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Electronic Measurement

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E6650A EXF One-Box Tester Scales with Volume Growth, Lowers Cost of Test in Femtocell Mfg
Keysight announces the E6650A EXF wireless test set, the industry's first one-box tester dedicated to femtocell manufacturing. Delivering speed, performance and scalability needed to ramp up production and lower the cost of test. Validation with the latest cellular and WLAN chipsets reduces start-up time.

Press Materials 2014-10-21

UXM wireless test set expands functional test capabilities, delivers greater RF design confidence

Press Materials 2014-10-01

Keysight Technologies announces expanded TRX module and EXM wireless test set enhancements
Keysight Technologies Announces Expanded TRX Module and EXM Wireless Test Set Enhancements

Press Materials 2014-10-01

M8195A 65GSa/s AWG – Press Release
Introduces 65-GSa/s High-Speed Arbitrary Waveform Generator

Press Materials 2014-09-12

UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development
UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development

Press Materials 2014-08-04

Certification of HDMI 2.0 Test Solution
Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

E6640A EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

Press Materials 2014-02-13

Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices
Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices

Press Materials 2014-02-13

Agilent Technologies Introduces HDMI 2.0 Compliance Test Software for Transmitters and Receivers
Agilent Technologies Inc. (NYSE: A) today introduced two compliance test software packages for physical-layer testing of devices that use the new High-Definition Multimedia Interface (HDMI) 2.0 specification.

Press Materials 2014-01-14

Agilent Extends the Reach of Signal Generators and Analyzers

Press Materials 2013-09-04

Press Releases for N4903B
Press Releases for N4903B

Press Materials 2013-07-16

Press Releases for M8061A
Press Releases for M8061A

Press Materials 2013-07-16

Press Releases for N4877A
Press Releases for N4877A

Press Materials 2013-07-16

Press Releases for N5990A
Press Releases for N5990A

Press Materials 2013-07-04

Agilent Technologies and Percello joint press release
Agilent Technologies Supports Percello's Femtocell SoCs Test with Chipset Software

Press Materials 2013-05-31

Press Releases for 81250
Press Releases for 81250

Press Materials 2013-05-09

Press Releases for N2101B
Press Releases for N2101B

Press Materials 2013-05-06

Press Releases for N4916B
Press Releases for N4916B

Press Materials 2013-05-06

Press Releases for N4916A
Press Releases for N4916A

Press Materials 2013-05-06

Press Releases for N4876A
Press Releases for N4876A

Press Materials 2013-05-06

Press Releases for N4917A
Press Releases for N4917A

Press Materials 2013-05-06

Introduces High-Sensitivity Multiport Optical Power Meters
Meters Combine Highest Optical Performance and Large Data Storage in Compact Platform

Press Materials 2013-04-24

Agilent Technologies Updates Reference-Class Multiwavelength Meter
Extended Recalibration Intervals Reduce Downtime and Cost of Ownership

Press Materials 2013-04-24

Agilent Technologies to Showcase Bit Error Ratio Tester at OFC/NFOEC
New Options Enable 32-Gb/s ASIC Component and Optical Transceiver Designs

Press Materials 2013-04-24

Press Releases for N4960A
Press Releases for N4960A

Press Materials 2013-03-14

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