이 페이지를 찾으시나요? 추천 검색 결과 보기:

 

전문가 상담

기술 지원

전자 측정

모델 번호 입력:

76-100 / 5477

정렬방식:
N7015A and N7016A Type-C Test Fixtures - Data Sheet
Keysight's N7015A and N7016A Type-C test fixtures are the industry’s highest-signal-integrity Type-C test fixtures for high-speed differential bus probing.

데이터시트 2016-02-19

PDF PDF 2.22 MB
M8196A 92 GSa/s Arbitrary Waveform Generator - Data Sheet
The Keysight M8196A is the Arbitrary Waveform Generator with the highest sample rate and the widest bandwidth on up to 4 synchronized channels - simultaneously on one module.

데이터시트 2016-02-18

PDF PDF 1.52 MB
Aerospace and Defense ATE Systems Team Brochure

브로셔 2016-02-17

PDF PDF 887 KB
Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint
Early implementation of BST can cut test costs and time.

기사 2016-02-17

PDF PDF 178 KB
When Bandwidth Matters - Brochure
PXA-based Tempest testing is here. Trade-in your VXI-based E3238S solution for the latest Fastbreak PXA-based solution and receive a 10% discount on the new system.

브로셔 2016-02-17

PDF PDF 356 KB
Keysight Technologies, SGS Partner on LTE-Advanced 3DL CA Conformance Test System

보도자료 2016-02-17

PNA Family Microwave Network Analyzers - Configuration Guide
This configuration guide describes standard configurations, options, accessories, upgrade kits and compatible peripherals for the PNA Family microwave network analyzers.

구성 가이드 2016-02-16

PDF PDF 3.26 MB
New IEEE Standards for Board and System Tests - Article Reprint
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

기사 2016-02-16

PDF PDF 190 KB
The Boundary Scan Toolbox - Article Reprint
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

기사 2016-02-16

PDF PDF 409 KB
T4010S Conformance Test System - Technical Overview
The T4010S LTE RF test systems are automated solutions for conformance test and design verification of LTE UE. This document covers key benefits, features, technical specifications and ordering info.

기술 개요 2016-02-16

How to test PCIe 4.0
The spec for PCIe 4.0 (gen4) is not finalized, but testing is still required. See a demonstration of a test solution on an Analog Bits half power SERDES running at 16 Gb/s to help get your PCIe gen4 device running. Calibrated stressed output, ISI, and jitter tolerance tests ready for PCIe 4.0.

기본 데모 2016-02-12

E7515A UXM Wireless Test Set Applications Feature Comparisons
Compare test applications & feature options of the E7515A UXM wireless test set with full RF parametric and functional test coverage for: LTE/LTE-A, W-CDMA/HSPA+, TD-SCDMA/HSPA, & GSM/GPRS/EGPRS.

선택 가이드 2016-02-12

ABCs of Writing a Custom Boundary Scan Test - Article Reprint
This article provides sample vectors and code for expanding test coverage with boundary scan.

기사 2016-02-12

PDF PDF 472 KB
Keysight Type-C Solution: Create a faster path to done

판촉 자료 2016-02-12

PDF PDF 911 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

기사 2016-02-12

PDF PDF 178 KB
Infiniium 90000 X-Series Oscilloscopes - Data Sheet
Keysight Infiniium 90000 X-Series oscilloscopes are engineered for 33 GHz true analog bandwidth that delivers the industry's highest real-time oscilloscope measurement accuracy.

데이터시트 2016-02-11

E6610A Remote Radio Head Tester - Data Sheet
This data sheet provides key performance, dimensions, and application specifications for the E6610A remote radio head one-box tester.

데이터시트 2016-02-10

PDF PDF 1.46 MB
E7515A UXM Wireless Test Set - Configuration Guide
This configuration guide explains the standard items and options available for the E7515A UXM wireless test set.

구성 가이드 2016-02-09

8765A/B/C/D Microwave SPDT Switches - Technical Overview
Primary operator's data sheet for the 8765 family of Microwave SPDT switches. Features description, applications and key product specifications. This black-and-white product overview is 6 pages in length.

데이터시트 2016-02-09

Manufacturing Test Solutions for SSDS - Article Reprint
A new system performs both ICT and boundary scan in high-volume settings.

기사 2016-02-09

PDF PDF 222 KB
87300B,C,D and 87301B,C,D,E Directional Couplers - Technical Overview
This technical overview describes a family of broadband coaxial directional couplers for microwave test interface unit designs and bench top applications.

기술 개요 2016-02-09

UXM Enables General Test Systems Win for China Mobile Terminal Test Center's OTA Project

보도자료 2016-02-09

Tester for Hire - Article Reprint
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

기사 2016-02-09

PDF PDF 381 KB
87406B Coaxial Matrix Switch Product Overview
This 12 page technical overview contains product description,top line specs, and ordering information for high performance multiport switches for microwave and RF instrumentation and systems.

기술 개요 2016-02-09

PDF PDF 1.70 MB
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

기사 2016-02-09

PDF PDF 318 KB

이전 1 2 3 4 5 6 7 8 9 10 ... 다음