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Electronic Measurement

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Creep Activation Energy of SAC305 Using Nano-Indentation - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Application Note 2015-01-22

PDF PDF 292 KB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2015-01-19

PDF PDF 1.17 MB
A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Application Note 2015-01-17

PDF PDF 1.92 MB
Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Application Note 2015-01-11

PDF PDF 607 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Application Note 2015-01-11

PDF PDF 1.02 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Application Note 2015-01-07

PDF PDF 7.95 MB
Mechanical Properties Measurement on Individual Composite Micro-Fibers - Application Brief
Study of characterization of mechanical properties of bicomponent micro-fibers, consisting of nylon 6 nano-islands in a PET sea, under tensile loading.

Application Note 2014-12-29

PDF PDF 495 KB
Mechanical Characterization of Sol Gel Coatings Using a Nano Indenter G200 - Application Note
A case study on Nanomechanical Characterization of Sol Gel Coatings.

Application Note 2014-12-29

PDF PDF 1.33 MB
Evaluating Oscilloscope Bandwidths for Your Application - Application Note
How much bandwidth does your oscilloscope really need? Learn how to choose the correct bandwidth oscilloscope for your application.

Application Note 2014-12-19

Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence.

Application Note 2014-12-18

PDF PDF 610 KB
Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2014-12-17

Lithium/Polymer Battery Mapping-Express Test - Application Note
Investigation of the the mechanical properties of a lithium rechargeable battery cathode by using both the classic XP CSM and the new DCM Express Test method.

Application Note 2014-12-16

PDF PDF 1.90 MB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2014-12-16

PDF PDF 2.06 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-12-16

Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

Application Note 2014-12-15

PDF PDF 4.11 MB
SMM Imaging of Dopant Structures of Semiconductor Devices - Application Note

Application Note 2014-12-10

PDF PDF 2.33 MB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

Application Note 2014-12-08

PDF PDF 329 KB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

Application Note 2014-12-08

PDF PDF 742 KB
Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2014-12-05

Scanning Microwave Microscope Mode - Application Note

Application Note 2014-12-04

PDF PDF 320 KB
Rapid Characterization of Elastic Modulus - Application Note
Overview of Express Test Option for G200 NanoIndenter and how it increases instrument productivity by more than two orders of magnitude with ultra-fast indentation.

Application Note 2014-11-07

PDF PDF 166 KB
Preamplifiers and System Noise Figure
Learn how to reduce the noise figure of RF & MW test systems using a low noise amplifier

Application Note 2014-11-07

TS-8989 PXI Functional Test System - System Integration Guide - Application Note
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2014-11-06

PDF PDF 611 KB
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical -AppNote
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

Application Note 2014-09-22

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