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34945A, L4445A and L4490A/L4491A - Configuration Guide
Introduction of the Keysight 34945A, L4445A, and L4490A/L4491A family of RF/Microwave switching instrument features, and assists in the three step process of selecting and configuring the systems.

Configuration Guide 2014-05-14

Test Instrument Emulator - WinSoft
Test Instrument Emulation Solution from WinSoft and Keysight.

Solution Brief 2014-05-14

PXI Functional Test - TTCI
PXI Functional Test Solution from TTCI and Keysight.

Solution Brief 2014-05-14

Open Test Platform - LXinstruments
LXI Functional Test Solutions from LXinstruments and Keysight.

Solution Brief 2014-04-30

ECN article: Remote Wireless Test With LXI
Article reprinted with approval from ECN magazine.

Article 2014-04-07

LXI Instrumentation applied to bioanalytical electrical characterization

Article 2014-04-07

Optimize burn-in test with the Keysight 34980A multifunction switch/measure unit apnote overview
This application overview will discuss the complexities of burn-in test based on the Keysight 340980A switch/measure unit

Application Note 2013-01-31

PDF PDF 440 KB
Test-System Development Guide: A Comprehensive Handbook for Test Engineers
Test-System Development Guide

Application Note 2012-05-07

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note

Application Note 2012-04-30

LXI Press Releases

Press Materials 2010-03-16

Getting Test Programs Up and Running Quickly with Driver Tracing and I/O Monitor
This note helps you create an example program and then shows you how to use driver tracing and IO Monitor to examine, verify and troubleshoot I/O activity in IVI-COM drivers.

Application Note 2009-05-05

Using IVI For Your Instrument Driver - Application Note
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31)
This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems.

Application Note 2008-02-19

The Next Generation of Test: An LXI Overview

Promotional Materials 2007-11-13

PDF PDF 1.89 MB
LXI Test System Provides Flexibility for Testing Automobile Antenna Amplifiers

Application Note 2007-10-30

PDF PDF 213 KB
Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28)
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

Application Note 2007-07-08

Using Linux To Control LXI Instruments Through TCP (AN 1465-29)
TCP is one of two alternative protocols used by most LAN-based instruments. It is the more elegant from a programming standpoint. This application note explains how instrument control works through TCP.

Application Note 2007-06-13

Modifying a GPIB System to Include LAN/LXI (AN 1465-26)
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.

Application Note 2007-05-10

Using Linux in Your Test Systems: Linux Basics (AN 1465-27)
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.

Application Note 2007-05-08

Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

PDF PDF 390 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

Using Synthetic Instruments in Your Test System (AN 1465-24)
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Application Note 2006-08-28

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