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A Bead Probe CAD Strategy for In-Circuit Test - White Paper
IEEE article reprint discussing the potential of using bead probes in computer aided design (CAD) systems when getting a board ready for production.

記事 2015-06-08

PDF PDF 1.46 MB
Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

記事 2015-06-08

PDF PDF 1.86 MB
Risk factors of Utilizing Unauthorized Third-Part Suppliers for In-Circuit Test - Case Study
This paper describes the potential risks customers may have to face by engaging services from unauthorized 3rd party suppliers for 3070 and i3070 products and services.

事例紹介 2015-04-15

PDF PDF 2.02 MB
PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

記事 2015-03-24

電源ノイズの真の波形が見えた!電源ノイズのために生まれてきた専用の「電源ノイズアナライザ」
アジレント・テクノロジーの電子計測事業から誕生したキーサイト・テクノロジーは、電源ノイズを観測する新スタンダードソリューションとして、電源ノイズアナライザを開発した。....

記事 2014-12-26

AWG article - MWJ product feature
AWG article - MWJ product feature

記事 2014-10-14

Surviving State Disruptions Caused by Test: A Case Study - Article Reprint
This paper discusses new instructions for IEEE 1149.1 boundary scan tests that can remove "lobotomy problems" during tests.

記事 2014-08-01

PDF PDF 3.07 MB
In-Circuit Test (ICT): The King Is Dead; Long Live the King!
Reports of the demise of in-circuit testing have been exaggerated for at least 20 years. Despite this, ICT is still here and kicking. This paper discusses various reasons why the King lives on.

記事 2014-08-01

PDF PDF 201 KB
Intellectual property and copyright protection on Agilent ICT products
This letter advises areas of intellectual property and copyright protection to look out for when customers elect to purchase Agilent in-circuit test products from third party vendors.

特集記事 2014-07-31

PDF PDF 155 KB
Comparing Boundary Scan Methods White Paper
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

記事 2014-07-31

PDF PDF 2.75 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

記事 2014-06-14

PDF PDF 515 KB
I/Q光変調に関する光チュートリアルシリーズ – 記事
キーサイトは、コヒーレント信号検出の問題例を扱ったLightwave誌に掲載された、I/Q光変調に関するチュートリアルシリーズを提供しています。

記事 2014-05-22

2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint
Frost & Sullivan honors Agilent as a growth leader in the PXI modular instrumentation market in 2014.

記事 2014-05-22

PDF PDF 598 KB
PCBAテストの受賞歴

特集記事 2013-12-17

Demystify MIPI M-PHY receiver physical layer test challenges – Webcast
For design, test and validation engineers who need to characterize and validate compliance of their MIPI designs.

記事 2013-11-15

ECOC 2013 video interview with Stefan Loeffler
Review of the ECOC 2013 Exhibition in London

記事 2013-11-13

Time-domain pulse shaping for increased spectral efficiency - Article
This article elaborates on the conditions needed to prevent the effects of ISI and on the use of different filtering techniques for the purpose of bandwidth and signalcontainment.

記事 2013-11-13

Incremental Redundancy in EGPRS
Incremental redundancy is implemented in EGPRS systems to achieve maximum efficiency in over-the-air interface... WirelessDesignMagazine.com article by Paul Mercy. Feb 2005. Acrobat PDF.

記事 2013-04-02

Ball Grid Array Joint Inspection Using X-ray as it relates to voids and the IPC-7095A specification
With the introduction of Lead-free solder, voiding within Ball Grid Array (BGA) joints is potentially a major issue. This article discusses the relationship to voiding, the IPC standard and Automated X-ray Inspection.

特集記事 2012-12-06

PDF PDF 105 KB
Choose the right system calibration services for your Keysight i3070/3070 In-circuit Test System
Keysight offer a range of new calibration service with and without system calibration license to use for your Keysight i3070/3070 In-circuit Test System

事例紹介 2012-09-28

Improving Coverage for ECU Outliers - Article Reprint
This article explores how to catch electronic faults that typically escape with traditional serial testing, by using a multiple-channel voltage acquisition method that can enable faster parallel test.

記事 2012-08-24

PDF PDF 191 KB
The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.

記事 2012-08-24

PDF PDF 1.04 MB
Comparing In-house and Commercial Load Solutions for Automotive Test

記事 2012-07-17

Testing DDR Memory; How On-Chip DFT Helps
This paper discusses DDR memory testing challenges we see today, and how the adoption of DFT capabilities pays off in higher test coverage, better diagnostics and reduced programming/support time.

記事 2012-04-17

PDF PDF 530 KB
Boundary-Scan Advanced Diagnostic Methods
This paper illustrates how usage of boundary scan circuit information and predictive analysis of potential assembly faults will provide more precise and accurate diagnostic information.

記事 2012-04-17

PDF PDF 1.20 MB

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