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Electronic Measurement

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Materials Measurement: Dielectric Materials - Application Brief
This application brief provides the solutions for measuring dielectric materials.

Application Note 2014-07-17

PDF PDF 935 KB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2014-05-28

Measuring Dielectric Properties using Keysight's Materials Measurement Solutions - Brochure
Quick guide for Keysight materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.

Brochure 2014-05-16

PDF PDF 478 KB
Accessories Selection Guide For Impedance Measurements - Selection Guide
This selection guide introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers.

Selection Guide 2014-01-24

16453A Dielectric Material Test Fixture Specification and Service Manual
16453A Dielectric Material Test Fixture Specification and Service Manual

User Manual 2001-11-15

New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.

Application Note 2001-05-24

Evaluating Temperature Characteristics using a Temperature Chamber and the Keysight 4291B (PN 4291-2)
This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber.

Application Note 2000-11-01