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Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Application Note 2017-03-09

PDF PDF 6.24 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

Application Note 2017-03-09

PDF PDF 5.29 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Application Note 2017-03-09

PDF PDF 4.15 MB
x1149 Boundary Scan Solution for Blade Server Board - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-03-02

PDF PDF 6.17 MB
Eye on 802.11ax:What It Is and How to Overcome the Design & Test Challenges It Creates - White Paper
This white paper introduces key technologies of 802.11ax and presents some unique challenges for the engineers designing and testing 802.11ax devices.

Application Note 2017-02-28

PDF PDF 2.52 MB
N437x Lightwave Component Analyzer Automation – Getting Started with SCPI - Application Note
The Keysight N437x Series Lightwave Component Analyzer (LCA) measures the transfer function of electrical to electrical, electrical to optical, optical to electrical, and optical to optical components

Application Note 2017-02-23

PDF PDF 1.81 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

Application Note 2017-02-21

PDF PDF 1.75 MB
Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-02-13

Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2017-01-20

Accelerating Spurious Emission Measurements Using Fast-Sweep Techniques - Application Note
Searching for spurious emissions can be especially difficult and time-consuming. Learn about techniques you can use to optimize and speed your measurements.

Application Note 2017-01-20

Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2017-01-11

NFC-A and -B Sideband Measurements - Application Note
This app note shows how to use FFT peak search on an InfiniiVision X-Series scope to measure the amplitude (power levels) and frequency of NFC sidebands, subcarrier and carrier.

Application Note 2017-01-09

PDF PDF 2.12 MB
NFC Device Turn-on and Debug - Application Note
This app note shows how to use an InfiniiVision scope to trigger on NFC communication, demodulate the captured RF waveform, and perform various parametric measurements on the demodulated waveform.

Application Note 2017-01-09

PDF PDF 1.88 MB
Download latest M8195A AWG application notes - Explore the possibilities in signal generation
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

Application Note 2016-12-09

Download Free Application Notes for new Arbitrary Waveform Generators
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

Application Note 2016-12-08

High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

Application Note 2016-12-08

PDF PDF 1.87 MB
Reduce your test time with a new 4-in-1 pulse generator - download free application notes
Reduce your test time with a new 4-in-1 pulse generator - download free application notes

Application Note 2016-12-07

Propsim Channel Emulator Simulates Characteristics of Real-World Radio Channel Conditions
Real world wireless propagation in laboratory with Propsim

Application Note 2016-12-06

PDF PDF 564 KB
New Strategies for Managing Wireless System Complexities in the Connected Car - Application Note
Application Note highlights several development challenges that arise from the implementation of complex vehicle wireless systems and how the automotive industry can easily adopt test methodologies used in new strategies for managing wireless system complexities in the connected car

Application Note 2016-11-15

QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.

Application Note 2016-11-09

PDF PDF 989 KB
Spectrum Analysis Basics - Application Note
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-11-02

Impedance Measurement Handbook - 6th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2016-11-02

In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500

Application Note 2016-10-11

PDF PDF 1.13 MB
Battery Drain Analysis for Low Power IoT Devices - Application Note
Covers several Keysight battery drain analysis solutions. Includes 34470 DMM, N6701 DC power analyzer & N6781 SMU, N2820 current probe, the B2900 SMU, and CX3300 device current waveform analyzer.

Application Note 2016-09-06

Transient Optical Power Measurements with the N774x-Series Multiport Power Meter - Application Note
This note describes the details for making time-dependent measurements of optical power levels, for applications like testing transients and determining switching times.

Application Note 2016-08-31

PDF PDF 1.45 MB

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