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HUAWEI demonstrates 112 Gb/s PAM-4 optical signal transmission with M8196A AWG
112 Gb/s PAM-4 Optical Signal Transmission over 100-m OM4 Multimode Fiber for High-Capacity Data-Center

記事 2016-12-05

Keysight Translator for QDART Test
Keysight Translator software for QDART

記事 2016-11-20

Keysight Technologies ベクトル・ネットワーク・アナライザによるTHzまでの正確なスペクトラム解析
ベクトル・ネットワーク・アナライザによるTHzまでの正確なスペクトラム解析

記事 2016-07-26

PDF PDF 1.42 MB
Benefits of Keysight Bead Probe Technology
Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.

記事 2016-03-03

Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint
Early implementation of BST can cut test costs and time.

記事 2016-02-17

PDF PDF 178 KB
New IEEE Standards for Board and System Tests - Article Reprint
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

記事 2016-02-16

PDF PDF 190 KB
The Boundary Scan Toolbox - Article Reprint
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

記事 2016-02-16

PDF PDF 409 KB
ABCs of Writing a Custom Boundary Scan Test - Article Reprint
This article provides sample vectors and code for expanding test coverage with boundary scan.

記事 2016-02-12

PDF PDF 472 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

記事 2016-02-12

PDF PDF 178 KB
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

記事 2016-02-09

PDF PDF 318 KB
Tester for Hire - Article Reprint
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

記事 2016-02-09

PDF PDF 381 KB
Manufacturing Test Solutions for SSDS - Article Reprint
A new system performs both ICT and boundary scan in high-volume settings.

記事 2016-02-09

PDF PDF 222 KB
Testing the Internet of Things - Article Reprint
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

記事 2016-02-09

PDF PDF 79 KB
Finding Fault - Article Reprint
testing mission-critical functions in automotive electronics.

記事 2016-02-05

PDF PDF 452 KB
The Flash Programming Flow - Article Reprint
On-board flash memory device testing and programming.

記事 2016-02-05

PDF PDF 251 KB
Testing of Small Form-Factor Products - Article Reprint
Boundary scan and embedded test will need to make up for ICT gaps.

記事 2016-02-03

PDF PDF 546 KB
Making Boundary Scan Easy - Article Reprint
Testing boundary scan devices no longer need be a laborious task.

記事 2016-02-03

PDF PDF 217 KB
Testing New Grounds in Automotive Electronics - Article Reprint
Manufacturers are increasingly designing products for ease of test.

記事 2016-02-02

PDF PDF 279 KB
Automating In-Circuit Test - Article Reprint
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

記事 2016-02-02

PDF PDF 87 KB
Using a Wide-Band Tunable Laser for Optical Filter Measurements – Article
This article was published in NASA Tech Briefs hard copy and online, highlighting how to use a wide-band tunable laser for optical filter measurements.

記事 2016-01-18

PDF PDF 1.82 MB
QFP ICとコネクタを搭載した実装基板でテストカバレッジ100% を実現 フライヤ
QFP ICとコネクタを搭載した実装基板でテストカバレッジ 100% を実現

事例紹介 2016-01-08

PDF PDF 483 KB
Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

記事 2015-06-08

PDF PDF 1.86 MB
A Bead Probe CAD Strategy for In-Circuit Test - White Paper
IEEE article reprint discussing the potential of using bead probes in computer aided design (CAD) systems when getting a board ready for production.

記事 2015-06-08

PDF PDF 1.46 MB
Risk factors of Utilizing Unauthorized Third-Part Suppliers for In-Circuit Test - Case Study
This paper describes the potential risks customers may have to face by engaging services from unauthorized 3rd party suppliers for 3070 and i3070 products and services.

事例紹介 2015-04-15

PDF PDF 2.02 MB
PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

記事 2015-03-24

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