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Electronic Measurement

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3D Techniques in SMT Test
By Malachy Rice, Ph.D, Stacy Johnson and Glen Leinbach, Agilent Technologies. Published by EE - Evaluation Engineering, February 2004.

Article 2004-09-28

Utilizing VEE for Data Collection in Surface and Undersea Research
Utilizing VEE for Data Collection in Surface and Undersea Research

Case Study 2004-05-27

PDF PDF 130 KB
Pins Test Detects Bondwire Failures
Recently, a high volume 3070 user came across a batch of devices with bad bondwires from the chip vendor. The symptom at ICT was failing "pins" tests (sometimes known as "Chek-Point").

Case Study 2004-05-26

PDF PDF 53 KB
Vectorless Test EP (VTEP) Goes Head-to-Head with Keysight TestJet - Case Study
VTEP has proven its abilities to improve in-circuit test coverage by over 80 percent compared to the older TestJet technology, especially on boards with hard-to-test packages such as BGAs, micro-BGAs, and SMT edge connectors.

Case Study 2003-12-16

PDF PDF 1.36 MB
Selcom Group Uses Integrated Test to Cut Costs and Increase Business
Selcom Group uses a combination of test technologies from Keysight to meet stringent cost, quality, and shipping targets, allowing Selcom to continue growing and thriving in a difficult worldwide economy.

Case Study 2003-10-24

PDF PDF 600 KB
Step-by-Step Series: Step 9 -Test and Inspection
Written by Stig Oresjo, Agilent Technologies. Published in SMT, October 2003.

Article 2003-10-01

Keysight Quality Tool Testimonials
Learn what users have to say about Keysight Quality Tool.

Case Study 2003-09-30

ScanWorks Reduces Vivace Networks' ICT Costs and Improves Board Quality
This paper discusses how Vivace Networks uses ScanWorks at the benchtop and at in-circuit test to reduce test costs and accelerate time to market in a competitive environment.

Case Study 2003-07-31

PDF PDF 29 KB
Lucent Demonstrates how ScanWorks for the Keysight 3070 Can Save Nearly $1 Million Per Year
Lucent has demonstrated that reusing ScanWorks boundary-scan tests on the 3070 ICT platform can produce dramatic cost savings through lower test development and fixture costs without giving up test coverage.

Case Study 2003-07-23

PDF PDF 222 KB
Selecting the Optimal Test Strategy
Written by Stig Oresjo, Agilent Technologies. Published in Circuits Assembly, July 2003.

Article 2003-07-01

3D Inline SPI
PCB PULSE ARTICLE: Solder paste printing can account for up to 80 percent of all board defects. A new article by Stacy Kalisz Johnson describes how the Agilent SP50 hits that big target at two assembly houses that test fine pitch devices.

Feature Story 2003-06-20

Motorola Drives Reliability and Productivity of In-Car Safety Systems with the Keysight 3070
To maintain rigorous testing without hindering assembly line productivity, Motorola chose the Keysight 3070 In-circuit Test System.

Case Study 2003-06-03

PDF PDF 2.01 MB
ScanWorks Completes Successful Assessment at Jabil Circuit
One of the first places electronics manufacturers look to reduce expenses is through the elimination of redundant effort.

Case Study 2003-03-21

PDF PDF 661 KB
AwareTest xi Case Study #1
This case study compares a fully-probed in-circuit test on a conventional high node count test system with a combined x-ray/in-circuit test strategy, using the simplified in-circuit test.

Case Study 2003-02-15

PDF PDF 127 KB
AwareTest xi Case Study #2
This case study compares the current test strategy with a full combined test strategy and a simplified combined test strategy (x-ray inspection followed by simplified in-circuit test).

Case Study 2003-02-15

PDF PDF 763 KB
AwareTest xi Case Study #3
This case study compares fault coverage of the current test strategy (automatic optical inspection/full in-circuit test) with a combined x-ray inspection/simplified in-circuit test strategy.

Case Study 2003-02-15

PDF PDF 164 KB
One Billion Solder Joints and Counting
Written by Stig Oresjo, Agilent Technologies. Published with permission from Circuits Assembly, February 2001.

Article 2003-02-01

PDF PDF 1.81 MB
Customer Testimonial for Keysight VEE Pro
Customer Testimonial for Keysight VEE Pro (3-minute video)

Case Study 2003-01-05

AMCC Achieves Performance Beyond SONET/SDH Requirements
A WAN system solution provider wins customers' loyalty by demonstrating jitter characteristics far beyond compliance.

Case Study 2002-09-19

PDF PDF 1.94 MB
Dogan Arsian, R&D/Design Engineer
"The reason why I bought the Internet Advisor was so that I could have WAN and LAN analysis at the same machine. I'm still happy with my data scope. Thank you very much for this product."

Case Study 2002-08-19

Al Clark, Network Analyst Consultant
"We started experiencing trouble with the devices not being able to re-insert into the Token Ring. We would probably still be deadlocked with this trouble, if not for the Keysight Advisor's Network Commentator and Detailed Decode functions."

Case Study 2002-08-19

Jim Bruce, Bruce Data Networks
"Being an IT self-employed contractor, the Advisor keeps me in work."

Case Study 2002-08-19

Jeff Sicuranza, Applied Methodologies, Inc.
"I was able to pinpoint major application related issues for a large NYC insurer and prove to management that the problem was NOT network related."

Case Study 2002-08-19

Andy Gallacher, Hewlett Packard
"Used the Keysight Advisor to trap errors. Reconfigured the hosts for half duplex and the problem went away. I wouldn't have found this without the Advisor!!"

Case Study 2002-08-19

Frank Beider, Norlight Telecommunications
"Through our solution, we gained customer goodwill. How can you put a price on that?"

Case Study 2002-08-19

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