent the effects of ISI and on the use of different filtering techniques for the purpose of bandwidth and signalcontainment.

Article 2013-11-13

ECOC 2013 video interview with Stefan Loeffler
Review of the ECOC 2013 Exhibition in London

Article 2013-11-13

J-BERT N4903B High-Performance Serial BERT - User's Guide
The Serial BERT can help you test the performance of components and systems for high-speed digital transmission equipment. An important parameter of a digital system is the rate at which errors occur in the system. The analyzer will compare the bits sent to your device with the bits received from your device. It will record the number of bit errors and display results such as the bit error ratio (BER). In addition, accumulated results can be analyzed to help you determine what caused the bit errors.

User Manual 2013-11-01

N4903B J-BERT - Getting Started Guide
Revision 11 (Released with N4903B Software 7.50).

Quick Start Guide 2013-11-01

J-BERT N4903B High-Performance Serial BERT - Programming Guide
This document provides the information you need for programming the Serial BERT using the Keysight IO Libraries Suite. Familiarity with the Keysight IO Libraries Suite is instrumental in understanding remote programming of the Serial BERT. See the user documentation delivered with the Keysight IO Libraries Suite for information on how to use them.

Programming and Syntax Guide 2013-11-01

Eight Hints for Better Scope Probing - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2013-10-28

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

N4376D Lightwave Component Analyzer - User’s Guide
The user's manual covers: setting up the system, operation, applications, performance specifications, and warranty/product service.

User Manual 2013-08-01

Overcome PCB Loss and Deliver a Clean Eye Using Keysight's 32Gb/s Pattern Generator
This video demonstrates the value of a pattern generator with integrated 5-tap de-emphasis when dealing with cable, connector, PCB board material, and other losses. With de-emphasis, the frequency-dependent loss can be compensated for and the test equipment can deliver a clean open eye to the DUT

Demo 2013-07-18

Press Releases for M8061A
Press Releases for M8061A

Press Materials 2013-07-16

Overcome PCB Loss, Deliver a Clean Eye to Your DUT Using Multi-tap De-emphasis - Application Brief
This application brief describes how Keysight’s 32 Gb/s Pattern Generator with integrated 5-tap de-emphasis can overcome PCB and connector loss and deliver a clean eye to the DUT.

Application Note 2013-07-16

Press Releases for N4877A
Press Releases for N4877A

Press Materials 2013-07-16

Press Releases for N5990A
Press Releases for N5990A

Press Materials 2013-07-04

MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.5 - Application Note
Serial ATA Interoperability Program Revision 1.5 Keysight MOI for SATA RSG Tests

Application Note 2013-06-10

Double Pulse Generation for Particle Image Velocimetry (PIV) Measurements - Technical Overview
Keysight Technologies' Pulse/Pattern Generators are used for research in the aerospace and defense industry, among others.

Technical Overview 2013-05-06


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