Here’s the page we think you wanted. See search results instead:


Contact an Expert

Technical Support

Electronic Measurement

Support by Product Model Number:

226-250 of 695

8169A Polarization Controller - Data Sheet
This product overview contains information and specifications about the 8169A polarization controller as an important building block of an optical test system.

Data Sheet 2014-07-31

PDL Measurements Using the Keysight 8169A Polarization Controller
This product note discusses the polarization dependent loss (PDL) measurement process; in particular using the 8169APolarization controller.

Application Note 2014-07-31

On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components

Application Note 2014-07-31

Measuring Polarization Dependent Loss of Passive Optical Components - Application Note
A new document on the methods of characterizing passive optical components.

Application Note 2014-07-31

3.35 GHz Pulse/ Pattern Generators - Promotional Flyer
The 81133a/34a is the first choice when timing and performance are vital. It is designed to enable R&D and test engineers to carry out tests more effectively, by providing access to necessary parameters.

Promotional Materials 2014-07-31

Digital Modulation in Communications Systems - Application Note
This application note introduces the concepts of digital modulation used in many communications systems today.

Application Note 2014-07-31

Measuring IL and PDL spectra with the fast-switching N7786B - Application Note
The advantages and details of a new method for swept-wavelength IL and PDL measurement is introduced, including configuration details for the necessary instruments and software.

Application Note 2014-07-31

Understanding Oscilloscope Frequency Response & Its Effect on Rise-Time Accuracy - Application Note
In this application note, we review the properties of both Gaussian and flat-response oscilloscopes, then discuss rise time accuracy for each response type. We show that flat-response oscilloscope, give more accurate rise-time measurement than a Gaussian-response oscilloscope of equal bandwidth, and we show you how to estimate the bandwidth you need. The application note will show you which type of frequency response offers the best measurement accuracy; there are two issues to consider, the maximum signal frequency, and the oscilloscope sampling alias errors. It will also determine how much bandwidth you need.

Application Note 2014-07-31

81495A Reference Receiver - Data Sheet
This document describes the technical specifications and capabilities of Agilents 81495A Reference Receiver

Data Sheet 2014-07-31

Optical Modulation Analyzer New Analysis Software Demo - Video
This video gives you a brief overview of the key new features like smart setup and new measurements. In addition it describes briefly how to setup various hardware configurations.

Demo 2014-07-15

The next generation of optical modulation analysis
As the pressure rises for 100 Gbit/s, you increasingly need to measure the performance of complex modulated signals, and you need to measure them confidently, flexibly, and cost-effectively.

Demo 2014-07-15

Introduces Industry's Most Accurate Test Solution for USB 3.1 Receivers
Achieve accurate receiver characterization with the J-BERT high-performance BERT

Press Materials 2014-07-09

User's Guides, Programmer's Guides, and Online Help (Version 04.60.0024)
This installer places an "Keysight Infiniium Docs" folder shortcut on your desktop. In this folder you can find user's guides, programmer's guides, and other manuals that go with Infiniium 90000 Series and 9000 Series oscilloscope system software.

Help File 2014-06-18

EXE EXE 239.71 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Article 2014-06-14

Lightwave Tutorial Series on Complex Optical Modulation - Article
Keysight offers a tutorial series on complex optical modulation featured in Lightwave magazine, featuring for example the challenges of coherent signal detection.

Article 2014-05-22

Certification of HDMI 2.0 Test Solution
Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

Download latest J-BERT M8020A application notes to master your designs
Submit the form to begin downloading the application briefs

Application Note 2014-04-09

N4392A Optical Modulation Analyzer Security Features and Volatility Documentation – Reference Guide
This document describes instrument security features and the steps to declassify an instrument through memory sanitization or removal.

Reference Guide 2014-04-01

N4391A Optical Modulation Analyzer Security Features and Volatility Documentation – Reference Guide
This document describes instrument security features and the steps to declassify an instrument through memory sanitization or removal.

Reference Guide 2014-04-01

Polarization Tutorial CD - Ordering Form
Polarization Tutorial CD - Ordering and Information Request Form.

Demo 2014-03-31

Insights for your best design
Cut through the challenges of gigabit digital designs with these useful tools, app notes, and seminars. Keysight - insights for your best design.

Promotional Materials 2014-03-30

J-BERT M8020A showing UI, jitter injection & de-emphasis – Video
This video gives an overview about the J-BERT M8020A high-performance BERT, including a demo of the jitter injection and de-emphasis capabilities, the user interface and the analyzer functionality.

Demo 2014-03-20

Download the 2015 Lightwave Catalog
Order a free copy of - Volume 1 General Photonic Test and Volume 2 Transceiver Test and Volume 3; and/or download the Adobe files

Catalog 2014-03-20

N4960A Serial BERT 17 and 32 Gb/s - Data Sheet
The N4960A is the world's most affordable solution for characterizing 100GbE, 28G, and high speed SerDes applications.

Data Sheet 2014-02-05

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Previous 1 2 3 4 5 6 7 8 9 10 ... Next