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SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

Article 2017-05-04

Model Builder Program (MBP)
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2017-04-27

PDF PDF 907 KB
Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2017-04-25

PDF PDF 3.12 MB
Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2017-04-04

Global Device Modeling Services - Brochure
Keysight Technologies' Device Modeling Services delivers accurate device parameters rapidly for your advanced devices.

Brochure 2017-03-16

PDF PDF 1.59 MB
Python Programming integration with IC-CAP
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

Article 2017-03-16

WaferPro Express Software
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2017-02-22

PDF PDF 2.75 MB
Why Device Modeling Services?
IC design stands on the shoulders of device modeling and characterization.

Article 2017-02-03

N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

Data Sheet 2017-01-25

PDF PDF 1008 KB
Keysight EEsof EDA Premier Communications Design Software
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2017-01-24

PDF PDF 2.54 MB
Transconductance Modeling for Low-Power Design
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

Journal 2017-01-18

Device Modeling 101 - What are Ft and Fmax?
Ft and Fmax are figures of merit used to benchmark the high frequency performance of RF transistors. This blog post describes the equations for these 2 parameters and how to improve the performance of RF transistors.

Journal 2016-12-18

Device Modeling 101 - How to Extract Threshold Voltage of MOSFETs
Threshold voltage (Vth) is one of the most important electrical parameters in MOSFET modeling. Learn how to extract Vth using MBP.

Journal 2016-11-17

The High-Frequency, High Speed Design Revolution: Why Your Design & Test Flow Will Soon Be Obsolete
In this keynote from EDI CON USA 2016, Todd Cutler, vice president and general manager of Keysight Design & Test Software, discusses these trends and explains how, when coupled with market pressures, they are driving a revolution in the design and measurement industry.

Demo 2016-10-11

Unlocking Millimeter Wave Insights
It is easy to underestimate the challenges at millimeter-wave frequencies, and this amplifies the importance of integrated tools for design, simulation, measurement, and analysis. Learn more about how Keysight is taking the mystique out of millimeter waves and unlocking new insights.

Demo 2016-09-30

Advanced Low-Frequency Noise Analyzer Overview
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

Product Tour 2016-08-29

Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

Press Materials 2016-08-04

Low Frequency Noise Analyzer Technical Demo
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

Demo 2016-07-20

Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

Press Materials 2016-07-19

Introducing the 2016 Advanced Low-Frequency Noise Analyzer
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

Demo 2016-07-18

Follow Keysight EEsof EDA on Twitter!
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2016-07-14

Low-Frequency Noise Measurements with the E4727A and Their Applications
This application note covers noise basics (1/f and white), applications of noise measurements and analysis, and how noise measurement challenges are addressed by the E4727A A-LFNA.

Application Note 2016-04-28

PDF PDF 2.39 MB
Keysight Announces Strategic Collaboration with San'an-IC to Release PDKs for HBT, pHEMT Processes
Keysight announces that it has signed a memorandum of understanding (MoU) with Xiamen San'an Integrated Circuit Co. Ltd. (San'an-IC) to collaborate on an advanced process design kits (PDKs) for its HBT and pHEMT processes based on Advanced Design System (ADS) software.

Press Materials 2016-04-22

How to Accurately Measure and Validate S-Parameters for Transistor Modeling
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

How-To Video 2016-04-04

Enabling Noise Measurements on Magnetic Sensors
This document describes how to use the Keysight E4727A Advanced Low-Frequency Noise Analyzer to simplify noise measurements on magnetic sensors.

Application Note 2016-03-24

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