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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Seminar Materials 2013-10-22

DesignCon 2014
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

DesignCon 2015
Download Keysight's papers from Technical Conference; Jan 27-29, 2015; Santa Clara Convention Center

Tradeshow

DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

Webcast - recorded

Fundamentals of Fast Pulsed IV Measurement Webcast
Original broadcast January 9, 2014

Webcast - recorded

Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012

Webcast - recorded

IC-CAP User Training
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Classroom Training

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

Webcast - recorded

International Microwave Symposium (IMS) 2015
May 17-22, 2015; Phoenix, AZ

Tradeshow

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EDA Customer Education and Services.

Training Materials 2015-12-07

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Seminar Materials 2012-02-07

PDF PDF 2.51 MB
MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

Seminar Materials 2013-10-22

PDF PDF 1.48 MB
Multiport and Multi-site Test Optimization Techniques Webcast
Original broadcast June 3, 2015

Webcast - recorded

Power Conversion Efficiency Measurement Methods Webcast
Original broadcast November 4, 2015

Webcast - recorded

Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Seminar Materials 2011-06-22

PDF PDF 3.07 MB
Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded

Site Hazard, Safety & Risk Mitigation for Beginning Thermographers Webcast
Original broadcast September 30, 2015

Webcast - recorded

Successfully Make Power and AC Line Disturbance Measurements Webcast
Original broadcast June 25, 2015

Webcast - recorded