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Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 287 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 98 KB
7500 AFM Applications in Polymer Materials - Application Note

Application Note 2013-09-12

PDF PDF 186 KB
The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
RS-232 Troubleshooting - Application Note
In the course of dealing with personal computers, you may use the RS-232 serial interface. This application note will describe RS-232 at a basic level, with an orientation towards Windows®- based instrument programming.

Application Note 2013-07-31

PDF PDF 111 KB
Configuring Boundary Scan Chains on Keysight x1149 Boundary Scan Analyzer - Application Note
This application note provides the procedure for configuring the boundary scan chain of a board using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-30

PDF PDF 890 KB
Solutions for Testing NFC Devices
Using an accurate, configurable and versatile test bench with qualified test tools to address test challenges throughout the NFC product development cycle

Application Note 2013-07-29

Merging boards on Keysight x1149 Boundary Scan Analyzer – Application Note
This application note shows how to connect two or more boards to form a single boundary scan chain using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-26

PDF PDF 1.85 MB
Achieve Accurate Two Wire Resistance Measurements with the Keysight 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Keysight 34980A and a multiplexer.

Application Note 2013-07-24

Oscilloscope Selection Tip 11: Probing - Application Note
Tip 11: Select an oscilloscope from a vendor that can also provide the variety of specialty probes that you may require.

Application Note 2013-07-24

PDF PDF 638 KB
Overcome PCB Loss, Deliver a Clean Eye to Your DUT Using Multi-tap De-emphasis - Application Brief
This application brief describes how Keysight’s 32 Gb/s Pattern Generator with integrated 5-tap de-emphasis can overcome PCB and connector loss and deliver a clean eye to the DUT.

Application Note 2013-07-16

Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

In Vitro Complex Shear Modulus of Bovine Muscle Tissue - Application Note
Overview of how dynamic instrumented indentation provides a way to measure the mechanical properties of soft biological tissue

Application Note 2013-06-17

PDF PDF 1.09 MB
MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.5 - Application Note
Serial ATA Interoperability Program Revision 1.5 Keysight MOI for SATA RSG Tests

Application Note 2013-06-10

PDF PDF 2.45 MB
Evaluating High-Resolution Oscilloscopes - Application Note
This application note talks about: . How scope ADC bits and bits of resolution differ . Relationship between vertical resolution and noise . How high-resolution mode works . Average mode

Application Note 2013-05-07

Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Keysight TS-5400 Series 3 high performance PXI function test system for multiple devices under test.

Application Note 2013-04-18

PDF PDF 783 KB
Radar Distance Test to Airborne Planes - Application Note
Keysight pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
Tensile Testing of Fibers using Keysight T150 UTM Quasi-static Tensile Test
The Keysight T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers

Application Note 2013-04-08

PDF PDF 188 KB
Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.

Application Note 2013-03-14

Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note
The new N2820A Series high-sensitivity current probes from Keysight Technologies address the need for high-sensitivity current measurements with a wide dynamic range.

Application Note 2013-02-26

E6966A VoLTE Configuration and Sample Files
VoLTE Configuration and Sample Files for Use with E6966A (3.14 MB)

Application Note 2013-02-25

ZIP ZIP 3.15 MB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.

Application Note 2013-01-31

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