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RF PA/FEM Characterization and Test, Reference Solution – Brochure
This brochure describes the hardware, software and services components of the RF PA/FEM characterization & test, Reference Solution

Brochure 2014-09-15

PDF PDF 2.48 MB
Automotive Radar Test - Konrad
Automotive Radar Test Solution from Konrad and Keysight.

Solution Brief 2014-04-30

Modular Functional Test – Circuit Check
Modular Functional Test Solutions from Circuit Check and Keysight

Solution Brief 2014-04-16

M9381A & M9391A PXIe Vector Signal Generator - Configuration Guide
This document provides information for configuring solutions for RF test based on the M9391A PXIe VSA and M9381A PXIe VSG.

Configuration Guide 2014-04-03

PDF PDF 1.25 MB
M9380A PXIe CW Source - Configuration Guide
This configuration guide provides instructions to help you configure the M9380A PXIe CW Source and expand the system to meet your requirements. Product upgrades, related products and physical connection schematics are also featured.

Configuration Guide 2014-03-20

PDF PDF 3.23 MB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560)

Application Note 2005-07-27

Blazingly Fast Compact Power Supply Reduces Test Time
Power supplies are often one of the last pieces of equipment given consideration when designing a test system. Yet there are power supplies on the market today that can significantly help reduce the cost of test.

Brochure 2005-02-07

Innovative Power Supplies Save Rack Space
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)

Application Note 2004-10-22

Increase Automotive ECU Test Throughput (AN 1505)

Application Note 2004-10-22

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)

Application Note 2004-10-22

How to use the Keysight N6700 Modular Power System to replace a Keysight 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to a Keysight N6700.

Application Note 2004-08-02

Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434) - Application Note
This 15-page application note presents methods and techniques to decrease setup time and test time.

Application Note 2002-11-22

Testing Uninterruptible Power Supplies Using Keysight 6800 Series ac Power Source/Analyzers
This Product Note describes how Keysight ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection.

Application Note 2001-01-16

PDF PDF 430 KB
Increasing dc Power Supply Test System Throughput
This Product Note describes some of the ways this new family of electronic loads can be used to achieve maximum throughput for your dc power supply test system.

Application Note 2000-05-01

PDF PDF 157 KB
10 Hints for Using Your Power Supply to Decrease Test Time - Application Note
Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet...

Application Note 1999-10-12