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Understanding the Right Metrics to use when Evaluating Oscilloscope Quality - Application Note
For scopes with bandwidth in the GHz range, a quality metric involves characterizing the analog-to-digital converter (ADC) using effective number of bits (ENOB). How important is ENOB?

Application Note 2011-08-08

Measurement of System Compliance Using Template Grip Technique and the Keysight T150
System compliance using template grips for measuring mechanical properties of single fibers.

Application Note 2011-08-01

PDF PDF 229 KB
Medalist i1000D Boundary Scan Debug
This white paper discusses how to effectively debug boundary scan tests on the Medalist i1000D in-circuit tester.

Application Note 2011-08-01

PDF PDF 896 KB
Mechanical Characterization of Grey & Brown Hair

Application Note 2011-07-20

PDF PDF 169 KB
How to build a fixture for use with the Keysight Cover-Extend Technology
Cover-Extend Technology is Keysight’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

PDF PDF 1.09 MB
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 - Application Note
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Application Note 2011-06-22

Testing Handovers Between LTE and 3G cdma2000/1xEV-DO Cellular Networks - Application Note
This application note explains test handovers between LTE and third generation cdma2000/1xEV-DO cellular networks as well as network evolution.

Application Note 2011-06-15

Stiffness Mapping and the Calculation of Fracture Toughness of Fused Silica
Fracture toughness measurement of fused silica using new stiffness methods.

Application Note 2011-06-05

PDF PDF 136 KB
Optimizing Oscilloscope Measurement Accuracy on High-Performance Systems with Keysight Active Probes
This application note covers the following information that you should consider when selecting an oscilloscope probe to capture high-speed signals: Consider the effect that probe input impedance will have on your circuit. Capacitive loading becomes increasingly important at high frequencies and it is important to use the shortest possible ground lead to minimize inductance. The probe will introduce distortion into your measurements unless it has a flat transmitted response throughout the bandwidth of the probe. A flat transmitted response will closely track the signal at the probe tip and pass it to the oscilloscope with minimal degradation.

Application Note 2011-05-20

Using the Hardware Interface on the Keysight N1231B PCI Three-Axis Laser Board with External Sampling
This paper covers how to use the signals on the N1231B board’s hardware IO connectors for transferring position information to other devices.

Application Note 2011-04-14

Measuring the Mechanical Properties of Bone by Instrumented Indentation
Describes the use of instrumented indentation to measure the elastic modulus & hardness of bone

Application Note 2011-04-05

PDF PDF 219 KB
Using N5747A High-Power Power Supply with the Medalist i3070 Series 5 - Application Note
This paper documents the information needed to develop and turn on a test program utilizing the new Keysight N5747A high-power power supply on the Keysight Medalist i3070 Series 5 in-circuit tester.

Application Note 2011-04-04

PDF PDF 2.39 MB
Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11)
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

Application Note 2011-03-28

IEEE 802.16e WiMAX OFDMA Signal Measurements and Troubleshooting, AN 1578
This note provides a broad overview of measurement and troubleshooting approaches for OFDMA signals, and is not limited to digital demodulation or modulation quality analysis.

Application Note 2011-02-17

Accurate Capacitance Characterization at the Wafer Level
This application note describes the procedures required to precisely evaluate the capacitance of a Device Under Test (DUT) when using a 4080 series tester with an automatic wafer prober.

Application Note 2011-02-08

PDF PDF 1.61 MB
Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Keysight 4080 series parametric test systems to make these measurements.

Application Note 2011-02-08

PDF PDF 3.57 MB
Low Current Measurement Technologies in Keysight 4080 Parametric Test System
This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput by focusing on the several key items.

Application Note 2011-02-08

PDF PDF 1.47 MB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

Application Note 2011-02-06

PDF PDF 331 KB
High Speed Parametric Test using Keysight 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Keysight 4080 series parametric test systems.

Application Note 2011-02-06

PDF PDF 913 KB
PXT Wireless Communications Test Set (E6621A) - Application Note
This application note provides you with the basic steps to making data throughput measurements with your E6621A PXT.

Application Note 2011-02-04

Measuring the Complex Modulus of Polyethylene Using Instrumented Indentation - Application Note
Application note demonstrating the new method for measurement of complex modulus of polyethylene.

Application Note 2011-01-19

PDF PDF 325 KB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2011-01-11

TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

PDF PDF 2.17 MB
Switching Solutions
This paper discusses Keysight's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

Transient Optical Power Measurements with the N7744A and N7745A
This note shows how to measure transient and time-dependent optical signals, both of which are related to the fast sample rate and data throughput of the N7744A and N7745A multiport power meters.

Application Note 2010-11-12

PDF PDF 1.23 MB

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