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Electronic Measurement

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M9393A PXIe Performance Vector Signal Analyzer - Data Sheet
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Data Sheet 2014-09-17

PDF PDF 2.46 MB
RF PA/FEM Characterization and Test, Reference Solution – Brochure
This brochure describes the hardware, software and services components of the RF PA/FEM characterization & test, Reference Solution

Brochure 2014-09-15

PDF PDF 2.48 MB
M9393A PXIe Performance Vector Signal Analyzer - Configuration Guide
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Configuration Guide 2014-08-04

PDF PDF 3.04 MB
Automotive Radar Test - Konrad
Automotive Radar Test Solution from Konrad and Keysight.

Solution Brief 2014-04-30

M9072A cdma2000/cdmaOne X-Series Measurement Application for PXIe Vector Signal Anlayzer
This document provides technical and other information related to the cdma2000/cdmaOne X-Series measurement application for modular instruments.

Technical Overview 2014-04-07

PDF PDF 4.09 MB
M9381A & M9391A PXIe Vector Signal Generator - Configuration Guide
This document provides information for configuring solutions for RF test based on the M9391A PXIe VSA and M9381A PXIe VSG.

Configuration Guide 2014-04-03

PDF PDF 1.25 MB
M9393A PXIe Performance Vector Signal Analyzer - Flyer
This document provides the features, benefits and performance characteristics for the M9393A PXIe performance vector signal analyzer.

Brochure 2014-02-20

PDF PDF 595 KB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
Replacing the Keysight 34401A with the New 34410A/34411A High Performance Digital Multimeters
This application note provides a high level overview of the differences between the Keysight 34401A 6 1/2 Digit Digital Multimeter and the new Keysight 34410A and 34411A 6 1/2 Digit High Performance DMMs.

Application Note 2005-11-15

N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560)

Application Note 2005-07-27

Blazingly Fast Compact Power Supply Reduces Test Time
Power supplies are often one of the last pieces of equipment given consideration when designing a test system. Yet there are power supplies on the market today that can significantly help reduce the cost of test.

Brochure 2005-02-07

Innovative Power Supplies Save Rack Space
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)

Application Note 2004-10-22

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)

Application Note 2004-10-22

Increase Automotive ECU Test Throughput (AN 1505)

Application Note 2004-10-22

How to use the Keysight N6700 Modular Power System to replace a Keysight 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to a Keysight N6700.

Application Note 2004-08-02

Effective Multitap Transformer Testing Using a Scanner (AN 1224-5)
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Keysight 4263B LCR Meter.

Application Note 2001-11-05

Testing Uninterruptible Power Supplies Using Keysight 6800 Series ac Power Source/Analyzers
This Product Note describes how Keysight ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection.

Application Note 2001-01-16

PDF PDF 430 KB
PNA Automation - Connectivity Advances for Component Manufacturers
LAN-enabled instruments are launching a new era in test and measurement. The ability to integrate test instrumentation with IT infrastructure is having a profound effect on how data is acquired and used in a modern facility.

Application Note 2000-10-03