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On Characterization of Mechanical Deformation in Flexible Electronic Structures
Demonstrates how the Keysight T150 UTM has been successfully utilized to characterize nano/micro-mechanical failure in inorganic thin films on flexible substrates.

Application Note 2012-08-28

PDF PDF 634 KB
Achieve Measurement Accuracy and Flexibility in Your Microwave Test System Ap Note
The application note describes how to enhance measurement accuracy and flexibility in signal analysis by using the M9168C PXI programmable step attenuator module.

Application Note 2012-08-24

Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

Application Note 2012-08-09

PDF PDF 443 KB
EXT Wireless Communications Test Set Non-signaling Test Overview
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

PDF PDF 290 KB
IVI-COM driver and VISA-COM I/O programming examples in Microsoft Visual C# - Application Note
This application note details the installation instructions and Visual C# programming examples for Keysight Technologies IVI-COM instrument drivers and VISA-COM I/O.

Application Note 2012-07-30

PDF PDF 2.37 MB
Quasistatic and Continuous Dynamic Mechanical Behavior of Bicomponent Fibers
Study of the mechanical behavior of polymer fibers

Application Note 2012-07-13

PDF PDF 310 KB
Mapping the Mechanical Properties of Alloyed Magnesium (AZ 61) - Application Note
Overview of using Express Test on the G200 nanoindenter to determine the properties of individual phases within a popular magnesium alloy, AZ 61.

Application Note 2012-07-13

PDF PDF 155 KB
Spectrum and Signal Analysis Pulsed RF Application Note 150-2
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.

Application Note 2012-07-05

Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

Application Note 2012-06-27

PDF PDF 305 KB
Low Voltage Scanning Electron Microscopy: Promises and Challenges - Application Note

Application Note 2012-06-13

PDF PDF 302 KB
Rapid Mechanical Characterization of Low-Dielectric-Constant Films - Application Note
This application note demonstrates the cumulative benefit of CSM and Express Test for Nanoindentation testing for in the semiconductor industry.

Application Note 2012-06-12

PDF PDF 448 KB
Spectrum and Signal Analyzer Measurements and Noise Application Note 1303
Noise is the classical limitation of electronics. In this application note, the characteristics of noise and its direct measurement are discussed in detail.

Application Note 2012-05-04

PDF PDF 2.06 MB
6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note

Application Note 2012-04-30

Comparing the Keysight 34980A and PXI for Switch Measurement Applications
This application note provides a comparison between PXI cardcage solutions and a combined system, the Keysight 34980A switch/measure unit, so you can determine which platform best meets your needs for electronic functional test and data acquisition.

Application Note 2012-04-27

Microwave and Millimeter Signal Measurements: Tools and Best Practices Application Note
Accurate microwave and millimeter frequency signal measurements are important in many applications. This note will help you make the right choices and steps to get accurate, reliable measurements.

Application Note 2012-04-26

Mapping the Mechanical Properties - Application Note
Overview of Mapping mechanical properties of 2205 Duplex Stainless Stell Using the NEW Express Test.

Application Note 2012-04-23

PDF PDF 1.99 MB
Quantitative Surface Potential Measurement Using KFM - Application Note

Application Note 2012-04-20

PDF PDF 360 KB
Rapid Mechanical Characterization of Fiberglass via Express Test - Application Note
Overview of Express Test on G200 used to perform an array of 40x40 indents in order to map the hardness and elastic modulus of a sectioned fiberglass computer board over a 40µm x 40µm area. The 1600 indents were completed in less than 26 minutes.

Application Note 2012-04-02

PDF PDF 529 KB
Determination of Critical Tearing Energy of Polymer Films - Application Note
Overview of critical tearing energy for two commercially available polymer tapes that are measured from trouser-tear tests. The capability of measuring small loads, along with the high force resolution, enabled us to capture the variations in force during tearing of thin polymer films

Application Note 2012-03-22

PDF PDF 167 KB
Tensile Stress-Strain Response of Small Diameter Electrospun Fibers
Overview of characterization of tensile stress-strain behavior of small diameter electrospun fibers of PCL using the Keysight UTM T150

Application Note 2012-03-20

PDF PDF 211 KB
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene: a Kelvin Force Microscopy Study

Application Note 2012-03-13

Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

Application Note 2012-03-05

Making Good Thermocouple Measurements
This application note provides tips for optimizing thermocouple measurements in a noisy environment.

Application Note 2012-01-26

PDF PDF 552 KB
Practical Temperature Measurements (AN-290)
The purpose of this application note is to explore the more common temperature measurement techniques, and introduce procedures for improving their accuracy.

Application Note 2012-01-26

PDF PDF 1.29 MB
Selecting the Correct Temperature Sensor for Your Application
This application note provides tips for selecting the correct temperature sensor.

Application Note 2012-01-25

PDF PDF 543 KB

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