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N1810/1/2 Coaxial Switches - Technical Overview
This technical overview describes the N181X coaxial switch series. It includes a description of the many different options available that make the series very versatile. Also included are detailed line drawings and specification tables for each switch.

기술 개요 2016-03-22

8160xx 제품군 튜닝 가능한 레이저 소스 – 데이터시트 (영어)

데이터시트 2016-03-17

81602A 튜닝 가능한 초고전력 레이저 - 데이터시트 (영어)
The 81602A Tunable Laser Source has been designed to explore new application areas in photonic device testing: it sports output power levels beyond 50 mW (+17 dBm) and covers the O-band.

데이터시트 2016-03-17

E1738A Air Temperature/Pressure/Humidity Sensor - Data Sheet
This environmental sensor is used with the Keysight E1736A USB Sensor Hub as part of the 5530 Laser Calibration System.

데이터시트 2016-03-14

RF and RRM Conformance Test System Leads Industry in PTCRB RF LTE 3CA Certification

보도자료 2016-03-13

Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

어플리케이션 노트 2016-03-11

PDF PDF 7.96 MB
Mini In-Circuit Tester - Data Sheet
Keysight Mini In-Circuit Tester is a modular in-circuit test unit fitting a typical 19-inch rack to flexibly complement existing tests in your manufacturing line to increase defects test coverage.

데이터시트 2016-03-07

InfiniiMax III Probing System User's Guide
This is the User Guide / Service Guide for the InfiniiMax III probing system.

사용자 매뉴얼 2016-03-04

PDF PDF 4.53 MB
Benefits of Keysight Bead Probe Technology
Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.

기사 2016-03-03

Demonstrate LTE-A Pro 1Gbps IP Data Throughput with UXM Wireless Test Set at Mobile World Congress

보도자료 2016-03-02

Mini In-Circuit Tester - Application Note
This application note discusses the SCPI commands and the potential use models with the modular Keysight Mini In-Circuit Tester.

어플리케이션 노트 2016-03-02

1130A-Series Differential and Single-Ended Probes User’s Guide
This book provides user and service documentation for the Keysight Technologies 1130A-Series differential and single-ended probes.

사용자 매뉴얼 2016-03-01

PDF PDF 4.49 MB
1168/9A-Series Differential and Single-Ended Probes User’s Guide
Contains all of the user information on the 1168A and 1169A probes and probe heads (including ZIF probe tips, N2887A/N288A, and attenuators/dc blocking caps). It includes all of the impedance and frequency plots for the probe heads.

사용자 매뉴얼 2016-03-01

PDF PDF 7.64 MB
N2839A InfiniiMax II Differential Browser Quick Reference
Describes how to use the browser and accessories and how to replace probe tips.

퀵스타트 가이드 2016-03-01

PDF PDF 327 KB
N5256AW01, N5262AW01-W28, N5256AR01 and N5262AR01-R28 Extension Modules
N5256AW01 and N5262AW01-W15 Transceiver Modules (Tx/Rx) and the N5256AR01 and N5262AR01-R15 Receiver Modules (Rx) are manufactured by Virginia Diodes, Inc. (VDI). The transceiver and receiver modules may be used with the Keysight N5222/24/25/27A PNA or N5242/44/45/47A PNA-X with Options 080 and 400 or 224, or the Keysight N5261/62A Controller to configure a banded millimeter-wave network analyzer system.

사용자 매뉴얼 2016-03-01

PDF PDF 351 KB
U3042AE04 User’s and Service Guide
The Keysight U3042AE04 Multiport Test Set is a 4-Port solid-state extension test set. When combined with a 4-Port PNA, PNA-L, or PNA-X Network Analyzer, the U3042AE04 provides a complete solution for 8-Port full crossbar measurements

사용자 매뉴얼 2016-03-01

PDF PDF 10.30 MB
E6640A EXM Wireless Test Set Getting Started Guide
Getting started information for the E6640A EXM wireless test set.

사용자 매뉴얼 2016-03-01

PDF PDF 4.45 MB
Recommended Probe Configurations for 1168A and 1169A Active Probes
This quick reference card has two sides. Side one shows how to connect the probe to your target system for optimum performance. Side two shows other configurations that may be used but may not provide optimum performance.

퀵스타트 가이드 2016-03-01

PDF PDF 1.22 MB
N2114A & N2115A DDR4 BGA Interposer for Oscilloscopes User Guide
Provides installation information for the Keysight N2114A x4/x8 DDR4 BGA interposer and the N2115A x16 DDR4 BGA interposer.

사용자 매뉴얼 2016-03-01

PDF PDF 5.43 MB
U3047AM08 Multiport Test Set Extension User’s and Service Guide
U3047AM08 is a Multiport Test Set that adds 8 ports to extend the 4-port network analyzer to 12 full crossbar test ports with N-Port calibration capability.

사용자 매뉴얼 2016-03-01

PDF PDF 3.78 MB
N5416A/B USB 2.0 Compliance Test Option, Notes on Electrical Testing
This manual contains notes on the electrical tests that are performed by the USB 2.0 compliance test option; it describes the equipment used, and it describes how the tests are performed.

참조 가이드 2016-03-01

PDF PDF 15.95 MB
How to use AWG measurements to help with PAM-4 implementation
Learn how to use an arbitrary waveform generator and scopes to measure and analyze PAM-4 signals. Elements include transitioning from NRZ to PAM-4 signals, influencing the shape of the eye and the resulting spectral behavior, adding distortions to see receiver response, adding pre-distortion, and embedding your channel.

기본 데모 2016-02-29

USB Type-C™ 케이블 및 커넥터의 호환성과 인증 보장 방법 - 어플리케이션 노트 (영어)
호환성과 인증을 보장하는 동시에 제품에 USB Type-C를 통합하는 것은 어려운 과제입니다. 이 측정 개요는 USB Type-C 케이블 및 커넥터 설계 및 테스트 솔루션에 대해 설명합니다.

어플리케이션 노트 2016-02-29

J-BERT M8020A High-Performance BERT - Data Sheet, Version 3.0
J-BERT M8020A enables fast and accurate receiver characterization of single and multi-lane devices operating up to 16 or 32 Gb/s. M8020A is the first product of the new M8000 Series..

데이터시트 2016-02-25

B1500A Semiconductor Device Analyzer - Data Sheet
The Keysight B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements. Its familiar MS Windows user interface supports Keysight’s new EasyEXPERT software, which provides a new, more intuitive task-oriented approach to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Keysight B1500A can be used for a wide range of semiconductor device characterization needs.

데이터시트 2016-02-25

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