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IEEE 802.16e WiMAX OFDMA Signal Measurements and Troubleshooting, AN 1578
This note provides a broad overview of measurement and troubleshooting approaches for OFDMA signals, and is not limited to digital demodulation or modulation quality analysis.

Application Note 2011-02-17

Accurate Capacitance Characterization at the Wafer Level
This application note describes the procedures required to precisely evaluate the capacitance of a Device Under Test (DUT) when using a 4080 series tester with an automatic wafer prober.

Application Note 2011-02-08

PDF PDF 1.61 MB
Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Keysight 4080 series parametric test systems to make these measurements.

Application Note 2011-02-08

PDF PDF 3.57 MB
Low Current Measurement Technologies in Keysight 4080 Parametric Test System
This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput by focusing on the several key items.

Application Note 2011-02-08

PDF PDF 1.47 MB
High Speed Parametric Test using Keysight 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Keysight 4080 series parametric test systems.

Application Note 2011-02-06

PDF PDF 913 KB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

Application Note 2011-02-06

PDF PDF 331 KB
PXT Wireless Communications Test Set (E6621A) - Application Note
This application note provides you with the basic steps to making data throughput measurements with your E6621A PXT.

Application Note 2011-02-04

Measuring the Complex Modulus of Polyethylene Using Instrumented Indentation - Application Note
Application note demonstrating the new method for measurement of complex modulus of polyethylene.

Application Note 2011-01-19

PDF PDF 325 KB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2011-01-11

TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

PDF PDF 2.17 MB
Switching Solutions
This paper discusses Keysight's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

Transient Optical Power Measurements with the N7744A and N7745A
This note shows how to measure transient and time-dependent optical signals, both of which are related to the fast sample rate and data throughput of the N7744A and N7745A multiport power meters.

Application Note 2010-11-12

PDF PDF 1.23 MB
High Temperature Mechanical Characterization of Tin Using Nanoindentation
A reveiw of a new test protocol for testing tin a high temperatures with the G200 using CSM & heating stage.

Application Note 2010-10-26

PDF PDF 463 KB
Make the Move From MTS 160 To Medalist i1000D In-Circuit Test Application Note
This application note describes how to convert the hardware and software from the MTS160 MDA platform to the Keysight Medalist i1000D platform to use state-of-the-art in-circuit test technology.

Application Note 2010-10-22

PDF PDF 3.27 MB
Substrate-Independent Modulus of Hard Overcoats for Magnetic Media

Application Note 2010-09-22

PDF PDF 203 KB
Error Detection Up to 28.4 Gb/s During Receiver Test with the Keysight J-BERT - Application Note
J-BERT N4903B pattern generation is extended up to 28.4 Gb/s with second channel Option 002 and N4876A 2:1 Mux. The single 12.5 Gb/s ED can easily be used during RX test utilizing under-sampling.

Application Note 2010-09-16

PFM Experiments with High Voltage DC/AC Bias

Application Note 2010-09-09

PDF PDF 562 KB
Measuring Substrate-Independent Young's Modulus

Application Note 2010-08-31

PDF PDF 347 KB
Measuring Substrate-Independent Young's Modulus of Low-k films by Instrumented Indentation

Application Note 2010-08-31

PDF PDF 263 KB
Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization
Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization via Electron Channeling Contrast Imaging

Application Note 2010-08-06

PDF PDF 287 KB
Fundamentals of RF and Microwave Noise Figure Measurements - Application Note
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

Evaluation of Failure in Low-k Films Using Stiffness Mapping & Dynamic Imaging

Application Note 2010-08-03

PDF PDF 325 KB
Instrumented Indentation to Measure the Complex Modulus of Highly Plasticized Polyvinyl Chloride

Application Note 2010-07-29

PDF PDF 387 KB
Stiffness Mapping: a Dynamic Imaging Technique

Application Note 2010-07-29

PDF PDF 234 KB
Understanding RF/Microwave Solid State Switches and their Applications
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.

Application Note 2010-05-21

PDF PDF 1.07 MB

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