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Application-Specific Test Systems & Components

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Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

PDF PDF 5.09 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2014-02-26

PDF PDF 1.48 MB
Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2014-02-25

How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Keysight solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Keysight TS-5400 Series 3 high performance PXI function test system for multiple devices under test.

Application Note 2013-04-18

PDF PDF 783 KB
Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2013-03-06

Ten things to Consider when Selecting your Next Oscilloscope - Application Note
You rely on your oscilloscope every day, so selecting the right one to meet your needs is an important task. Comparing specs and features of scopes made by different manufacturers can be time-consuming and confusing. The concepts outlined here are intended to speed your selection process and help you avoid some common pitfalls. No matter who makes the scopes you are considering, carefully analyzing each one in relation to the 10 issues discussed here will help you evaluate the instruments objectively.

Application Note 2012-05-15

Switching Solutions
This paper discusses Keysight's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

Fundamentals of RF and Microwave Noise Figure (AN 57-1)
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

High-Performance Arbitrary Waveform Generation for RADAR and LIDAR Application
Presentation given at the Aerospace and Defense Symposium in 2009. It covers radar principles and challenges, radar test systems, and Keysight solutions.

Application Note 2010-02-17

PDF PDF 1.32 MB
Creating, Editing, Transferring Arbitrary Waveforms with Keysight U2761A Function Generator
This application note explores how a complex arbitrary waveform is created by using software, importing, reusing existing waveform files and easily programs your instrument with the free Command Logger and Code Converter functions.

Application Note 2009-12-11

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Creating Hardware Handler in C/C++ for Keysight TestExec SL
A hardware handler enhances the Keysight TestExec SL's ability to control devices by communicating directly with the instrument's driver. This application note describes how to create hardware handlers for the TestExec SL.

Application Note 2009-09-10

PDF PDF 181 KB
Built in Test Coverage and Diagnostics : Best Practices to Achieve Built in Test Success

Application Note 2009-09-01

PDF PDF 148 KB
Configuring Signal and Load Switching Using Keysight TestExec SL
This application note describes how users of the Keysight TestExec SL software can easily configure and set up switching for the increasing number of channels on units under test with the Switch Manager feature in the software.

Application Note 2009-08-13

PDF PDF 286 KB
Creating Arbitrary Waveforms in the U2300A Series and U2500A Series Data Acquisition Devices
This application note covers the inner workings of how waveforms and arbitrary waveforms are formed.

Application Note 2009-08-01

Database Connectivity Guide for TestExec SL
This application note outlines the importance of proper data logging in a database and discusses best practices to import extensible markup language (XML) files from TestExec into a database.

Application Note 2009-07-16

PDF PDF 434 KB
Customizing the Keysight TestExec SL Operator Interface using Visual Basic
This application note describes how users of the Keysight TestExec SL software can customize the operator user interface using Visual Basic.

Application Note 2009-07-07

PDF PDF 312 KB
Fundamentals of RF and Microwave Power Measurements (AN 1449) - Application Note
Keysight's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Application Note 2009-06-05

Using the U2331A USB DAQ in the construction industry
The device can be used to measure various types of parameters in the construction industry.

Application Note 2009-04-06

PDF PDF 229 KB
DC-to-DC Regulator Auto Evaluation Test with the U2351A
The Keysight U2351A data acquisition (DAQ) is used as an automatic DC voltage regulator and to induce voltage into the electronics system thereby causing an amount of under voltage or over voltage stress to the device under test (DUT).

Application Note 2009-02-04

PDF PDF 270 KB
Simplified PC Connections for GPIB Instruments (AN 1409-1) - Application Note
Making the connection from your instruments to your PC has not always been an easy task. Today there are new choices that allow for easier connections so that you can focus on your measurement tasks and not on your connections. This paper will walk you through the choices you need to make when...

Application Note 2009-01-22

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

DVD Player Manufacturing Test Using Keysight Modular Instruments
Audio and video testing of modern digital video disc (DVD) player using Keysight’s USB modular oscilloscopes and USB modular switch matrix.

Application Note 2008-09-15

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