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Electronic Measurement

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Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Keysight 4080 series parametric test systems to make these measurements.

Application Note 2011-02-08

PDF PDF 3.57 MB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

Application Note 2011-02-06

PDF PDF 331 KB
High Speed Parametric Test using Keysight 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Keysight 4080 series parametric test systems.

Application Note 2011-02-06

PDF PDF 913 KB
PXT Wireless Communications Test Set (E6621A) - Application Note
This application note provides you with the basic steps to making data throughput measurements with your E6621A PXT.

Application Note 2011-02-04

Measuring the Complex Modulus of Polyethylene Using Instrumented Indentation - Application Note
Application note demonstrating the new method for measurement of complex modulus of polyethylene.

Application Note 2011-01-19

PDF PDF 325 KB
TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

PDF PDF 2.17 MB
Switching Solutions
This paper discusses Keysight's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

Transient Optical Power Measurements with the N7744A and N7745A
This note shows how to measure transient and time-dependent optical signals, both of which are related to the fast sample rate and data throughput of the N7744A and N7745A multiport power meters.

Application Note 2010-11-12

PDF PDF 1.23 MB
High Temperature Mechanical Characterization of Tin Using Nanoindentation
A reveiw of a new test protocol for testing tin a high temperatures with the G200 using CSM & heating stage.

Application Note 2010-10-26

PDF PDF 463 KB
Make the Move From MTS 160 To Medalist i1000D In-Circuit Test Application Note
This application note describes how to convert the hardware and software from the MTS160 MDA platform to the Keysight Medalist i1000D platform to use state-of-the-art in-circuit test technology.

Application Note 2010-10-22

PDF PDF 3.27 MB
Substrate-Independent Modulus of Hard Overcoats for Magnetic Media

Application Note 2010-09-22

PDF PDF 203 KB
Error Detection Up to 28.4 Gb/s During Receiver Test with the Keysight J-BERT - Application Note
J-BERT N4903B pattern generation is extended up to 28.4 Gb/s with second channel Option 002 and N4876A 2:1 Mux. The single 12.5 Gb/s ED can easily be used during RX test utilizing under-sampling.

Application Note 2010-09-16

PFM Experiments with High Voltage DC/AC Bias

Application Note 2010-09-09

PDF PDF 562 KB
Measuring Substrate-Independent Young's Modulus

Application Note 2010-08-31

PDF PDF 347 KB
Measuring Substrate-Independent Young's Modulus of Low-k films by Instrumented Indentation

Application Note 2010-08-31

PDF PDF 263 KB
Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization
Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization via Electron Channeling Contrast Imaging

Application Note 2010-08-06

PDF PDF 287 KB
Fundamentals of RF and Microwave Noise Figure Measurements - Application Note
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

Evaluation of Failure in Low-k Films Using Stiffness Mapping & Dynamic Imaging

Application Note 2010-08-03

PDF PDF 325 KB
Instrumented Indentation to Measure the Complex Modulus of Highly Plasticized Polyvinyl Chloride

Application Note 2010-07-29

PDF PDF 387 KB
Understanding RF/Microwave Solid State Switches and their Applications
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.

Application Note 2010-05-21

PDF PDF 1.07 MB
Nanoindentation, Scratch, and Elevated Temperature Testing of Cellulose and PMMA Films
Review of nanomechanical methods for nanoindenting & scratch testingof films

Application Note 2010-04-16

PDF PDF 2.28 MB
Verizon Usage and Standby Time flyer
This flyer give a brief overview of Keysight's solution supporting Verizon's battery drain compliance test plan: Usage Time and Standby Time.

Application Note 2010-04-14

Attofarad Capacitance Measurement with SMM

Application Note 2010-04-08

PDF PDF 325 KB
Indentation Rules of Thumb Applications & Limits

Application Note 2010-04-07

PDF PDF 777 KB
Scratch Testing of Multilayered Metallic Film Stacks

Application Note 2010-04-07

PDF PDF 1.17 MB

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