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Electronic Measurement

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Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Wideband Digital Pre-Distortion with Keysight SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

IGBT Sense Emitter Current Measurement Using the Agilent B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2014-05-27

PDF PDF 201 KB
Internal Gate Resistance Measurement Using the Agilent B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2014-05-27

PDF PDF 246 KB
Thyristor Characterization Using the Agilent B1505A - Application Note
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2014-05-19

PDF PDF 347 KB
Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Application Note 2014-04-30

Download latest J-BERT M8020A application notes to master your designs
Submit the form to begin downloading the application briefs

Application Note 2014-04-09

Envelope Tracking and Digital Pre-Distortion PA Testing for LTE User Terminal Components - App Note
This application note discusses measurement solutions for power amplifier testing using Envelope Tracking (ET) and lookup table (LUT)-based DPD.

Application Note 2014-03-07

PDF PDF 3.73 MB
Generating Looped Test Patterns or PRBS Signals with a Preamble - Application Note
This paper explains how to setup a test pattern with a preamble, which is played once e. g. to bring the tested device into a test mode, and the test data, played several times to test for errors.

Application Note 2014-03-04

PDF PDF 1.10 MB
IV Characterizations of Solar Cells Using the Keysight B2900A Series of SMUs - Technical Overview
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Application Note 2014-02-10

Download the latest AWG Application Notes
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

Application Note 2014-02-10

Performing a Precision ADC Evaluation Using a Low Noise DC Source - Application Note
This 6-page application note introduces the Keysight B2962A 6.5 Digit Low Noise Power Source which is suitable for the application requiring low noise power supply such as ADC Evaluation.

Application Note 2014-01-28

PDF PDF 733 KB
Ultra-Low Noise Filter Minimizes B2961A/62A Power Source Noise Density - Application Brief
This 2-page Application Brief introduces N1294A-021 Ultra Low Noise Filter which is suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

Application Note 2014-01-27

PDF PDF 698 KB
Low Noise Filter Improves B2961A/62A Power Source Noise Performance - Application Brief
This 2-page application brief introduces N1294A-022 Low Noise Filter which enables the B2961A/62A to source clean voltage equivalent to that of much costlier precision linear voltage/current source instruments.

Application Note 2014-01-24

PDF PDF 543 KB
Addressing Your Power Test Challenges with VersaPower Architecture - Application Note
This paper discusses the structure of VersaPower power architecture and explores how it can help overcome the toughest power test challenges.

Application Note 2013-12-12

Cost Effective Design Verification Test of 802.11ac Wireless Transmitters and Receivers - App Note
This application brief highlights ways to use the M9391A PXIe VSA and 89600 VSA software with the M9381A PXIe VSG to address wide bandwidth, multi-channel testing needs for WLAN 802.11ac.

Application Note 2013-11-20

Increase Power Amplifier Test Throughput with the Keysight M9381A PXIe Vector Signal Generator
An application note with programming instructions on how to accelerate power amplifier test throughput with the fast Keysight M9381A PXIe Vector Signal Generator and achieve cost reductions in test while maintaining high test quality.

Application Note 2013-11-19

PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems - Application Note
The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools

Application Note 2013-11-05

PDF PDF 3.47 MB
Testing WLAN Devices According to the 802.11x Standards - Application Note
This application note provides a survey of transmitter/receiver test requirements for 802.11a, b, g, n, ac. It also presents an overview of Keysight’s solutions for WLAN testing.

Application Note 2013-10-21

Easily Create Custom Waveforms with Waveform Creator - Application Note
This application note provides instructions for how to create custom waveform plug-ins using the M9099 Waveform Creator application software

Application Note 2013-10-01

PDF PDF 593 KB
GaN Current Collapse Effect Evaluation Using the B1505A – Application Brief
This document outlines how the B1505A with the N1267A High Voltage Source Monitor Unit/High Current Source Monitor Unit Fast Switch can be used to solve GaN current collapse measurement challenges.

Application Note 2013-09-30

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
DC-DC Converter Evaluation - Flyer
This 1-pager describes "Quick Bench-top Evaluation" of DC-DC converter and shows real measurement results of DC and transient tests made by B2900A series.

Application Note 2013-08-29

PDF PDF 1.04 MB
Optimize Transceiver Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application brief provides key issues and recommended solutions for increasing the speed of transceiver test.

Application Note 2013-08-27

PDF PDF 1.10 MB

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