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Download the latest 81160A Application Notes
Reduce your test time with a new 4-in-1 pulse generator - download free application notes

Application Note 2015-08-23

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2015-08-14

Optimize Power Source Integrity Under Large Load Transients - Application Note
This application note discusses several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.

Application Note 2015-07-31

81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note
The Keysight 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Application Note 2015-06-18

Evaluating Battery Run-Down with the N6781A 2-Quadrant Source/Measure Unit and the 14585A
This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device.

Application Note 2015-05-29

A Flexible Test Solution for 2.4 GHz ZigBee Transmitter and Receivers - Application Note
This application note explains a low cost measurement solution for 2.4 GHz ZigBee O-QPSK signal generation for receiver test and signal analysis for transmitter test

Application Note 2015-04-17

A Flexible Test Solution for Internet of things (IoT) devices with ASK/FSK Modulation - App Note
Use Keysight’s basic RF instruments to measure and analyze ASK/FSK modulated signals commonly used in a variety of products and systems, ranging from personal consumer electronics and automatic meter reading, to giant industrial devices.

Application Note 2015-04-09

Testing New-Generation WLAN 802.11ac - Application Note
This application note introduces the new WLAN new-generation testing technology of 802.11ac and the many different Keysight solutions for testing WLAN 802.11ac.

Application Note 2015-04-01

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Application Note 2015-02-23

Using a Function/Arbitrary Waveform Generator to Generate Pulses - Application Note
A Function Generator can be a low cost alternative for creating simple pulses. This application note describes several techniques for creating pulses using a Function Generator.

Application Note 2015-02-19

Highly Stable & Clean Outputs Give Current/Voltage Sources the World’s Best Performance
This application brief explains how useful the B2960A Series is for Physics, Chemistry & Biotechnology Evaluation.

Application Note 2015-02-12

High Speed Current/Voltage Source Simplifies Electronic Circuit Final Verification/Validation/Debug
This application brief explains how the B2960A Series simplifies Electronic Circuit Final Verification, Validation & Debug.

Application Note 2015-02-04

Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Application Note 2015-01-23

How to Perform QSCV (Quasi-Static Capacitance Voltage) Measurement - Application Note
This application note explains how to perform QSCV (quasi-static capacitance voltage) measurement using Keysight B1500A semiconductor device analyzer.

Application Note 2015-01-23

Low-Dropout (LDO) Linear Regulator Evaluation - Product Fact Sheet
This 2-pager describes "Quick Bench-top Evaluation" of an LDO linear regulator and shows real measurement results made by B2900A series.

Application Note 2014-11-10

Electronic Warfare Signal Generation: Technologies and Methods - Application Note
This application note provides an overview of multi-emitter simulations. Vital to accurate testing, however, when performed with large, custom test systems in the verification stage, problems can remain undiscovered until later in the design phase. Leading to delays, design rework, and solutions that are not well-optimized.

Application Note 2014-10-02

Overcome Your Test Challenges with the 33600A Series Trueform Waveform Generators - Application Note
Compendium of six 33600A Series Trueform waveform generator test challenge application briefs.

Application Note 2014-10-02

Download latest M8195A AWG application notes
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

Application Note 2014-09-22

LTE-Advanced: Technology and Test Challenges 3GPP Releases 10, 11, 12 and Beyond - Application Note
This application note summarizes the ITU requirements for 4G and the 3GPP requirements for LTE-Advanced, including the expected timeline. Key solution proposals for LTE-Advanced are also presented with a look at Release 10 and beyond. Lastly anticipated design and test challenges are addressed.

Application Note 2014-09-01

Constant mode of programmable output resistance function
This application note describes how to use the constant mode of programmable output resistance function featured in B2961A/62A with some application examples.

Application Note 2014-08-31

VI emulation mode of programmable output resistance function
This application note describes how to use the VI emulation mode of programmable output resistance function featured in B2961A/62A with some application examples.

Application Note 2014-08-31

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

Conquering the Multi Kilowatt Source/Sink Test Challenge - Application Note
This application note discusses how the Keysight APS N6900/N7900 DC power supplies feature integrated sourcing and sinking capability tailored for the test needs of today’s bidirectional and regenerative energy systems and devices.

Application Note 2014-08-03

Using Flexible Digital Modulation Testing for Satellite Regenerative Payloads - Application Note
This application note focuses on solutions for the issues that create risks in the integration of mixed-signal systems with a mix of software and hardware tools. Examples focus on measurements of error vector magnitude (EVM), which is a key figure of merit for modulated signals implemented in either analog or digital form.

Application Note 2014-08-01

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