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Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-04-15

Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Application Note 2016-03-11

PDF PDF 7.96 MB
Mini In-Circuit Tester - Application Note
This application note discusses the SCPI commands and the potential use models with the modular Keysight Mini In-Circuit Tester.

Application Note 2016-03-02

How to Ensure Interoperability and Compliance of USB Type-C™ Cables and Connectors- Application Note
Integrating USB Type-C into products, while ensuring interoperability and compliance, is challenging. This measurement brief covers USB Type-C cable and connector design and test solutions.

Application Note 2016-02-29

Right Load Switching and Simulation Design Choices for High Current and Mechatronic Functional Tests
Key considerations for designing a cost-effective high-power switching and load management automotive functional test solution.

Application Note 2016-02-22

PDF PDF 967 KB
Bluetooth Audio Measurement with the U8903B Performance Audio Analyzer - Application Note
This article focuses on the Bluetooth audio measurement applications of the U8903B performance audio analyzer. Bluetooth audio is also part of the whole audio measurement and analysis ecosystem.

Application Note 2016-01-28

Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note
This application note provides some key guidelines to enable good design for testability using boundary scan.

Application Note 2016-01-21

PDF PDF 1.99 MB
TS-8989 System Integration Guide - Application Note
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2015-11-11

PDF PDF 2.87 MB
Configuring Lattice BSCAN2 Scan Path Linker on Keysight x1149 Boundary Scan Analyzer - App Note
A boundary scan linker mux device links multiple boundary scan chains into one single chain or multiple chain configurations. Find out how to configure Lattice BSCAN2 scan path linkers in this paper.

Application Note 2015-10-30

PDF PDF 6.31 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2015-10-29

PDF PDF 4.33 MB
Download application notes on optical communication test
Get application notes on the latest developments in coherent test signal generation and analysis.

Application Note 2015-10-27

Programming Keysight Technologies Continuous-Sweep Tunable Lasers - Application Note
This is a new Application Note for Programming Keysight Continuous-Sweep Tunable Lasers

Application Note 2015-10-19

PDF PDF 819 KB
Impedance Measurement Handbook - 5th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2015-10-07

Switching Solutions for Multi-Lane BERT Testing - Application Note
This application note addresses the use of switching solutions, degradations that might be encountered, and the methods to overcome them.

Application Note 2015-10-07

PDF PDF 2.55 MB
Testing Voice Over LTE (VoLTE) Phones - Application Note
This application note explains a solution for testing voice over LTE (VoLTE) phones that is well-suited for LTE mobile phone developers, test engineers, and test lab personnel.

Application Note 2015-09-14

PDF PDF 4.46 MB
Nanoindentation of a Multiphase Composite with NanoVision - Application Note
Review of Nanoindetation of a multicomposite using Nanovision

Application Note 2015-08-28

PDF PDF 176 KB
Understanding the Right Metrics to use when Evaluating Oscilloscope Quality - Application Note
For scopes with bandwidth in the GHz range, a quality metric involves characterizing the analog-to-digital converter (ADC) using effective number of bits (ENOB). How important is ENOB?

Application Note 2015-08-26

Barcode Strategy Considerations When Using the Keysight i3070 Inline In-circuit Test Solution
This application note highlights the different options for positioning barcode readers on Keysight i3070 inline in-circuit test solution.

Application Note 2015-08-21

PDF PDF 226 KB
W-CDMA Dynamic Power Analysis Using the 8960 - Application Note
This document illustrates how to use the dynamic power analysis measurement in the Keysight 8960 test set to measure user equipment (UE) power sequences.

Application Note 2015-07-31

PDF PDF 379 KB
Optimizing RF and Microwave Spectrum Analyzer Dynamic Range -- Application Note
The dynamic range of a spectrum analyzer is traditionally defined as the ratio, in dB, of the largest to the smallest signals simultaneously present at the input of the spectrum analyzer that allows measurement of the smaller to a given degree of uncertainty. The signals of interest can either be...

Application Note 2015-07-24

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range - Application Note
This application note defines the elements of spectrum analyzer measurement speed and shows how to choose solution bandwidth and data output format for fast measurements.

Application Note 2015-07-22

Dynamic Power Measurements for cdma2000 on the Keysight 8960 Wireless Test Set - Application Note
Power control is essential in CDMA devices. This application note explains how the use of dynamic power measurement can help ensure the in-field performance of CDMA wireless devices.

Application Note 2015-07-15

“Shotgunning”, a Bad Fit for Lead-Free Test
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Application Note 2015-07-14

PDF PDF 99 KB
Multiport and Multi-site Test Optimization Techniques - Application Note
This app note gives an overview of multiport and multi-site test capabilities, how different multiport test solutions compare, and what should be considered when configuring a multi-site test station.

Application Note 2015-07-14

Demystifying RCRC and RC probes - Application Note
An ideal probe would provide an exact replica of a signal being probed. However, the probe becomes a part of the circuit under test, because the probe introduces probe loading to the circuit.

Application Note 2015-06-17

PDF PDF 1.56 MB

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