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86122C Multi-Wavelength Meter Getting Started Guide
86122C Multi-Wavelength Meter Getting Started Guide

Quick Start Guide 2014-08-01

PDF PDF 1.61 MB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

N5392A Ethernet Electrical Performance Validation and Compliance Software - Data Sheet
The Keysight Technologies N5392A Ethernet electrical performance validation and compliance software for Infiniium 54830 and 54850 Series oscilloscopes provides you with a fast and easy way to verify and debug your 1000Base-T, 100Base-TX and 10Base-T Ethernet designs. The Ethernet electrical test software

Data Sheet 2014-08-01

Measuring the Dependence of Optical Amplifiers on Input Power Using an Attenuator
This application note describes the important optical amplifier properties of gain and noise figures and their dependence on the powers and wavelengths of the input signals.

Application Note 2014-07-31

PDF PDF 347 KB
PDL Measurements Using the Keysight 8169A Polarization Controller
This product note discusses the polarization dependent loss (PDL) measurement process; in particular using the 8169APolarization controller.

Application Note 2014-07-31

PDF PDF 726 KB
State of the Art Characterization of Optical Components for DWDM Applications
Fiber optic network technology is taking a big step forward with the tremendous transmission capacity offered by dense wavelength-division multiplexing (DWDM).

Application Note 2014-07-31

3.35 GHz Pulse/ Pattern Generators - Promotional Flyer
The 81133a/34a is the first choice when timing and performance are vital. It is designed to enable R&D and test engineers to carry out tests more effectively, by providing access to necessary parameters.

Promotional Materials 2014-07-31

PDF PDF 1.31 MB
Photonic Foundation Library Fast Sweep PDL - Application Note
This application note describes an approach to significantly reduce the measurement time associated with polarization dependent loss (PDL) measurements.

Application Note 2014-07-31

PDF PDF 680 KB
Measuring IL and PDL spectra with the fast-switching N7786B - Application Note
The advantages and details of a new method for swept-wavelength IL and PDL measurement is introduced, including configuration details for the necessary instruments and software.

Application Note 2014-07-31

PDF PDF 582 KB
81495A Reference Receiver - Data Sheet
This document describes the technical specifications and capabilities of Agilents 81495A Reference Receiver

Data Sheet 2014-07-31

PDF PDF 477 KB
Understanding and Using Offset in InfiniiMax Active Probes - Application Note
This application note explains how offset is applied in the Keysight InfiniiMax Active Probes and how to use offset for various applications

Application Note 2014-07-31

Photonic Foundation Library: Enhancing Swept Loss Measurements - Application Note
This application note describes the measurement functionality and the accuracy enhancements enabled by the know-how contained in the Photonic Foundation Library.

Application Note 2014-07-31

PDF PDF 3.90 MB
On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

Application Note 2014-07-31

Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Application Note 2014-07-31

Digital Modulation in Communications Systems - Application Note
This application note introduces the concepts of digital modulation used in many communications systems today.

Application Note 2014-07-31

PDF PDF 2.64 MB
81595B Modular Optical Switches - Data Sheet
Keysight 81591B / 4B / 5B Modular Optical Switches - Technical Specifications

Data Sheet 2014-07-31

PDF PDF 362 KB
Understanding Oscilloscope Frequency Response & Its Effect on Rise-Time Accuracy - Application Note
In this application note, we review the properties of both Gaussian and flat-response oscilloscopes, then discuss rise time accuracy for each response type. We show that flat-response oscilloscope, give more accurate rise-time measurement than a Gaussian-response oscilloscope of equal bandwidth, and we show you how to estimate the bandwidth you need. The application note will show you which type of frequency response offers the best measurement accuracy; there are two issues to consider, the maximum signal frequency, and the oscilloscope sampling alias errors. It will also determine how much bandwidth you need.

Application Note 2014-07-31

Measuring Polarization Dependent Loss of Passive Optical Components - Application Note
A new document on the methods of characterizing passive optical components.

Application Note 2014-07-31

PDF PDF 1.40 MB
Polarization-Resolved Measurements using Mueller Matrix Analysis - Application Note
Polarization-Resolved Measurements using Mueller Matrix Analysis - Application Note

Application Note 2014-07-31

PDF PDF 1 MB
Keysight L4610A PRM - 34B Radio Test Set - Brochure
Rugged, portable, radio test set provides true one-button operational testing of SINCGARS radios

Brochure 2014-07-31

PDF PDF 1.53 MB
Metrology of Optical Advanced Modulation Formats
The metrology basics of advanced optical modulation formats are presented.

Application Note 2014-07-31

PDF PDF 223 KB
15431A Filter Set for 81150A - Data Sheet
The Agilent 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers. To be used in conjunction with the N4903A.

Data Sheet 2014-07-31

PDF PDF 1.09 MB
Does your TLS have specifications pertinent to swept measurements? - Techincal Overview
This technical note describes the parameters given in the specifications of the TLS that are pertinent to dynamic conditions (that is, swept measurements).

Application Note 2014-07-31

PDF PDF 252 KB
USB Design and Test - A Better Way - Application Note
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2014-07-31

The next generation of optical modulation analysis
As the pressure rises for 100 Gbit/s, you increasingly need to measure the performance of complex modulated signals, and you need to measure them confidently, flexibly, and cost-effectively.

Demo 2014-07-15

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