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Brittle-to-Ductile Plasticity Transition Behavior Study of Si by High-Temperature Nanoindentation
Nanomechanical response of single crystal silicon at various temperatures were studied using elevated temperature nanoindentation with Keysight G200 laser heater system.

Application Note 2017-08-21

PDF PDF 657 KB
Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

Application Note 2017-08-21

PDF PDF 5.16 MB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

Application Note 2017-08-18

PDF PDF 4.22 MB
Narrowband IoT (NB-IoT): Cellular Technology for the Hyperconnected IoT - Application Note
This paper explains the underlying reasons why this technology is shaped as it is today and explore the challenges in adopting this new application and explains the new ways of securely roll out NB-IoT application quickly to market.

Application Note 2017-08-08

High-Temperature Nanoindentation on Pure Titanium (Ti) - Application Note
High-temperature mechanical properties of Pure Titanium was successfully tested by G200 Nano Indenter Laser Heater over a range of temperature from ambient to 500°C.

Application Note 2017-07-31

PDF PDF 524 KB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note
This application note provides some key guidelines to enable good design for testability using boundary scan.

Application Note 2017-07-31

PDF PDF 1.38 MB
Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2017-07-13

Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

Application Note 2017-07-05

PDF PDF 2.47 MB
Optical Signal Measurements Using A Real-Time Oscilloscope - Application Note
If your application includes a repetitive waveform that requires lower noise, jitter and a higher dynamic range, a sampling oscilloscope is a good choice.

Application Note 2017-06-27

PDF PDF 907 KB
Medalist i3070 Test Throughput Optimization - Application Note
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2017-06-16

AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

Application Note 2017-06-15

PDF PDF 3.96 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

Application Note 2017-06-12

PDF PDF 8.01 MB
Critical Test Parameters of NB-IoT, Test Challenges and Keysight Solution - Application Note
This application note describes some of the most relevant features of NB-IoT, which make it a strong candidate among the different Low Power Wide Area Network (LPWAN) options through use of Internet of Things.

Application Note 2017-06-05

BenchVue Software as an Educational Tool - Application Note
Discover how BenchVue software is a powerful tool for instructional laboratories, as well as for instructors.

Application Note 2017-05-19

Using BenchVue Software’s Test Flow Application to Characterize Transistors - Application Note
This application note shows how to make a simple transistor curve tracer using a Keysight B2962A power source along with a Test Flow sequence running in Keysight’s BenchVue software.

Application Note 2017-05-16

Achieve Accurate Resistance Measurements with the Keysight 34980A Multifunction Switch Measure Unit
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Keysight 34980A

Application Note 2017-05-16

Achieving Metrology-grade Results in Vector Network Analysis at Millimeter-wave Frequencies
Millimeter-wave expertise and new solution for design, simulation, test and analysis in millimeter wave frequencies.

Application Note 2017-05-12

Decoding NFC-F Communication Based on Manchester-encoded ASK Modulation - Application Note
See step-by-step instructions on how to setup oscilloscopes to properly decode and trigger on NFC-F poller and listener communication for two specific cases.

Application Note 2017-04-28

PDF PDF 2.27 MB
Basic Oscilloscope Fundamentals - Application Note
This application note provides an overview of basic oscilloscope fundamentals. You will learn what an oscilloscope is and how to use oscilloscopes.

Application Note 2017-04-25

Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Application Note 2017-04-18

PDF PDF 1.80 MB
eCall/ERA-GLONASS Conformance Testing with Keysight E6950A - Application Note
This application note discusses how designers can use the Keysight eCall test setup to emulate the various elements of a real eCall environment comprising GPS, automobile, cellular network and PSAP.

Application Note 2017-04-12

EMI Troubleshooting: The Need for Close Field Probes - Application Note
This application note introduces close field probes and explains how specific probes offer distinct advantages in electromagnetic compatibility (EMC) radiated emission pre-compliance test.

Application Note 2017-04-03

Understanding the Differences Between Oscilloscopes and Digitizers for Wideband Signal Acquisitions
This white paper compares the use of oscilloscopes and wideband digitizers for wideband signal applications.

Application Note 2017-03-30

PDF PDF 6.16 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Application Note 2017-03-09

PDF PDF 4.15 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Application Note 2017-03-09

PDF PDF 6.24 MB

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