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E6640A EXM Wireless Test Set - Configuration Guide
This configuration guide explains how to order or upgrade the E6640A EXM wireless test set, enabling you to scale the test solution to ramp up rapidly and optimize full-volume manufacturing.

Configuration Guide 2014-06-25

E6703I W-CDMA/HSPA Lab Application - Technical Overview
This technical overview provides the technical specifications and highlights the key capabilities of the E6703I W-CDMA/HSPA lab application.

Technical Overview 2014-05-19

E1963A W-CDMA Mobile Test Application - Technical Overview
This technical overview provides key capabilities and specifications for the E1963A W-CDMA mobile test application.

Technical Overview 2014-05-19

Agilent’s EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

Press Materials 2014-02-13

E6568E 2G/3G/LTE Wireless Test Manager - Technical Overview
The E6568E wireless test manager helps automate test development for 2G/3G/LTE devices.

Technical Overview 2012-08-21

Accelerate the Development of Wireless Device Tests with Automated Test Development and Support
This brochure explains how the Keysight Wireless Test Manager products make it easy it to automate test development, expedite time-to-market for wireless devices, and reduce test costs.

Brochure 2012-08-13

PDF PDF 912 KB
EXT Wireless Communications Test Set Non-signaling Test Overview
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

PDF PDF 290 KB
Greater insight. Greater confidence. Accelerate next-generation wireless - Brochure
This brochure speaks to Keysight's Cellular from products, to experts to knowledge library and how Keysight gives you greater insight and greater confidence into Cellular.

Brochure 2012-05-31

PDF PDF 1.37 MB
N5882A W-CDMA Enhanced Wireless Test Manager - Product Overview
Describes test automation software that complements Keysight’s W-CDMA lab applications

Technical Overview 2009-01-20

Testing Video Call Capabilities of W-CDMA User Equipment (R&D only) - Application Note
Learn how to use Keysight solutions to reliably test video capabilities of W-CDMA user equipment.

Application Note 2008-08-12

Fast Device Tune Measurement Solution for Calibrating W-CDMA Mobile Phones - Application Note
Learn how Keysight’s Fast Device Tune measurement minimizes calibration test time.

Application Note 2008-07-29

GSM/W-CDMA SMS Testing with Keysight Wireless Test Managers
This application note explains how to install two QFEs and how to implement GSM or W-CDMA SMS test with WTM.

Application Note 2008-01-11

E6832A W-CDMA Calibration Application - Data Sheet
This data sheet provides information about the performance of the E6832A application.

Data Sheet 2007-12-06

PDF PDF 145 KB
Evaluating data transfer in HSDPA/W-CDMA nets
Published with permission from Global Sources October 2007

Article 2007-10-15

PDF PDF 2.84 MB
Customizing the E656XC/N588XA Wireless Test Manager - Application Note
This document shows how to use the WTM program to perform extra test procedures and implement some of the program’s advanced capabilities.

Application Note 2007-07-30

Testing Mobile Station Cell Transitions and Handovers (R&D only) - Application Note
Discover how to use two 8960 test sets and GSM/GPRS/EGPRS or W-CDMA/HSDPA lab applications to test a mobile station's behavior while transitioning to a different cell via a handover or cell selection/reselection procedures.

Application Note 2007-05-23

Fast Device Tune Measurement Solution for Calibrating W-CDMA Mobile Phones
Discover how the Fast Device Tune measurement and the E6601A test set can significantly reduce calibration test time during wireless device manufacturing.

Application Note 2007-03-28

Testing Data Throughput of Wireless Devices (R&D only) - Application Note
The 8960 Wireless Communications Test Set from Keysight Technologies features a data throughput monitor to be used by designers during the R&D process.

Application Note 2006-12-21

Embedded Automation with the E6601A Wireless Communications Test Set Application Note
This application note demonstrates how to use the built-in capability of the E6601A test set to develop a simple program for automated testing.

Application Note 2006-09-01

Applications Testing with the Keysight 8960 Series 10 Wireless Test Set (R&D only) - Application Note
The 8960 (E5515C) and Keysight lab applications help you throroughly test to current technology standards.

Application Note 2006-03-27

Multi-mode Handset Manufacturing Challenges and Solutions - Application Note
This application note explains the characteristics that make multi-mode user equipment difficult to test, and provides solutions to streamline UE testing while ensuring conformance to industry standards.

Application Note 2005-11-16

How Digitally Generated Faded Signals Reduce Cost of Test (R&D only) - Application Note
Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns.

Application Note 2005-08-15

RF Parametric and Functional Test for Wireless Designs (R&D only) - Brochure
Highlights Keysight’s solutions for complete RF parametric and functional testing of wireless devices throughout the R&D cycle.

Brochure 2005-07-11

PDF PDF 92 KB
Performing W-CDMA Tx Dynamic Power Measurements Using the 8960 - Product Note
This paper illustrates how to use the Tx dynamic power measurement to measure W-CDMA UE power sequences.

Application Note 2005-06-15

PDF PDF 167 KB
W-CDMA Dynamic Power Analysis Using the 8960 - Product Note
This product note illustrates how to use the Dynamic Power Analysis measurement in the Keysight 8960 test set to measure user equipment (UE) power sequences.

Application Note 2005-03-22

PDF PDF 153 KB