Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Technical Support

Electronic Measurement

Support by Product Model Number:

226-250 of 715

Sort:
Photonic Foundation Library Fast Sweep PDL - Application Note
This application note describes an approach to significantly reduce the measurement time associated with polarization dependent loss (PDL) measurements.

Application Note 2014-07-31

PDF PDF 680 KB
Measuring the Dependence of Optical Amplifiers on Input Power Using an Attenuator
This application note describes the important optical amplifier properties of gain and noise figures and their dependence on the powers and wavelengths of the input signals.

Application Note 2014-07-31

PDF PDF 347 KB
State of the Art Characterization of Optical Components for DWDM Applications
Fiber optic network technology is taking a big step forward with the tremendous transmission capacity offered by dense wavelength-division multiplexing (DWDM).

Application Note 2014-07-31

Metrology of Optical Advanced Modulation Formats
The metrology basics of advanced optical modulation formats are presented.

Application Note 2014-07-31

PDF PDF 223 KB
Does your TLS have specifications pertinent to swept measurements? - Techincal Overview
This technical note describes the parameters given in the specifications of the TLS that are pertinent to dynamic conditions (that is, swept measurements).

Application Note 2014-07-31

PDF PDF 252 KB
Measuring IL and PDL spectra with the fast-switching N7786B - Application Note
The advantages and details of a new method for swept-wavelength IL and PDL measurement is introduced, including configuration details for the necessary instruments and software.

Application Note 2014-07-31

PDF PDF 582 KB
Optical Modulation Analyzer New Analysis Software Demo - Video
This video gives you a brief overview of the key new features like smart setup and new measurements. In addition it describes briefly how to setup various hardware configurations.

Demo 2014-07-15

The next generation of optical modulation analysis
As the pressure rises for 100 Gbit/s, you increasingly need to measure the performance of complex modulated signals, and you need to measure them confidently, flexibly, and cost-effectively.

Demo 2014-07-15

Introduces Industry's Most Accurate Test Solution for USB 3.1 Receivers
Achieve accurate receiver characterization with the J-BERT high-performance BERT

Press Materials 2014-07-09

User's Guides, Programmer's Guides, and Online Help (Version 04.60.0024)
This installer places an "Keysight Infiniium Docs" folder shortcut on your desktop. In this folder you can find user's guides, programmer's guides, and other manuals that go with Infiniium 90000 Series and 9000 Series oscilloscope system software.

Help File 2014-06-18

EXE EXE 239.71 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Article 2014-06-14

PDF PDF 515 KB
Lightwave Tutorial Series on Complex Optical Modulation - Article
Keysight offers a tutorial series on complex optical modulation featured in Lightwave magazine, featuring for example the challenges of coherent signal detection.

Article 2014-05-22

Certification of HDMI 2.0 Test Solution
Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

Download latest J-BERT M8020A application notes to master your designs
Submit the form to begin downloading the application briefs

Application Note 2014-04-09

N4391A Optical Modulation Analyzer Security Features and Volatility Documentation – Reference Guide
This document describes instrument security features and the steps to declassify an instrument through memory sanitization or removal.

Reference Guide 2014-04-01

PDF PDF 133 KB
N4392A Optical Modulation Analyzer Security Features and Volatility Documentation – Reference Guide
This document describes instrument security features and the steps to declassify an instrument through memory sanitization or removal.

Reference Guide 2014-04-01

PDF PDF 129 KB
N4965A Multi-Channel BERT 12.5 Gb/s - Getting Started Guide
Welcome to the Keysight N4965A Multi-Channel BERT 12.5 Gb/s Getting Started Guide. This guide will help you identify the contents of the shipping package, perform a quick functional check of the product, and guide you on where to find more information and support for the N4965A.

Quick Start Guide 2014-04-01

N4967A Serial BERT System 40 Gb/s – User’s Guide
This manual is designed to familiarize users with the fundamental operations of the N4967A Serial BERT System 40 Gb/s.

User Manual 2014-04-01

N4965A Multi-Channel BERT 12.5 Gb/s - User's Guide
The user's manual covers: setting up the system, operation, applications, performance specifications, remote operation, and warranty/product service.

User Manual 2014-04-01

Polarization Tutorial CD - Ordering Form
Polarization Tutorial CD - Ordering and Information Request Form.

Demo 2014-03-31

Insights for your best design
Cut through the challenges of gigabit digital designs with these useful tools, app notes, and seminars. Keysight - insights for your best design.

Promotional Materials 2014-03-30

Download the 2015 Lightwave Catalog
Order a free copy of - Volume 1 General Photonic Test and Volume 2 Transceiver Test and Volume 3; and/or download the Adobe files

Catalog 2014-03-20

J-BERT M8020A showing UI, jitter injection & de-emphasis – Video
This video gives an overview about the J-BERT M8020A high-performance BERT, including a demo of the jitter injection and de-emphasis capabilities, the user interface and the analyzer functionality.

Demo 2014-03-20

N4960A Serial BERT 17 and 32 Gb/s - Data Sheet
The N4960A is the world's most affordable solution for characterizing 100GbE, 28G, and high speed SerDes applications.

Data Sheet 2014-02-05

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Previous 1 2 3 4 5 6 7 8 9 10 ... Next